Patents by Inventor Andrew W. Krause

Andrew W. Krause has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5923466
    Abstract: The confocal imaging system and method involve the imaging of a specimen under observation by projecting a light pattern of illumination spots simultaneously on the specimen. This is accomplished by a pattern array unit which transforms light from a light source into a desired pattern of illumination spots, and reflects or rejects light outside the pattern. Light detected from the specimen is confined to a pattern conforming to the pattern of the illumination spots by the same pattern array unit which rejects light beyond the pattern, and rejected light from the pattern array unit is transmitted back to the light source. Image signals are created from the received light and stored, and the stored image signals are combined to form a complete image frame.
    Type: Grant
    Filed: December 20, 1996
    Date of Patent: July 13, 1999
    Assignee: Biophysica Technologies, Inc.
    Inventors: Andrew W. Krause, Minhua Liang, Robert L. Stehr
  • Patent number: 5587832
    Abstract: The confocal imaging system and method involve the imaging of a specimen under observation by projecting a light pattern of illumination spots simultaneously on the specimen. This is accomplished by a pattern array unit which transforms light from a light source into a desired pattern of illumination spots. Light detected from the specimen is confined to a pattern conforming to the pattern of the illumination spots by a detector masking unit which rejects light beyond the pattern. Image signals are created from the received light and stored, and the stored image signals are combined to form a complete image frame.
    Type: Grant
    Filed: October 20, 1993
    Date of Patent: December 24, 1996
    Assignee: Biophysica Technologies, Inc.
    Inventor: Andrew W. Krause
  • Patent number: 4795256
    Abstract: A dual wavelength spectrophotometer produces a relatively small, high power, high duty cycle light spot from a single relatively low power multi-chromatic light source. A Xenon arc lamp light source is focused by an ellipsoidal mirror onto a rotating partially reflective optical chopper. The chopper comprises a wheel having mirrored segments alternately separated by transparent segments. Light reflected by the mirrored segments passes through a first monochromator which produces a first monochromatic light beam. Light transmitted through the transparent segments passes through a second monochromator and emerges as a second monochromatic light beam having a wavelength different from the wavelength of said first monochromatic light beam. The first and second monochromatic light beams are recombined into a single dual wavelength light beam that is reflected through a sample to be analyzed. Reflective front surfaces are employed throughout the system in order to minimize power loss.
    Type: Grant
    Filed: March 9, 1987
    Date of Patent: January 3, 1989
    Assignee: Photon Technology International, Inc.
    Inventors: Andrew W. Krause, Charles G. Marianik, Ronald J. Kovach