Patents by Inventor Alan M. Ganz

Alan M. Ganz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130041479
    Abstract: A computerized method of offering a comprehensive control system for varied kinds of manufactures, including: providing a computer graphical user interface having the static model of hardware systems, information and status of the control system and context of the automation procedure commands; providing a hardware database containing 1) port database including all ports of a controller connecting to devices, 2) a device database including information, operation methods, events of all devices connected to the controller, 3) a system database including information and configuration of all systems that controller controls; providing a dictionary containing word pairs that define operations and status of every device; providing a background worker responsible for refreshing data from port database. Computer systems configured to perform the method.
    Type: Application
    Filed: September 2, 2011
    Publication date: February 14, 2013
    Inventors: Shuo Zhang, Chandra Sekhar Inturi, Christopher LaBello, Alan M. Ganz
  • Patent number: 7796254
    Abstract: A method for determining characteristics of a material includes illuminating the material with coherent light so as to produce scattered light; autocorrelating the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; and associating the analyzed data with particular characteristics of the material. At least one of a cumulant analysis and a cluster analysis may be performed to provide analyzed data. The determined characteristics may be used for real time control or termination a process used to alter the characteristics of the material. Specifically, monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved. An apparatus operating generally in accordance with the method is also disclosed.
    Type: Grant
    Filed: February 25, 2008
    Date of Patent: September 14, 2010
    Assignee: August Ninth Analyses, Inc.
    Inventors: Alan M. Ganz, Henry C. Weber
  • Publication number: 20080147339
    Abstract: A method for determining characteristics of a material includes illuminating the material with coherent light so as to produce scattered light; autocorrelating the scattered light; preprocessing a signal representative of the scattered light to produce a processed signal; and associating the analyzed data with particular characteristics of the material. At least one of a cumulant analysis and a cluster analysis may be performed to provide analyzed data. The determined characteristics may be used for real time control or termination a process used to alter the characteristics of the material. Specifically, monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved. An apparatus operating generally in accordance with the method.
    Type: Application
    Filed: February 25, 2008
    Publication date: June 19, 2008
    Inventors: Alan M. Ganz, Henry C. Weber
  • Patent number: 7336358
    Abstract: Method and apparatus for evaluating one or more materials in accordance with size of particles. The method includes evaluating a spectrum of light reflected from a first group of particles; evaluating a spectrum of light reflected from a second group of particle; comparing results of said evaluating of said first group with results of said evaluating of said second group; and providing an indication of a state of said material when said comparing produces a predetermined comparison result. Distance between a first light conductor for conducting light to the particles and a second light conductor for conducting light from said particles for said evaluations may be varied. Monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved.
    Type: Grant
    Filed: February 24, 2004
    Date of Patent: February 26, 2008
    Assignee: August Ninth Analyses, Inc.
    Inventors: Alan M. Ganz, Henry C. Weber
  • Publication number: 20040233431
    Abstract: Method and apparatus for evaluating one or more materials in accordance with size of particles. The method includes evaluating a spectrum of light reflected from a first group of particles; evaluating a spectrum of light reflected from a second group of particle; comparing results of said evaluating of said first group with results of said evaluating of said second group; and providing an indication of a state of said material when said comparing produces a predetermined comparison result. Distance between a first light conductor for conducting light to the particles and a second light conductor for conducting light from said particles for said evaluations may be varied. Monitoring of a process for changes in particle size as a function of time or to determine various physical and/or chemical characteristics of the particles or a mixture containing same, including homogeneity, may be achieved.
    Type: Application
    Filed: February 24, 2004
    Publication date: November 25, 2004
    Inventors: Alan M. Ganz, Henry C. Weber
  • Patent number: 6430513
    Abstract: Constituents such as oxy- and deoxy-hemoglobin are monitored non-invasively in an animal organ such as a brain with a spectrometric instrument by passing radiation through the organ. Concentrations are computed from the spectral intensities and from a statistical correlation model. To predetermine the correlation model, the procedures are effected for a plurality of organs of a same type with each organ having established concentrations of the selected constituents, and the correlation model is statistically determined from the concentrations and corresponding intensities. For more accuracy computations are normalized to path length which may be determined by utilizing several discrete wavelengths with RF modulations.
    Type: Grant
    Filed: January 7, 2000
    Date of Patent: August 6, 2002
    Assignee: PerkinElmer Instruments LLC
    Inventors: Yongdong Wang, David H. Tracy, Paul G. Saviano, Alan M. Ganz, Koichi Nishikida, Gitesh Kumar
  • Patent number: 6138082
    Abstract: For conversion of spectral information of an FTIR spectrometric instrument for comparison with that of a dispersion instrument, a first standard function is selected for spectral line shape for the first instrument, and a second standard function for line shape is selected for the second instrument. A conversion factor is computed for converting the first standard function to the second standard function. In ordinary operations, first spectral information is obtained with the first instrument for a first sample, and second spectral information is obtained with the second instrument for a second sample. The conversion factor is applied to the first spectral information to effect converted information, and the converted information is compared with the second spectral information. Such conversion also is applied between chromatographic instruments.
    Type: Grant
    Filed: December 18, 1997
    Date of Patent: October 24, 2000
    Assignee: The Perkin Elmer Corporation
    Inventors: Yongdong Wang, Alan M. Ganz, David H. Tracy, David A. Huppler, John P. Coates
  • Patent number: 6049762
    Abstract: Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known "true" spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.
    Type: Grant
    Filed: December 18, 1997
    Date of Patent: April 11, 2000
    Assignee: Perkin Elmer LLC
    Inventors: Alan M. Ganz, Yongdong Wang, David H. Tracy, Robert A. Hoult, Jerry E. Cahill, David A. Huppler
  • Patent number: 6029115
    Abstract: A spectrometric instrument includes a detector with detecting subarrays on small portions of the surface. Spectral data are acquired for selected subarrays at a first time for a drift standard, and compared to a zero position to obtain first offset data. Data are acquired similarly at a second time to obtain second offset data. The offset data are utilized to obtain a spectral shift for any subarray position at any selected time. The shift is applied to a matrix model used for converting test data to compositional information. Archive data for the model is obtained in the foregoing manner, using slit scanning in the instrument to achieve sub-increments smaller than the detector pixel size, with a procedure to assure that there is an integral number of scanning steps across one pixel. The drift standard may be chemical analytes, or an optical interference element producing fringes related to spectral positions in each subarray.
    Type: Grant
    Filed: September 30, 1997
    Date of Patent: February 22, 2000
    Assignee: Perkin Elmer LLC
    Inventors: David H. Tracy, Alan M. Ganz, Yongdong Wang, David A. Huppler, Juan C. Ivaldi, Christopher B. Hanna
  • Patent number: 5928907
    Abstract: A system is provided for carrying out real time fluorescence-based measurements of nucleic acid amplification products. In a preferred embodiment of the invention, an excitation beam is focused into a reaction mixture through a surface, the reaction mixture containing (i) a first fluorescent indicator capable of generating a first fluorescent signal whose intensity is proportional to the amount of an amplification product in the volume of the reaction mixture illuminated by the excitation beam and (ii) a second fluorescent indicator homogeneously distributed throughout the reaction mixture capable of generating a second fluorescent signal proportional to the volume of reaction mixture illuminated by the excitation beam. Preferably, the excitation beam is focused into the reaction mixture by a lens through a portion of a wall of a closed reaction chamber containing the reaction mixture.
    Type: Grant
    Filed: December 2, 1996
    Date of Patent: July 27, 1999
    Assignee: The Perkin-Elmer Corporation., Applied Biosystems Division
    Inventors: Timothy M. Woudenberg, Kevin S. Bodner, Charles R. Connell, Alan M. Ganz, Lincoln J. McBride, Paul G. Saviano, John Shigeura, David H. Tracy, Eugene F. Young, Linda G. Lee
  • Patent number: 5428558
    Abstract: A method and apparatus are provided for correction of spectra for stray radiation in a spectrometric instrument, involving a sequence of steps as follows. Spectral patterns are obtained with the instrument initially for monochromatic radiation at a plurality of selected calibration wavelengths. By computer program, the peak profile at the calibration wavelength in each pattern is replaced with a substitute based on the remaining pattern. The resulting data are interpolated to effect values denoted "stray proportions" for the ordered wavelengths of the instrument. Spectral data at each ordered wavelength are obtained with the instrument for a sample, and multiplied in the computer program by stray proportions for corresponding wavelengths to effect further sets of values denoted "stray portions" that are identified to the ordered wavelengths. Each set is identified to one of the wavelength increments of the instrument across the spectral range.
    Type: Grant
    Filed: December 17, 1993
    Date of Patent: June 27, 1995
    Assignee: The Perkin-Elmer Corporation
    Inventors: Jerry E. Cahill, Alan M. Ganz, Paul Saviano, David Tracy, Yongdong Wang
  • Patent number: 5303165
    Abstract: A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.
    Type: Grant
    Filed: February 12, 1992
    Date of Patent: April 12, 1994
    Assignee: The Perkin-Elmer Corporation
    Inventors: Alan M. Ganz, David H. Tracy, Robert A. Hoult
  • Patent number: 5229838
    Abstract: To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal.
    Type: Grant
    Filed: January 21, 1992
    Date of Patent: July 20, 1993
    Assignee: The Perkin-Elmer Corporation
    Inventors: Alan M. Ganz, David H. Tracy