Abstract: A test apparatus features an upper RF impermeable hood and lower RF impermeable hood, wherein each of the hoods have internal dividers. When in a closed position, the hoods and dividers create two or more RF impermeable chambers. The hoods are configured to enclose or sandwich a pallet supporting two or more printed circuit boards. One of the printed circuit boards is disposed in each chamber formed by the hoods and dividers.

Abstract: A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a test system for an electronic device having an accelerometer with three mutually orthogonal sensing axes, the test system comprising: a test fixture having: a nest defining a cavity for receiving an electronic device; wherein the nest is configured so that, when the test fixture is substantially horizontal, a two-dimensional sensing plane defined by two of the sensing axes of the accelerometer is substantially horizontal and the third sensing axis is perpendicular to the two-dimensional sensing plane and substantially parallel to the force of gravity.

Abstract: An apparatus, system and method are provided for testing a battery-powered electronic device-under-test in a transport frame engaged with a test fixture. A transport frame power supply is arranged to provide power to the DUT in a pre-testing stage. A switching circuit is arranged to switch from the transport frame power supply to a test fixture power supply in response to receiving a power switching signal indicating satisfaction of a pre-testing condition. Power from the test fixture power supply can then be switched back to the first transport frame, or to a second transport frame, to begin testing a second DUT. The ability to start a DUT test without having to wait for the DUT to boot-up in the test fixture reduces test time and increases efficiency of use of test equipment.

Abstract: A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a method of testing and calibrating an accelerometer of an electronic device, comprising: detecting the electronic device within a nest of a test fixture; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.

Abstract: A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is a test system for an electronic device having an accelerometer with three mutually orthogonal sensing axes, the test system comprising: a test fixture having: a nest defining a cavity for receiving an electronic device; wherein the nest is configured so that, when the test fixture is substantially horizontal, a two-dimensional sensing plane defined by two of the sensing axes of the accelerometer is substantially horizontal and the third sensing axis is perpendicular to the two-dimensional sensing plane and substantially parallel to the force of gravity.

Abstract: An apparatus, system and method are provided for testing a battery-powered electronic device-under-test in a transport frame engaged with a test fixture. A transport frame power supply is arranged to provide power to the DUT in a pre-testing stage. A switching circuit is arranged to switch from the transport frame power supply to a test fixture power supply in response to receiving a power switching signal indicating satisfaction of a pre-testing condition. Power from the test fixture power supply can then be switched back to the first transport frame, or to a second transport frame, to begin testing a second DUT. The ability to start a DUT test without having to wait for the DUT to boot-up in the test fixture reduces test time and increases efficiency of use of test equipment.

Abstract: A test apparatus features an upper RF impermeable hood and lower RF impermeable hood, wherein each of the hoods have internal dividers. When in a closed position, the hoods and dividers create two or more RF impermeable chambers. The hoods are configured to enclose or sandwich a pallet supporting two or more printed circuit boards. One of the printed circuit boards is disposed in each chamber formed by the hoods and dividers.

Abstract: A test apparatus features an upper RF impermeable hood and lower RF impermeable hood, wherein each of the hoods have internal dividers. When in a closed position, the hoods and dividers create two or more RF impermeable chambers. The hoods are configured to enclose or sandwich a pallet supporting two or more printed circuit boards. One of the printed circuit boards is disposed in each chamber formed by the hoods and dividers.

Abstract: An apparatus, system and method are provided for testing a battery-powered electronic device-under-test in a transport frame engaged with a test fixture. A transport frame power supply is arranged to provide power to the DUT in a pre-testing stage. A switching circuit is arranged to switch from the transport frame power supply to a test fixture power supply in response to receiving a power switching signal indicating satisfaction of a pre-testing condition. Power from the test fixture power supply can then be switched back to the first transport frame, or to a second transport frame, to begin testing a second DUT. The ability to start a DUT test without having to wait for the DUT to boot-up in the test fixture reduces test time and increases efficiency of use of test equipment.

Abstract: A test apparatus features an upper RF impermeable hood and lower RF impermeable hood, wherein each of the hoods have internal dividers. When in a closed position, the hoods and dividers create two or more RF impermeable chambers. The hoods are configured to enclose or sandwich a pallet supporting two or more printed circuit boards. One of the printed circuit boards is disposed in each chamber formed by the hoods and dividers.

Abstract: A printed circuit board (“PCB”) test fixture is provided comprising a PCB support, an electrical tester, first and second enclosure portions, and an actuator. The PCB support is configured for supporting a PCB being tested in a PCB test position. The first enclosure portion includes a pressing device which is configured for effecting, with respect to a PCB supported in the PCB test position on the PCB support, pressing of a circuit of the PCB against the electrical tester so as to provide an operative circuit. The second enclosure portion extending peripherally about the PCB support. The actuator is coupled to a one of the first enclosure portion and the second enclosure portion and configured to effect an application of force to the one of the first enclosure portion and the second enclosure portion. The PCB support is disposed between the first and second enclosure portions.

Abstract: A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is method of testing and calibrating an accelerometer of an electronic device, comprising: levelling a test fixture; placing the electronic device in a nest of the test fixture; detecting the electronic device within the nest; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.

Abstract: An apparatus for seating within a battery compartment and a smart card compartment of a device, including a battery component and a smart card component. The battery component is coupled to the smart card component. The smart card component is configured to seat within a smart card compartment of a device. The apparatus is configured to be inserted into a smart card compartment of a smart card containing device substantially simultaneously with the insertion of the battery component into a battery compartment of the device. The smart card component may be a test smart card, and the battery component may be a battery emulator.

Abstract: An RF isolation container that includes a counterweight system to assist an operator with opening and closing operations, an electromagnet locking mechanism for easier and consistent locking of the RF isolation container and a motion damping mechanism to relieve fatigue on operating components and on human operators.

Abstract: A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning guide disposed on the device receiving surface; a device retention cover; where the test platform includes a platform magnetic member and the retention cover includes a cover magnetic member, the platform magnetic member and the cover magnetic member being mutually magnetically attractive. A method of producing an electronic device including: preparing the test fixture, for testing the electronic device; placing the electronic device using the at least one device positioning guide disposed on the device receiving surface; and placing the device retention cover upon the electronic device to apply a force to the electronic device.

Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

Abstract: An apparatus for seating within a battery compartment and a smart card compartment of a device, including a battery component and a smart card component. The battery component is coupled to the smart card component. The smart card component is configured to seat within a smart card compartment of a device. The apparatus is configured to be inserted into a smart card compartment of a smart card containing device substantially simultaneously with the insertion of the battery component into a battery compartment of the device. The smart card component may be a test smart card, and the battery component may be a battery emulator.

Abstract: A fixture is provided for functional testing of an assembled wireless device. The wireless device has a first port and a second port. The fixture comprises: a base having an opening formed therein for receiving a retainer, the retainer being rotatably mounted in the opening for rotating from a first position to a second position, the retainer for receiving the wireless device while in the first position; a first connector mounted in the retainer for engaging the first port of the wireless device when the wireless device is received by the retainer in the first position; and a second connector rotatably mounted on the base, the second connector for engaging the second port of the wireless device when the retainer is rotated to the second position.

Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.