Abstract: A method of calibrating an optical detector includes affixing a calibration material to a first surface of the optical detector and calibrating one or more parameters of the optical detector using the calibration material.

Abstract: A flow of air including a fungal spore is directed to a collection cartridge. The fungal spore is trapped within the collection cartridge. The fungal spore is illuminated with ultraviolet (UV) light and a camera shutter associated with a camera sensor is opened for a time period. The camera sensor is allowed to collect light emitted from the fungal spore during a first portion of the time period. After the first portion of the time period has elapsed, a first burst of visible light originating from a first position is directed towards the fungal spore during a second portion of the time period. A second burst of visible light originating from a second position is directed towards the fungal spore. After the second portion of the time period has elapsed, the camera shutter is closed to generate an image. The image is analyzed to obtain a shape of the fungal spore.

Abstract: A device, system, and method related to operator guided inspection is disclosed. A portable inspection device (“PID”) is comprised of a housing, display, camera, light array, gyro, location sensor, a non-transitory computer-readable medium, a processor, and a computer-executable instruction set stored on the non-transitory computer-readable medium.

Abstract: A contamination sensor for an optical sensor observation window includes a source, two prisms, a detector, and a controller. The source can emit a collimated light beam at an incident angle that is greater than a critical angle of an interface between a fluid and the window. The window has a refractive index greater than the refractive index of the fluid. The prisms can direct the collimated light beam within the window such that the collimated light beam reflects within a contamination detection zone of the window. The detector can receive the collimated light beam. The controller can communicate with the source and detector. The controller can calculate an emission/detection ratio defined by a difference between an amount of light emitted by the source and an amount of light that passes from the source to the detector by a total internal reflectance of the window.

Abstract: The invention relates to a porous optical fiber for the detection of an analyte in a fluid by optical probing. The optical fiber has a first end and a second end opposite to the first end, as seen in a longitudinal direction, and a circumferential surface delimiting the optical fiber in radial directions perpendicular to the longitudinal direction. The optical fiber comprises a core adapted for supporting at least one optical mode propagating in the longitudinal direction, the core having a circumferential interface delimiting the core in the radial directions. The optical fiber further comprises pores penetrating from an opening at the circumferential surface through the circumferential interface into the core of the optical fiber, wherein a cross-sectional dimension of the openings is dimensioned so as to prevent a particulate fraction of the fluid from entering the pores, while allowing the analyte to enter the pores.

Abstract: An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.

Abstract: A station for checking a tyre for vehicle wheels. The checking station includes a background with a support surface lying on a plane perpendicular to a reference axis, an image acquisition apparatus to acquire an image of the tyre arranged with a first outer lateral surface in contact with the support surface and a second outer lateral surface facing the image acquisition apparatus, an illumination system and a computer for generating a working image from the acquired image. The image acquisition apparatus, the illumination system and of the background are arranged to generate a contrast, in the working image, between the entire second outer lateral surface of the tyre and an area circumferentially surrounding the tyre.

Abstract: A device for detecting defects on at least one painted surface may include: a source configured to emit electromagnetic radiation, in at least one first spectral band, in order to project a beam of the radiation onto the at least one painted surface; a video camera sensitive in at least one second spectral band and configured to obtain images of the at least one painted surface in a zone where the beam of the radiation emitted by the source is projected; and a diffuser configured to intercept at least part of the radiation emitted by the source and to make more homogeneous a spatial distribution of radiation intensity over the at least one painted surface. A spectral working band of the device is the at least one first spectral band, the at least one second spectral band, or an intersection of the at least one first and second spectral bands.

Abstract: A three-dimensional camera having a micro lens (ML) array configured with variable ML height and variable ML shift is described herein. The ML array includes micro lens that are configured to direct backscattered light that is transmitted through an image lens into corresponding pixels. Heights of individual micro lenses within the ML array vary according to image height. For example, the height of micro lenses at the center of the ML array, near the axis of the image lens, may be relatively larger than the height of other micro lenses toward the perimeter of the ML array. Furthermore, the shift of individual micro lenses with respect to corresponding pixels may also vary according to the image height. For example, the shift of micro lenses at the center of the ML array may be relatively smaller than the shift of the other micro lenses toward the perimeter of the ML array.

Abstract: [Problem] When the inclination of an object surface reaches or exceeds a certain level, direct light consisting of a specularly reflected light component leaves the range of the solid observation angle formed by the observation optical system, and it becomes difficult to continuously and quantitatively obtain the surface shape of the object surface.

Abstract: A visual inspection device including a pinhole lens optically coupled to a sensor is provided. The pinhole lens has a pinhole placed at the distal end of the lens to capture the rays from an object to be inspected, a front optical group receiving the rays which cross the pinhole, and a rear optical group. The front optical group is configured to focus, on the rear optical group, the rays which cross the pinhole. The rear optical group is configured to focus, on the sensor, the rays received from the front optical group.

Abstract: A fire detection apparatus 1A includes a detector cover 70A for inhibiting ambient light from entering a detection space 60A, an inner cover 30A that accommodates the detection space 60A and the detector cover 70A, an outer cover 20A that accommodates the inner cover 30A, a first opening 30aA provided in a side portion on an opposite side from a side portion on an installation surface side among side portions of the inner cover 30A, a second opening provided in a side portion on an opposite side from a side portion on an installation surface among side portions of the detector cover 70A, and a flat plate-shaped insect screen 50A provided on the detector cover 70A and configured to substantially cover the entire second opening.

Abstract: A method and an apparatus for characterising a sample comprising particles is disclosed. The method comprises performing a first measurement on the sample using a first particle characterisation technique; flowing the sample from the first particle characterisation technique to a particle separating device; separating the sample with the particle separating device; and performing a second measurement on the separated sample. The apparatus is configured to perform the method, and comprises a measurement system for performing measurements according to a first particle characterisation technique and a particle separating device for separating samples comprising particles.

Abstract: An integrated optical assembly is provided, with enhancements that are particularly useful when the integrated optical assembly forms part of a laser radar system. The integrated optical assembly produces a reference beam that is related to the optical characteristics of a scanning reflector, or to changes in position or orientation of the scanning reflector relative to a source. Thus, if the scanning reflector orientation were to shift from its intended orientation (due e.g. to thermal expansion) or if characteristics of the scanning reflector (e.g. the index of refraction of the scanning reflector) were to change on account of temperature changes, the reference beam can be used to provide data that can be used to account for such changes. In addition, if the scanning reflector were to be positioned in an orientation other than the orientation desired, the reference beam can be used in identifying and correcting that positioning.

Abstract: Systems and methods for monitoring copper corrosion in an integrated circuit (IC) device are disclosed. A corrosion-sensitive structure formed in the IC device may include a p-type active region adjacent an n-type active region to define a p-n junction space charge region. A copper region formed over the silicon may be connected to both the p-region and n-region by respective contacts, to thereby define a short circuit. Light incident on the p-n junction space charge region, e.g., during a CMP process, creates a current flow through the metal region via the short circuit, which drives chemical reactions that cause corrosion in the copper region. Due to the short circuit configuration, the copper region is highly sensitive to corrosion. The corrosion-sensitive structure may be arranged with less corrosion-sensitive copper structures in the IC device, with the corrosion-sensitive structure used as a proxy to monitor for copper corrosion in the IC device.

Abstract: A removable position locator having a light source and attachment hardware for attaching the removable position locator to a body, the attachment hardware has at least one hardware light-transmitting through-hole, the removable position locator has at least one locator light-transmitting through-hole and the light from the light source is projected outward through the light-transmitting through-hole, the body has an opening that is substantially the same or bigger than the hardware light-transmitting through-hole and the opening is substantially aligned with the hardware light-transmitting through hole and the locator light-transmitting through-hole when the hardware is attached to the body.

Abstract: A method of improving axial resolution of interferometric measurements of a 3D feature of a sample may comprise illuminating the feature using a first limited number of successively different wavelengths of light at a time; generating an image of at least the 3D feature based on intensities of light reflected from the feature at each of the successively different wavelengths of light; measuring a fringe pattern of intensity values for each corresponding pixel of the generated images; resampling the measured fringe patterns as k-space interferograms; estimating interference fringe patterns for a spectral range that is longer than available from the generated images using the k-space interferograms; appending the estimated interference fringe patterns to the respective measured fringe patterns; and measuring the height or depth of the 3D feature using the measured interference fringe patterns and appended estimated fringe patterns.

Abstract: Methods and apparatus for classifying and/or discriminating particles in an aerosol. An example method involves delivering a flow of the aerosol through a nozzle into a sampling volume and directing a plurality of light beams onto an interaction plane in the sampling volume. The plurality of light beams may each be made up of light having one of a corresponding plurality of different wavelengths. For example, the wavelengths may include wavelengths of visible and infrared light or visible, near infrared and short wave infrared light. The method may detect intensities of light from the plurality of light beams that has been scattered at the interaction plane by particles of the aerosol at a plurality of different scattering angles. The resulting data is processed to characterize and/or discriminate the particles.

Abstract: A review system and operation method directs a beam of light toward a sample on a stage. The sample is a wafer level packaging wafer or a backend wafer. Defect review is performed based on the light reflected from the sample. The review system can use one or more of: a fluid supplied by an immersion subsystem that includes a fluid supply unit and a fluid removal unit; an illumination pattern for differential phase contrast; or ultraviolet or deep ultraviolet wavelengths.

Abstract: A method to minimize applying joint compound and sanding by illuminating an area of the gypsum board to show anomalies thereon includes a step of providing a plurality of wireless lighting devices operable by a common remote controller, a step of removably attaching these devices in a spaced-apart arrangement and using the remote controller to energize all lighting devices to identify remaining anomalies. All lighting devices are turned off once the next coat of joint compound is applied and then turned on after it dries to illuminate the remaining surface anomalies. Operation of lighting devices is accomplished without removing or repositioning thereof to assure consistency of illumination over the entire work period.