Abstract: A test and measurement instrument, includes a user interface, one or more probes configured to connect to a device under test comprising a MOSFET, and one or more processors configured to execute code that causes the one or more processors to: set a target voltage to be measured across the MOSFET, apply a force voltage to the MOSFET, measure a drain current and a drain voltage of the MOSFET with the one or more probes, determine if a difference between the measured drain voltage and the target voltage meets a threshold, when the difference does not meet the threshold, use the measured drain voltage, the measured drain current, and a load resistance to determine a new force voltage value to compensate for the load resistance, set the force voltage to the new force voltage value, and repeat the apply, measure and determine steps as needed.