Patents by Inventor Aland K. Chin

Aland K. Chin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of analyzing localized nonuniformities in luminescing materials
    Patent number: 4238686
    Abstract: Localized nonuniformities in semiconductor crystals are analyzed by scanning the semiconductor surface with an electron beam and detecting and analyzing the radiation that is generated at the semiconductor surface by the electron beam and which passes through the semiconductor crystal.
    Type: Grant
    Filed: September 5, 1979
    Date of Patent: December 9, 1980
    Assignee: Bell Telephone Laboratories, Incorporated
    Inventors: Aland K. Chin, Gilbert Y. Chin, Henryk Temkin