Patents by Inventor Akira Tsuji

Akira Tsuji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12154258
    Abstract: There is provided a surface abnormality detection device, and a system, capable of detecting an abnormal portion having a displacement below the distance measurement accuracy when detecting the abnormal portion on the surface of a structure. A surface abnormality detection device includes a classification means for classifying an object under measurement into one or more clusters having the same structure, based on position information at a plurality of points on a surface of the object under measurement; a determination means for determining a reflection brightness normal value of the cluster based on a distribution of reflection brightness values at a plurality of points on a surface of the cluster; and an identification means for identifying an abnormal portion on the surface of the cluster based on a difference between the reflection brightness normal value and the reflection brightness value at each of the plurality of points.
    Type: Grant
    Filed: March 17, 2020
    Date of Patent: November 26, 2024
    Assignee: NEC CORPORATION
    Inventors: Yoshimasa Ono, Akira Tsuji, Hidemi Noguchi, Junichi Abe
  • Patent number: 12146959
    Abstract: A monitoring control device (1) according to the present embodiment is, for example, a monitoring control device used in a monitoring system that monitors a monitoring target facility by using a distance measurement sensor (5). The monitoring control device (1) includes: a sensing region acquisition unit (3) configured to acquire measurement data indicating a sensing region of the distance measurement sensor (5) provided in order to monitor a monitoring target facility; and a management unit (4) configured to identify a non-monitoring region of the monitoring target facility, based on the sensing region and position data of the distance measurement sensor (5).
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: November 19, 2024
    Assignee: NEC CORPORATION
    Inventors: Akira Tsuji, Hidemi Noguchi
  • Patent number: 12091588
    Abstract: The present invention is to provide a curable composition for adhesive agents that cures at a low temperature and that can form a cured article having excellent heat resistance, crack resistance, and adhesive properties and tight bonding properties for adhereds.
    Type: Grant
    Filed: May 16, 2018
    Date of Patent: September 17, 2024
    Assignee: DAICEL CORPORATION
    Inventors: Akira Yamakawa, Naoko Tsuji
  • Publication number: 20240280402
    Abstract: An information processing apparatus (10) includes: acquisition means (11) for acquiring information indicating a first point, information indicating a second point, first measurement data measured at the first point, and second measurement data measured at the second point; control means (12) for determining equipment to be inspected on the basis of the data acquired by the acquisition means; and output means (13) for outputting information based on the equipment determined by the control means.
    Type: Application
    Filed: August 18, 2021
    Publication date: August 22, 2024
    Applicant: NEC Corporation
    Inventor: Akira Tsuji
  • Publication number: 20240273460
    Abstract: There is provided an information processing method including: acquiring information indicating a first facility to be currently inspected by an inspection apparatus (40) that performs facility inspection and information indicating a second facility to be inspected next by the inspection apparatus; and transmitting a request for delivering the inspection apparatus from the first facility to the second facility.
    Type: Application
    Filed: May 31, 2021
    Publication date: August 15, 2024
    Applicant: NEC CORPORATION
    Inventor: Akira TSUJI
  • Publication number: 20240249486
    Abstract: A measurement condition optimization system according to an aspect of the present disclosure includes: a three-dimensional data input unit that inputs three-dimensional data of a measurement target installation in a predetermined facility measured using a measurement device; an overlapping portion determination unit that performs alignment processing on each piece of the input three-dimensional data, and determines an overlapping portion included in the three-dimensional data after the alignment processing; a measurement policy acquisition unit that acquires a measurement policy at the time of acquiring the three-dimensional data of the measurement target installation in the facility using the measurement device; and a measurement condition adjustment unit that adjusts a measurement condition to satisfy the measurement policy acquired by the measurement policy acquisition unit and make the overlapping portion included in the three-dimensional data determined by the overlapping portion determination unit withi
    Type: Application
    Filed: May 20, 2021
    Publication date: July 25, 2024
    Applicant: NEC Corporation
    Inventors: Akira Tsuji, Yoshimasa Ono, Jiro Abe
  • Publication number: 20240248490
    Abstract: A patrol route determination system according to one aspect of the present disclosure includes: a measurement position information storage unit configured to store information regarding a plurality of pieces of equipment and information regarding measurement positions for the plurality of pieces of equipment in association with each other; a measurement position determination unit configured to determine a measurement position based on information regarding the measurement target, information regarding the measurement device, and the information regarding the measurement position set for each piece of equipment stored in the measurement position information storage unit; and a patrol route determination unit configured to determine a patrol route along which the measurement device autonomously moves in the facility and makes a patrol of the measurement target equipment by using information regarding the measurement position for the measurement target equipment.
    Type: Application
    Filed: May 20, 2021
    Publication date: July 25, 2024
    Applicant: NEC Corporation
    Inventors: Akira Tsuji, Jiro Abe
  • Patent number: 12043107
    Abstract: A vehicle fender air intake assembly for a vehicle can include a central baffle configured to be mounted to a body structure of the vehicle, a central shutter mounted on the central baffle, a lower baffle configured to be mounted to the body structure, a lower shutter mounted on the lower baffle, and an upper baffle including a first side and a second side that opposes the first side. The upper baffle can terminate at the first side and the second side. The first side can include a first opening in fluid communication with the central baffle, and the second side can include a second opening in fluid communication with the central baffle.
    Type: Grant
    Filed: March 16, 2022
    Date of Patent: July 23, 2024
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Stephen J. Marshall, Steve Faria, Patrick J. Ellison, Taiga Marukawa, Takashi Nakano, Akira Futatsuhashi, Keiichiro Tsuji
  • Publication number: 20240183986
    Abstract: An object of the present disclosure is to provide a travelable area extraction apparatus and the like capable of extracting a travelable area from three-dimensional data. A disclosed travelable area extraction apparatus includes: a three-dimensional data input unit that inputs three-dimensional data from a three-dimensional data acquisition unit mounted in a vehicle; a position information acquisition unit that acquires position information of the vehicle; and a travelable area extraction unit that extracts a travelable area from the three-dimensional data on the basis of the position information of the vehicle and a road structure rule indicating a distance from one end to the other end of a traveling area in a road.
    Type: Application
    Filed: April 26, 2021
    Publication date: June 6, 2024
    Applicant: NEC Corporation
    Inventors: Akira Tsuji, Jiro Abe
  • Publication number: 20240161409
    Abstract: An object of the present disclosure is to provide an annotation apparatus that can improve workability of annotation. An annotation apparatus (1) according to an example aspect of the present disclosure includes a cluster generation unit (11) configured to generate a plurality of clusters by grouping point cloud data corresponding to three-dimensional position information about a measurement target, a presentation order determination unit (12) configured to determine a presentation order of the plurality of clusters based on similarity between the generated plurality of clusters, a cluster presentation unit (13) configured to present the plurality of clusters in order based on the determined presentation order, and a label assignment unit (14) configured to assign a predetermined label to each of the clusters presented in the order.
    Type: Application
    Filed: March 24, 2021
    Publication date: May 16, 2024
    Applicant: NEC Corportion
    Inventors: Jiro ABE, Akira TSUJI
  • Publication number: 20240096198
    Abstract: An area determination apparatus (2000) acquires three-dimensional facility data (20). The three-dimensional facility data (20) is three-dimensional data of a target facility including a plurality of segments. The area determination apparatus (2000) determines a designated segment, which is a segment designated in an input screen (10) including an image of the target facility. The area determination apparatus (2000) determines, as a monitoring area or a non-monitoring area, a three-dimensional area that is determined based on three-dimensional segment data (22) of the designated segment.
    Type: Application
    Filed: January 29, 2021
    Publication date: March 21, 2024
    Applicant: NEC Corporation
    Inventors: Akira Tsuji, Shigeo Suzuki, Hiroshi Matsumoto, Takanori Shigeta
  • Publication number: 20240061113
    Abstract: An information processing apparatus according to the present disclosure includes: a first acquisition unit that acquires first point group data indicating a distance between a sensor and an object to be measured at a first measurement spot along a path; a second acquisition unit that acquires second point group data indicating a distance between a sensor and the object to be measured at a second measurement spot different from the first measurement spot along the path; a division unit that divides point group data including the first point group data and the second point group data into one or a plurality of segments; a distribution calculation unit that calculates a distribution of the point group data in the segment; and a removal unit that removes an outlier value from the point group data in the segment, based on the distribution.
    Type: Application
    Filed: January 14, 2021
    Publication date: February 22, 2024
    Applicant: NEC Corporation
    Inventor: Akira Tsuji
  • Publication number: 20240054626
    Abstract: Provided is a processing device capable of accurately identifying an abnormal part.
    Type: Application
    Filed: August 28, 2020
    Publication date: February 15, 2024
    Applicant: NEC Corporation
    Inventors: Yoshimasa ONO, Akira TSUJI
  • Patent number: 11869179
    Abstract: An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatus 11 according to the present disclosure includes an acquisition unit 111 configured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus 12, and a photograph image of the object obtained by photographing the object by using a photographing apparatus 13, a display unit 112 configured to display the point group data and the photograph image on a predetermined screen, and a control unit 113 configured to control the point group data and the photograph image to be displayed in the display unit 112.
    Type: Grant
    Filed: March 5, 2021
    Date of Patent: January 9, 2024
    Assignee: NEC CORPORATION
    Inventors: Shigeo Suzuki, Taisuke Tanabe, Hiroshi Matsumoto, Takanori Shigeta, Junichi Abe, Akira Tsuji, Yoshimasa Ono, Jiro Abe
  • Publication number: 20230375709
    Abstract: A detection device (10) according to the present disclosure includes an acquisition unit (11) that acquires point cloud data indicating a distance from a measurement device to an object and luminance information obtained from reflected light of a beam emitted when the point cloud data is measured, an edge detection unit (12) that performs edge detection based on the luminance information, and a crack determination unit (13) that determines whether an area indicates a crack by using a shape of the area in which, of a plurality of points indicated by the point cloud data, points having luminance within a predetermined range of difference from luminance of a point detected as an edge are distributed.
    Type: Application
    Filed: March 31, 2020
    Publication date: November 23, 2023
    Applicant: NEC Corporation
    Inventors: Akira TSUJI, Yoshimasa ONO, Junichi ABE, Jiro ABE
  • Publication number: 20230367015
    Abstract: An inspection system, an extraction device, an inspection method, an extraction method, and a program that are capable of improving measurement accuracy are provided. An inspection system includes: a measurement device being arranged at a measurement point inside a tunnel, having a reference point, and acquiring a plurality of pieces of data including coordinate values and brightness values of a wall surface of the tunnel as point cloud data by using one or more beams irradiated in irradiation directions at a plurality of different angles to the reference point and receiving reflected light of the beam resulting from scanning the wall surface; a movement means for moving the measurement device to a plurality of measurement points inside the tunnel; and, in the point cloud data acquired by the measurement device for each measurement point, an extraction means for extracting data, based on a distance from the measurement point.
    Type: Application
    Filed: October 1, 2020
    Publication date: November 16, 2023
    Applicant: NEC Corporation
    Inventor: Akira TSUJI
  • Publication number: 20230363379
    Abstract: A sustained release body includes: a substrate containing a vaporizable active ingredient, the substrate having a structure for releasing a vaporized gas of the active ingredient; and a vapor deposition polymerization film directly formed on a first surface that is one end surface of both end surfaces of the substrate in a thickness direction of the substrate, the vapor deposition polymerization film being configured to receive the vaporized gas of the active ingredient from the first surface of the substrate and sustainedly release the vaporized gas.
    Type: Application
    Filed: July 25, 2023
    Publication date: November 16, 2023
    Inventors: Takaaki TANAKA, Akihiko KOZUKA, Akira TSUJI, Satoru KATOH, Syouhei KAWAGUCHI, Saki SUZUKI
  • Publication number: 20230333250
    Abstract: A monitoring system according to the present disclosure includes: a straight line calculation unit configured to calculate a straight line connecting three-dimensional coordinates of a light source and three-dimensional coordinates of a three-dimensional measuring device configured to measure a target to be measured; an invalid region determination unit configured to define a three-dimension invalid region in which point cloud data acquired by the three-dimensional measuring device is invalid based on the straight line; and a point cloud data processing unit configured to monitor the target to be measured based on the acquired point cloud data and the three-dimension invalid region.
    Type: Application
    Filed: September 16, 2020
    Publication date: October 19, 2023
    Applicant: NEC Corporation
    Inventors: Yoshimasa ONO, Junichi ABE, Hidemi NOGUCHI, Akira TSUJI, Jiro ABE
  • Publication number: 20230336702
    Abstract: Provided are a processing device, a processing system, a processing method, and a program capable of improving visibility when displaying image data and three-dimensional data. A processing device includes: an image data input means to which image data is input; an image data acquisition information input means to which image data acquisition information is input; a three-dimensional data input means to which three-dimensional data is input; a viewpoint image generation means for generating a viewpoint image that projects the three-dimensional data on the basis of a position and a shooting direction of a shooting means; a target area extraction means for matching the image data with the viewpoint image and extracting a target area corresponding to the image data in the viewpoint image; and a parameter generation means for generating parameters for displaying the target area.
    Type: Application
    Filed: October 6, 2020
    Publication date: October 19, 2023
    Applicant: NEC Corporation
    Inventors: Akira TSUJI, Jiro Abe
  • Publication number: 20230332977
    Abstract: An abnormality detection system includes: shape data acquisition means for acquiring shape data of a surface of a structure; surface direction calculation means for calculating a direction in which the surface is facing based on the shape data; shape data division means for dividing the shape data based on the direction in which the surface is facing calculated by the surface direction calculation means; reference shape calculation means for calculating a reference shape for each of the pieces of the shape data divided by the shape data division means; and abnormality detection means for detecting an abnormality on the surface of the structure based on a difference between each of the pieces of the shape data divided by the shape data division means and the reference shape corresponding to each of the pieces of the shape data calculated by the reference shape calculation means.
    Type: Application
    Filed: September 9, 2020
    Publication date: October 19, 2023
    Applicant: NEC Corporation
    Inventor: Akira TSUJI