Patents by Inventor Antonin Bougerol

Antonin Bougerol has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9213614
    Abstract: To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: December 15, 2015
    Assignee: European Aernautic Defence And Space Company Eads France
    Inventors: Nadine Buard, Florent Miller, Antonin Bougerol, Patrick Heins, Thierry Carriere
  • Patent number: 8856603
    Abstract: To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of ½ is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of ?.
    Type: Grant
    Filed: June 18, 2009
    Date of Patent: October 7, 2014
    Assignees: European Aeronautic Defence And Space Company EADS France, Astrium SAS
    Inventors: Florent Miller, Thierry Carriere, Antonin Bougerol
  • Publication number: 20140149100
    Abstract: A method for designing electronic equipment comprising at least one electronic component. The component executes a dynamic application and is subjected to disruptions. The software application utilizes internal elements of the component. The method comprises a stage for characterizing a sensitivity parameter of the component to the disruptions. The stage comprises the step of executing the software application on a device configured to reproduce the operation of the component, and performance related signals are monitored, during the execution of the software application, to access the predetermined component elements. A dwell time of the software application in the component elements are deduced from the monitoring of the performance related signals.
    Type: Application
    Filed: July 26, 2012
    Publication date: May 29, 2014
    Applicant: EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY EADS FRANCE
    Inventors: Antonin Bougerol, Sabrine Houssany
  • Patent number: 8723119
    Abstract: The invention relates to an electric generator sensitive to ionizing radiation produced by the reverse mounting of a diode in parallel between a reverse polarization stack and a pulse converter or only with a pulse converter. A generator is thus provided that can be used inside a spacecraft or in the atmosphere by using cosmic radiation, or in an environment containing ionizing radiation such as in the medical or nuclear fields, and which is preferably directly mounted on a printed circuit board receiving a remote sensor.
    Type: Grant
    Filed: December 2, 2009
    Date of Patent: May 13, 2014
    Assignee: European Aeronautic Defence and Space Company Eads France
    Inventors: Florent Miller, Nadine Buard, Antonin Bougerol, Cécile Weulersse
  • Patent number: 8338803
    Abstract: The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.
    Type: Grant
    Filed: December 2, 2009
    Date of Patent: December 25, 2012
    Assignee: European Aeronautic Defence and Space Company Eads France
    Inventors: Florent Miller, Cécile Weulersse, Antonin Bougerol, Thierry Carriere, Patrick Heins, Samuel Hazo
  • Publication number: 20120001088
    Abstract: The invention relates to a device for testing an integrated circuit. The device comprises a plate for receiving and subjecting the integrated circuit to a test. The plate comprises a component for powering and operating the integrated circuit and another component for measuring the operation of the integrated circuit during the test. The device also comprises an irradiation device for subjecting the circuit to a proton bombardment and a mask with a variable thickness provided between a bombardment access region on the integrated circuit and an established zone of the integrated circuit.
    Type: Application
    Filed: December 2, 2009
    Publication date: January 5, 2012
    Inventors: Florent Miller, Cécile Weulersse, Antonin Bougerol, Thierry Carriere, Patrick Heins, Samuel Hazo
  • Publication number: 20110298332
    Abstract: The invention relates to an electric generator sensitive to ionizing radiation produced by the reverse mounting of a diode in parallel between a reverse polarization stack and a pulse converter or only with a pulse converter. A generator is thus provided that can be used inside a spacecraft or in the atmosphere by using cosmic radiation, or in an environment containing ionizing radiation such as in the medical or nuclear fields, and which is preferably directly mounted on a printed circuit board receiving a remote sensor.
    Type: Application
    Filed: December 2, 2009
    Publication date: December 8, 2011
    Inventors: Florent Miller, Nadine Buard, Antonin Bougerol, Cécile Weulersse
  • Publication number: 20110185245
    Abstract: To produce a memory which resists ion or photon attack, a memory structure is chosen whose memory point behaves asymmetrically with regard to these attacks. It is shown that in this case, it is sufficient to have a reference cell for an identical and periodic storage structure in order to be able to correct all the memory cells assailed by an attack. An error correction efficiency of ½ is thus obtained, with a simple redundancy, whereas the conventional methods make provision, for the same result, to triple the storage, to obtain a less beneficial efficiency of ?.
    Type: Application
    Filed: June 18, 2009
    Publication date: July 28, 2011
    Applicant: European Aeronautic Defence And Space Company EADS France
    Inventors: Florent Miller, Thierry Carriere, Antonin Bougerol
  • Publication number: 20100280785
    Abstract: To test a software application, a method submits an electronic board including a component implementing an application to a laser radiation generated in test equipment. The component is excited with laser pulses having very short durations distributed during complex operational phases of the component for running the application, and the reaction of the component and the application are observed.
    Type: Application
    Filed: June 26, 2008
    Publication date: November 4, 2010
    Applicant: European Aeronautic Defence And Space Company EADS France
    Inventors: Nadine Buard, Florent Miller, Antonin Bougerol, Patrick Heins, Thierry Carriere