Abstract: An extraction tool for, and method of, determining a stage delay associated with an integrated circuit (IC) interconnect. In one embodiment, the extraction tool includes: (1) a driver strength estimator configured to extract dimensions of a driver associated with the interconnect and estimate a driver strength therefrom, (2) a driver delay estimator coupled to the driver strength estimator and configured to estimate a driver delay based on the driver strength, (3) an interconnect delay estimator configured to estimate an interconnect delay based on extracted C and RC parameters associated with the interconnect and (4) a stage delay estimator coupled to the driver delay estimator and the interconnect delay estimator and configured to estimate the stage delay based on the driver delay and the interconnect delay.

Abstract: A method of estimating a profit margin for an IC chip includes providing design, manufacturing and financial input data for the IC chip and determining a ratio of performing to manufactured IC chips using chip yields apart from timing. The method of estimating a profit margin also includes characterizing IC chip performance corresponding to clock timing and on-chip-variation (OCV) margins and calculating price and costs corresponding to design, manufacturing and testing of the IC chip. Additionally, the method of estimating a profit margin includes generating a profit margin based on the price and costs. A method of maximizing a profit margin for an IC chip is also included.

Abstract: A methods of characterizing a regular electronic circuit and using a parameterized model of an electronic circuit to create a model for another electronic circuit. In one embodiment, the method of characterizing includes: (1) characterizing fewer than all sub-circuits associated with input and output pins of the circuit to yield data regarding the sub-circuits, (2) generating a data file containing the data, the data file constituting an expandable parameterized model of the circuit.

Abstract: A system for, and method of, reducing the generation of inconsequential violations resulting from timing analyses and an electronic design automation (EDA) tool incorporating the system or the method. In one embodiment, the system includes: (1) a timing violation identifier configured to identify at least some timing violations in a circuit based on a timing analysis, (2) an unsensitizable path identifier configured to identify at least some unsensitizable paths in the circuit and (3) a repair list generator coupled to the timing violation identifier and the unsensitizable path identifier and configured to generate a repair list based on both the at least some timing violations and the at least some unsensitizable paths.

Abstract: A design process optimization system and method for designing a circuit, which may be an integrated circuit (IC) employing adaptive voltage and scaling optimization (AVSO). In one embodiment, the system includes: (1) a process-voltage-temperature (PVT) libraries database configured to contain PVT libraries of PVT characterizations of devices of cells from which the circuit is to be constructed and (2) a PVT library selector coupled to the PVT libraries database and configured to receive a selection indicating a supplemental objective and respond to the selection by selecting one of the PVT libraries from the PVT libraries database, a timing signoff tool later employing at most two corners from the one of the PVT libraries to perform a timing signoff with respect to the circuit.