Patents Examined by Vincent Q. Nguyen
  • Patent number: 10794966
    Abstract: A device includes a memory that stores a measurement-result of a first magnetization of a permanent-magnet corresponding to an external-magnetic field in an open-magnetic circuit; and a processor to divide the permanent-magnet into meshes, generate a function based on the measurement-result, the function indicating a second magnetization corresponding to the external-magnetic field in a closed-magnetic circuit, the function including a parameter having a value, calculate a diamagnetic-field corresponding to the external-magnetic field based on the second magnetization for each of the meshes, calculate a third magnetization of the permanent-magnet, calculate an average of the third magnetizations, calculate an error between the first magnetization and the calculated average, correct the value of the parameter, and repeat the calculation of the second magnetization, the diamagnetic-field, the third magnetizations, the average, and the error, and the correction of the value of the parameter until the error falls
    Type: Grant
    Filed: April 25, 2019
    Date of Patent: October 6, 2020
    Inventors: Jun Fujisaki, Atsushi Furuya, Hideyuki Shitara
  • Patent number: 10793097
    Abstract: A capacitance measurement circuit for determining a sense current of a capacitive sensor with a sense electrode and a guard electrode. The measurement circuit includes a periodic signal voltage source, a sense current measurement circuit configured for determining the sense current with reference to a reference voltage, and at least one remotely controllable switch member. In a first switching state, the at least one switch member electrically connects the sense current measurement circuit to the periodic signal voltage source for providing a first reference voltage, and in a second switching state, the at least one switch member electrically connects the sense current measurement circuit to a second reference voltage that is different from the first reference voltage.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: October 6, 2020
    Inventor: Laurent Lamesch
  • Patent number: 10788380
    Abstract: An apparatus for detecting capacitance, an electronic device and an apparatus for detecting a force are disclosed. The apparatus for detecting capacitance includes: a signal driving circuit (110), configured to periodically charge and discharge at least one capacitor to be detected; a conversion circuit (120), configured to convert a capacitance signal of the at least one capacitor to be detected into a voltage signal; and a cancellation circuit (130), configured to cancel initial capacitance of the at least one capacitor to be detected, so that the voltage signal is associated with a capacitance change of the at least one capacitor to be detected. The apparatus for detecting capacitance could improve the anti-interference performance and improve the accuracy of capacitance detection.
    Type: Grant
    Filed: March 20, 2018
    Date of Patent: September 29, 2020
    Inventors: Lin Feng, Hong Jiang
  • Patent number: 10782366
    Abstract: A magnetic field sensor includes a plurality of magnetic field sensing elements operable to generate magnetic field signals indicative of a magnetic field associated with an object, a plurality of channels coupled to receive the magnetic field signals and configured to generate a respective plurality of phase separated channel signals, and an output circuit coupled to receive the plurality of phase separated channel signals and configured to generate a sensor output signal including distinguishable pulses associated with the plurality of phase separated channel signals. The sensor output signal may include a first plurality of pulses associated with a first one of the phase separated channel signals and having a first characteristic and a second plurality of pulses associated with a second one of the phase separated channel signals and having a second characteristic different than the first characteristic, such as different signals levels and/or different pulse widths.
    Type: Grant
    Filed: October 11, 2017
    Date of Patent: September 22, 2020
    Assignee: Allegro MicroSystems, LLC
    Inventor: Logan Stewart
  • Patent number: 10775448
    Abstract: Electric power system phase detection systems and methods. One or more line mounted intelligent electronic devices (IEDs) measure voltage at various points of a power system. The measured voltage is timestamped with a reference signal and compared with a timestamped voltage at a location where a phase on each conductor of the power system is known. Pattern matching using the measured voltage may be used to determine the phase at locations where the phase is unknown.
    Type: Grant
    Filed: June 18, 2018
    Date of Patent: September 15, 2020
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventor: Shankar V. Achanta
  • Patent number: 10739391
    Abstract: Methods and systems for measuring a duty cycle of a signal include applying a first branch of an input signal directly to a latch. A delay of a second branch of the input signal is incrementally increased, with the second branch being applied to the latch, until the latch changes its output. A delay, corresponding to the latch's changed output, is divided by a period of the input signal to determine a duty cycle of the input signal.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: August 11, 2020
    Inventor: Keith A. Jenkins
  • Patent number: 10732203
    Abstract: Techniques for identifying electrical theft are described herein. In an example, a secondary voltage of a transformer may be inferred by repeated voltage and current measurement at each meter associated with the transformer. A difference in measured voltage values, divided by a difference in measured current values, estimates impedance at the meter. The calculated impedance, together with measured voltage and current values, determine a voltage at the transformer secondary. Such voltages calculated by each meter associated with a transformer may be averaged, to indicate the transformer secondary voltage. A transformer having lower-than-expected secondary voltage is identified, based in part on comparison to the secondary voltages of other transformers. Each meter associated with the identified transformer may be evaluated to determine if the unexpected voltage is due to a load on the transformer. If a load did not result in the unexpected secondary voltage, power diversion may be reported.
    Type: Grant
    Filed: July 17, 2017
    Date of Patent: August 4, 2020
    Assignee: Itron, Inc.
    Inventors: Timothy James Driscoll, Robert Sonderegger
  • Patent number: 10725130
    Abstract: Nuclear magnetic resonance (NMR) method, system, and sensing device for downhole measurements. The NMR device for characterizing a subterranean zone includes a tool body, a magnetic element, and a radio frequency coil. The tool body includes an uphole end and a downhole end, where a longitudinal axis extends through the uphole end and downhole end. The magnetic element is located within the tool body and generates a static magnetic field (B0) in a longitudinal direction at a region of the subterranean zone. The radio frequency coil is located within the tool body and generates a radio frequency magnetic field (B1). The magnetic element and the radio frequency coil enable a side-looking NMR mode.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: July 28, 2020
    Assignee: Halliburton Energy Services, Inc.
    Inventors: Lilong Li, Songhua Chen, Arcady Reiderman
  • Patent number: 10724504
    Abstract: A leading edge sensor is disclosed. The leading edge sensor may include a tape section and a sensor configured to be disposed on the tape section. The leading edge sensor also includes a first electrode connected to a first end of the sensor and a second electrode connected to a second end of the sensor. The tape section is configured to be attached to a leading edge of at least one blade of a wind turbine, and the sensor configured to detect wear associated with the leading edge.
    Type: Grant
    Filed: June 14, 2018
    Date of Patent: July 28, 2020
    Inventors: Austin Robert Johnson Downey, Simon Laflamme, Randall Lee Geiger
  • Patent number: 10718792
    Abstract: Provided is a multifunctional substrate inspection apparatus capable of selectively bringing probes into contact.
    Type: Grant
    Filed: March 21, 2017
    Date of Patent: July 21, 2020
    Assignee: WIT CO., LTD.
    Inventor: Masato Utsumi
  • Patent number: 10718739
    Abstract: To provide a surface characteristics inspection method of inspecting a heat treatment on a steel product subjected to a surface treatment in a nondestructive manner. A surface characteristics inspection apparatus is used which includes an alternating-current bridge circuit, an alternating-current power supply that supplies an alternating-current power to the alternating-current bridge circuit, and an evaluation device that evaluates the surface characteristics of a subject, which is a steel product subjected to a heat treatment, based on an output signal of the alternating-current bridge circuit. Coils of a reference detector and an inspection detector in the bridge circuit are energized to produce an alternating-current magnetism to induce an eddy current in a reference subject and the subject, respectively, and the electromagnetic characteristics of the subject obtained in the state where the reference detector detects a reference state is output as a first output signal.
    Type: Grant
    Filed: June 7, 2016
    Date of Patent: July 21, 2020
    Assignee: SINTOKOGIO, LTD.
    Inventor: Yoshiyasu Makino
  • Patent number: 10720313
    Abstract: A measuring device includes a switch that switches a connection of an electrode to which a direct current voltage is applied, wherein the electrode is within an electrostatic chuck disposed in a plasma processing device; a component provided with electrostatic capacitance, wherein the component is connected to the switch; and a measuring unit that measures a value corresponding to an electric charge amount accumulated in the component provided with the electrostatic capacitance.
    Type: Grant
    Filed: August 22, 2018
    Date of Patent: July 21, 2020
    Assignee: Tokyo Electron Limited
    Inventors: Masanori Sato, Ryusei Kashimura, Tetsu Tsunamoto, Yoshinori Osaki, Toshiyuki Arakane
  • Patent number: 10712334
    Abstract: A DNA or genome sequencing structure is disclosed. The structure includes an electrode pair, each electrode having a tip-shaped end, the electrodes separated by a nanogap defined by facing tip-shaped ends; at least one conductive island deposited at or near each tip-shaped end; and a biomolecule having two ends, each end attached to the conductive islands in the electrode pair such that one biomolecule bridges over the nanogap in the electrode pair, wherein nucleotide interactions with the biomolecule provides electronic monitoring of DNA or genome sequencing without the use of a fluorescing element.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: July 14, 2020
    Assignee: Roswell Biotechnologies, Inc.
    Inventors: Chulmin Choi, Sungho Jin, Paul W. Mola, Barry L. Merriman
  • Patent number: 10704969
    Abstract: A stress sensor is provided, including a substrate and a bridge circuit disposed thereon. The bridge circuit is coupled between an output node and a ground node. The bridge circuit includes a first branch and a second branch, the first having a first resistor, R1, having a first orientation and coupled to a tuning resistor, Rtune, at a first intermediate node. The second branch includes a second resistor, R2, having a second orientation that is different from the first orientation, and coupled to a variable resistor, Rvar, at a second intermediate node. The bridge circuit includes an amplifier having a positive input terminal coupled to the second intermediate node, and a negative input terminal coupled to the first intermediate node. The amplifier generates a voltage output at the output node as a function of mechanical stress applied to the substrate. Rvar is non-linearly tunable based on the voltage output.
    Type: Grant
    Filed: November 21, 2017
    Date of Patent: July 7, 2020
    Inventor: Alfio Zanchi
  • Patent number: 10707853
    Abstract: An integrated circuit for testing a circuit includes a controller configured to select a loopback path of the circuit. The circuit includes a data path and an inverter, and each is electrically coupled to the selected loopback path. The integrated circuit includes a counter electrically coupled to the selected loopback path. The circuit is configured to receive a first voltage signal that is either a substantially low logic level signal or a substantially high logic level signal. The circuit is configured to generate an oscillating signal from the first voltage signal, and the counter is configured to count oscillations of the oscillating signal.
    Type: Grant
    Filed: September 1, 2017
    Date of Patent: July 7, 2020
    Inventor: Jinn-Yeh Chien
  • Patent number: 10698001
    Abstract: A modular integrated circuit test fixture integrates the integrated circuit (IC) handler to IC test fixture alignment interface (the alignment plate) into a daughter card subassembly, which reduces the overall rejection rate of devices due to alignment errors. The test fixture has a plurality of daughter card subassemblies for receiving integrated circuits for testing. Each daughter card subassembly is independently removable from the test fixture and includes a daughter card for a particular size and type of integrated circuit, a plurality of sockets electrically and mechanically coupled to the daughter card to receive respective integrated circuits for testing, and an alignment plate to provide alignment between an IC handler and respective ones of the daughter card subassemblies and to provide alignment for one or more manual test lids. The manual test lids are removed for automatic testing using an IC handler.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: June 30, 2020
    Assignee: Silicon Laboratories Inc.
    Inventors: Larry R. Rose, Wenshui Zhang
  • Patent number: 10690727
    Abstract: A method for identifying a faulty component in a plasma tool is described. The method includes accessing a measurement of a parameter received from a frequency generator and measurement device. The measurement is generated based on a plurality of radio frequency (RF) signals that are provided to a portion of a plasma tool. The RF signals have one or more ranges of frequencies. The method further includes determining whether the parameter indicates an error, which indicates a fault in the portion of the plasma tool. The method includes identifying limits of the frequencies in which the error occurs and identifying based on the limits of the frequencies in which the error occurs one or more components of the portion of the plasma tool creating the error.
    Type: Grant
    Filed: December 8, 2017
    Date of Patent: June 23, 2020
    Assignee: Lam Research Corporation
    Inventor: Seyed Jafar Jafarian-Tehrani
  • Patent number: 10684247
    Abstract: Aspects of a biosensor platform system and method are described. In one embodiment, the biosensor platform system includes a fluidic system and tunneling biosensor interface coupled to the fluidic system. The tunneling biosensor interface may include a transducing electrode array having at least one dielectric thin film deposited on an electrode array. The biosensor platform system may further include processing logic operatively coupled to the transducing electrode array. In operation, the application of an electromagnetic field at an interface between an electrode and an electrolyte in the system, for example, may result in the transfer of charge across the interface. The transfer of charge is, in turn, characterized by electromagnetic field-mediated tunneling of electrons that may be assisted by exchange of energy with thermal vibrations at the interface. Various analytes, for example, and other compositions can be identified by analysis of the transfer of charge.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: June 16, 2020
    Inventor: Chaitanya Gupta
  • Patent number: 10686404
    Abstract: A method for testing the die-attach quality of a photovoltaic cell assembly, in particular, for electrical inline monitoring of a photovoltaic cell die-attach quality during the manufacturing of a concentrator photovoltaic module, comprises the steps of providing a photovoltaic cell assembly comprising at least one photovoltaic cell, in particular, a concentrator photovoltaic cell, attached to a heat sink, injecting a current into the photovoltaic cell assembly, measuring the voltage across the photovoltaic cell during the current injection, and determining the relative voltage drop over the duration of the current injection, whereby insufficiently bonded photovoltaic cell assemblies can be identified and screened.
    Type: Grant
    Filed: May 17, 2016
    Date of Patent: June 16, 2020
    Assignee: Saint-Augustin Canada Electric Inc.
    Inventors: Eckart Gerster, Hannes Meyer-Schönbohm
  • Patent number: 10685778
    Abstract: A controllable primary switch for isolating a transformer from a power grid or network. The controllable primary switch is mountable within and integral to the transformer and is electrically connected to high voltage feeder cables to allow the transformer to be disconnected from the power grid or network. The controllable primary switch includes one or more vacuum interrupters having first and second electrical switch contacts mounted inside the casing, an actuator for moving the second switch contact relative to the first switch contact in each of the one or more vacuum interrupters, and a handle connected to the actuator. The handle engages the actuator to move the second switch contact relative to the first switch contact.
    Type: Grant
    Filed: April 12, 2017
    Date of Patent: June 16, 2020
    Assignees: Carte International Inc., Quality Switch, Inc.
    Inventors: Brian Klaponski, Ralph Wegner, Garth Norberg, Joseph H. Groeger, Jeremy Sewell, Larry Dix, Adam Sewell, Doug Senne, Frank DePuy