Patents by Inventor Akinori Ohi
Akinori Ohi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10825611Abstract: To improve a mounting reliability while maintaining a thickness of the external electrode at a side face of a multilayer electronic component thin. The multilayer electronic component includes ceramic body in which ceramic layers and an external electrode formed to an end face of the ceramic body. The upper electrode layer includes an element having higher standard electrode potential than Cu. The external electrode includes an external electrode end part and an external electrode extension part which is integrally formed with the external electrode end part. 1.20?t2/t1?4.50 is satisfied in which t1 is a total thickness of a thickness of the intermediate electrode layer thickness and t2 is a length from an end of the base electrode layer to an end of the upper electrode layer along the first axis of the external electrode extension part connected by the conductive adhesive.Type: GrantFiled: July 16, 2020Date of Patent: November 3, 2020Assignee: TDK CORPORATIONInventors: Tomohisa Fukuoka, Tetsuhiro Takahashi, Akinori Ohi
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Patent number: 10373324Abstract: A measurement apparatus that is capable of positively generating a projection pattern suitable for a to-be-read object. A camera scanner as the measurement apparatus projects a projection pattern formed by a plurality of projection lines on a to-be-read object to thereby measure the bending of the to-be-read object. A distance to the to-be-read object is measured, and distance distribution information of the to-be-read object for identifying a shape, a size, and a position of the to-be-read object is generated based on the measured distance. The projection pattern is generated based on the generated distance distribution information of the to-be-read object.Type: GrantFiled: January 18, 2017Date of Patent: August 6, 2019Assignee: CANON KABUSHIKI KAISHAInventor: Akinori Ohi
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Patent number: 10074476Abstract: A ferrite composition composed of a main component including 26 to 46 mol % of an iron oxide in terms of Fe2O3, 4 to 14 mol % of a copper oxide in terms of CuO, 0 to 26 mol % of a zinc oxide in terms of ZnO, and a residue of 40.0 mol % or more of a nickel oxide in terms of NiO. The ferrite composition, with respect to 100 parts by weight of the main component, is also composed of a subcomponent including 0.8 to 10.0 parts by weight of a silicon compound in terms of SiO2, 1.0 to 15.0 parts by weight of a cobalt compound in terms of Co3O4, and 0.7 to 30.0 parts by weight of a bismuth compound in terms of Bi2O3. A value of the cobalt compound content in terms of Co3O4 divided by the silicon compound content in terms of SiO2 is 0.4 to 5.5.Type: GrantFiled: April 4, 2016Date of Patent: September 11, 2018Assignee: TDK CORPORATIONInventors: Hiroki Choto, Takeshi Shibayama, Ryuichi Wada, Kouichi Kakuda, Yukari Akita, Asuka Murai, Yukio Takahashi, Takashi Suzuki, Akinori Ohi
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Patent number: 9984799Abstract: A ferrite composition comprises a main component and a sub component. The main component is comprised of 25.0 to 49.8 mol % iron oxide in terms of Fe2O3, 5.0 to 14.0 mol % copper oxide in terms of CuO, 0 to 40.0 mol % zinc oxide in terms of ZnO, and a remaining part of nickel oxide. The sub component includes 0.2 to 5.0 wt % silicon oxide in terms of SiO2, 0.10 to 3.00 wt % bismuth oxide in terms of Bi2O3, and 0.10 to 3.00 wt % cobalt oxide in terms of Co3O4, with respect to the main component.Type: GrantFiled: October 6, 2014Date of Patent: May 29, 2018Assignee: TDK CORPORATIONInventors: Ryuichi Wada, Kouichi Kakuda, Hiroki Choto, Yukari Akita, Yukio Takahashi, Masahiro Endo, Takashi Suzuki, Takahiro Sato, Akinori Ohi
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Patent number: 9979858Abstract: To specify a contour to be detected even when there are a plurality of candidates of the contour on the periphery of a photographing target, an image processing apparatus comprises: a determining unit which detects a plurality of candidate points being the candidates of the contour of a subject based on distance image information of the subject in an image, and determines an inspection-target area in the image based on the detected candidate points; and a specifying unit which detects line segments existing in the inspection-target area determined by the determining unit, based on luminance information of the inspection-target area, and specifies the line segment being the contour of the subject based on the candidate point from the detected line segments.Type: GrantFiled: July 14, 2015Date of Patent: May 22, 2018Assignee: CANON KABUSHIKI KAISHAInventor: Akinori Ohi
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Publication number: 20170213353Abstract: A measurement apparatus that is capable of positively generating a projection pattern suitable for a to-be-read object. A camera scanner as the measurement apparatus projects a projection pattern formed by a plurality of projection lines on a to-be-read object to thereby measure the bending of the to-be-read object. A distance to the to-be-read object is measured, and distance distribution information of the to-be-read object for identifying a shape, a size, and a position of the to-be-read object is generated based on the measured distance. The projection pattern is generated based on the generated distance distribution information of the to-be-read object.Type: ApplicationFiled: January 18, 2017Publication date: July 27, 2017Inventor: Akinori Ohi
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Publication number: 20160300651Abstract: A ferrite composition composed of a main component including 26 to 46 mol % of an iron oxide in terms of Fe2O3, 4 to 14 mol % of a copper oxide in terms of CuO, 0 to 26 mol % of a zinc oxide in terms of ZnO, and a residue of 40.0 mol % or more of a nickel oxide in terms of NiO. The ferrite composition, with respect to 100 parts by weight of the main component, is also composed of a subcomponent including 0.8 to 10.0 parts by weight of a silicon compound in terms of SiO2, 1.0 to 15.0 parts by weight of a cobalt compound in terms of Co3O4, and 0.7 to 30.0 parts by weight of a bismuth compound in terms of Bi2O3. A value of the cobalt compound content in terms of Co3O4 divided by the silicon compound content in terms of SiO2 is 0.4 to 5.5.Type: ApplicationFiled: April 4, 2016Publication date: October 13, 2016Applicant: TDK CORPORATIONInventors: Hiroki CHOTO, Takeshi SHIBAYAMA, Ryuichi WADA, Kouichi KAKUDA, Yukari AKITA, Asuka MURAI, Yukio TAKAHASHI, Takashi SUZUKI, Akinori OHI
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Publication number: 20160027183Abstract: To specify a contour to be detected even when there are a plurality of candidates of the contour on the periphery of a photographing target, an image processing apparatus comprises: a determining unit which detects a plurality of candidate points being the candidates of the contour of a subject based on distance image information of the subject in an image, and determines an inspection-target area in the image based on the detected candidate points; and a specifying unit which detects line segments existing in the inspection-target area determined by the determining unit, based on luminance information of the inspection-target area, and specifies the line segment being the contour of the subject based on the candidate point from the detected line segments.Type: ApplicationFiled: July 14, 2015Publication date: January 28, 2016Inventor: Akinori Ohi
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Publication number: 20150097137Abstract: A ferrite composition comprises a main component and a sub component. The main component is comprised of 25.0 to 49.8 mol % iron oxide in terms of Fe2O3, 5.0 to 14.0 mol % copper oxide in terms of CuO, 0 to 40.0 mol % zinc oxide in terms of ZnO, and a remaining part of nickel oxide. The sub component includes 0.2 to 5.0 wt % silicon oxide in terms of SiO2, 0.10 to 3.00 wt % bismuth oxide in terms of Bi2O3, and 0.10 to 3.00 wt % cobalt oxide in terms of Co3O4, with respect to the main component.Type: ApplicationFiled: October 6, 2014Publication date: April 9, 2015Inventors: Ryuichi WADA, Kouichi KAKUDA, Hiroki CHOTO, Yukari AKITA, Yukio TAKAHASHI, Masahiro ENDO, Takashi SUZUKI, Takahiro SATO, Akinori OHI
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Patent number: 6736990Abstract: There can be provided an NiCuZn-based ferrite material containing an iron oxide, a copper oxide, zinc oxide and a nickel oxide in predetermined amounts as main components and a bismuth oxide, a silicon oxide, magnesium oxide and a cobalt oxide in predetermined amounts as additional components. Due to the predetermined amounts of the additional components, the ferrite material has an extremely good temperature characteristic (a change in permeability along with a change in temperature is small), a high quality coefficient Q and high strength.Type: GrantFiled: March 7, 2002Date of Patent: May 18, 2004Assignee: TDK CorporationInventors: Takuya Aoki, Ko Ito, Bungo Sakurai, Yukio Takahashi, Tatsuya Shimazaki, Hidenobu Umeda, Akinori Ohi
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Publication number: 20020175311Abstract: There can be provided an NiCuZn-based ferrite material containing an iron oxide, a copper oxide, zinc oxide and a nickel oxide in predetermined amounts as main components and a bismuth oxide, a silicon oxide, magnesium oxide and a cobalt oxide in predetermined amounts as additional components. Due to the predetermined amounts of the additional components, the ferrite material has an extremely good temperature characteristic (a change in permeability along with a change in temperature is small), a high quality coefficient Q and high strength.Type: ApplicationFiled: March 7, 2002Publication date: November 28, 2002Inventors: Takuya Aoki, Ko Ito, Bungo Sakurai, Yukio Takahashi, Tatsuya Shimazaki, Hidenoru Umeda, Akinori Ohi