Patents by Inventor Ayumu Ishihara

Ayumu Ishihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230092993
    Abstract: A wire harness including: an electric wire including a core wire and an insulating cover that covers the core wire; and a tube that surrounds the electric wire, wherein: the electric wire further includes a covered portion in which the core wire is covered by the insulating cover, and an exposed portion in which the core wire is exposed from the insulating cover, the exposed portion includes a bend that is bent so as to protrude in a direction orthogonal to a length direction of the core wire, and the bend is provided outside of the tube.
    Type: Application
    Filed: March 16, 2021
    Publication date: March 23, 2023
    Applicants: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Toshiya HIROOKA, Daisuke HASHIMOTO, Ayumu ISHIHARA
  • Publication number: 20230093296
    Abstract: A wire harness including: an electric wire; and a tube that surrounds the electric wire, wherein: the electric wire includes: a first electric wire portion including a core wire and an insulating cover that covers the core wire, and a second electric wire portion connected to a lengthwise end of the core wire, the second electric wire portion includes a flexible portion having a higher flexibility than the first electric wire portion, the flexible portion includes a bend that is bent so as to protrude in a direction orthogonal to a length direction of the second electric wire portion, and the bend is provided outside of the tube.
    Type: Application
    Filed: March 17, 2021
    Publication date: March 23, 2023
    Applicants: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Toshiya HIROOKA, Daisuke HASHIMOTO, Ayumu ISHIHARA
  • Publication number: 20220344880
    Abstract: A connection component including: a main body to be attached to a case; and an annular ring that is elastic and into which the main body is inserted, wherein the annular ring deforms between a first thickness at which the annular ring is in contact with the main body and is not in contact with the case when a compressive force that acts in an insertion direction into the case does not occur, and a second thickness at which the annular ring is in contact with both the main body and the case when the compressive force that acts in the insertion direction into the case occurs.
    Type: Application
    Filed: August 28, 2020
    Publication date: October 27, 2022
    Applicants: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Yuta HOSOYA, Toshiya HIROOKA, Daisuke HASHIMOTO, Ayumu ISHIHARA, Yoshitomo TSUJII
  • Patent number: 9722349
    Abstract: It is an object of the present invention to ensure a high water-stopping property of a wire harness including a waterproofing connector section that is molded from a resin, by suppressing a variation in the outer size of a seal section of the connector section. The connector section is made from a first synthetic resin that is insert-molded with a part of a terminal fitting of the terminated electric cable used as an insert section. A water-stopping section is made from a second synthetic resin that is insert-molded with a section extending from a part of the terminal fitting to an insulation coating of the terminated electric cable used as an insert section. The seal section is made from the second synthetic resin that is insert-molded with a part of the connector section used as an insert section. The second synthetic resin is softer than the first synthetic resin.
    Type: Grant
    Filed: February 26, 2014
    Date of Patent: August 1, 2017
    Assignees: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Ayumu Ishihara, Tatsuya Hase, Katsufumi Matsui, Kouji Fukumoto, Daisuke Hashimoto, Kentaro Tachi
  • Publication number: 20150372415
    Abstract: It is an object of the present invention to ensure a high water-stopping property of a wire harness including a waterproofing connector section that is molded from a resin, by suppressing a variation in the outer size of a seal section of the connector section. The connector section is made from a first synthetic resin that is insert-molded with a part of a terminal fitting of the terminated electric cable used as an insert section. A water-stopping section is made from a second synthetic resin that is insert-molded with a section extending from a part of the terminal fitting to an insulation coating of the terminated electric cable used as an insert section. The seal section is made from the second synthetic resin that is insert-molded with a part of the connector section used as an insert section. The second synthetic resin is softer than the first synthetic resin.
    Type: Application
    Filed: February 26, 2014
    Publication date: December 24, 2015
    Applicants: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Ayumu ISHIHARA, Tatsuya HASE, Katsufumi MATSUI, Kouji FUKUMOTO, Daisuke HASHIMOTO, Kentaro TACHI
  • Patent number: 8634070
    Abstract: In a method and apparatus for optically inspecting a magnetic disk, irradiating the surface of the sample with a light by rotating and moving the sample in the direction orthogonal to the center axis of the rotation, detecting the regular reflection light from the surface of the sample, detecting the scattered light in the vicinity of the regular reflection light from the surface of the sample by separating the scattered light from the regular reflection light, detecting the scattered light scattered in the direction at a higher angle with respect to the normal direction of the surface of the sample, and detecting the defects by processing the detection signal of the regular reflection light, the detection signal of the scattered light in the vicinity of the regular reflection light, and the detection signal of the scattered light in the high angle direction.
    Type: Grant
    Filed: February 1, 2013
    Date of Patent: January 21, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Ayumu Ishihara
  • Publication number: 20130258325
    Abstract: In a method and apparatus for optically inspecting a magnetic disk, irradiating the surface of the sample with a light by rotating and moving the sample in the direction orthogonal to the center axis of the rotation, detecting the regular reflection light from the surface of the sample, detecting the scattered light in the vicinity of the regular reflection light from the surface of the sample by separating the scattered light from the regular reflection light, detecting the scattered light scattered in the direction at a higher angle with respect to the normal direction of the surface of the sample, and detecting the defects by processing the detection signal of the regular reflection light, the detection signal of the scattered light in the vicinity of the regular reflection light, and the detection signal of the scattered light in the high angle direction.
    Type: Application
    Filed: February 1, 2013
    Publication date: October 3, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventor: Ayumu ISHIHARA
  • Patent number: 8547547
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Grant
    Filed: August 19, 2011
    Date of Patent: October 1, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shintaro Tamura, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Patent number: 8295000
    Abstract: In order to implement efficient read/write testing by firstly determining read/write test area-sampling positions based on position information relating to any defects detected during optical inspection, and then conducting read/write tests only upon areas neighboring the defects detected during the optical inspection, a magnetic disk to be inspected is retained on a spindle and moved under this state between an optical type of inspection apparatus and a read/write test apparatus, in which apparatus configuration the read/write test apparatus uses position information on any defects detected by the optical type of inspection apparatus and conducts read/write tests only upon neighboring areas of the defects detected by the optical type of inspection apparatus.
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: October 23, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kenichi Shitara, Ayumu Ishihara
  • Patent number: 8208356
    Abstract: An apparatus for optically checking magnetic disk defects that makes possible more accurate determination of positions of minute defects by illuminating an area greater than a checkup area with an illuminating beam having a Gaussian distribution is to be provided. The apparatus is configured of a specular reflection detecting device including a detector having a detecting face including an array of multiple pixels, and a processing device that figures out the position of each defect by using, in addition to the output signal from each of the pixels of the detector that detected a specular reflection from the checkup area, also output signals of some pixels out of the multiple pixels having detected the specular reflection from the checkup area of one turn before and the checkup area of one turn after, both adjoining in the radial direction, and determines the type of the defect.
    Type: Grant
    Filed: December 22, 2010
    Date of Patent: June 26, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Ayumu Ishihara, Hiroshi Nakajima
  • Patent number: 8169868
    Abstract: An optical defect detection method for patterned media includes: irradiating a laser beam onto a patterned medium and obtaining reflected light by reflection very close to a sample; outputting the reflected light as an analog electrical signal from an optical receiver; converting the analog signal to a digital signal; obtaining a surface profile in a track direction by sampling the analog signal; obtaining a servo area profile by setting a slice for detecting servo area; calculating an average value in a track width direction based on plural servo area profiles; generating a master servo area profile based on the average value; obtaining a difference between the master servo area profile and the specific servo area profile; and detecting the presence of a defect including surface roughness, process fluctuation, and adhesion of foreign matters, from a differential waveform.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: May 1, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Ayumu Ishihara
  • Publication number: 20120075625
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Application
    Filed: August 19, 2011
    Publication date: March 29, 2012
    Inventors: Shintaro TAMURA, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Publication number: 20110188143
    Abstract: In order to implement efficient read/write testing by firstly determining read/write test area-sampling positions based on position information relating to any defects detected during optical inspection, and then conducting read/write tests only upon areas neighboring the defects detected during the optical inspection, a magnetic disk to be inspected is retained on a spindle and moved under this state between an optical type of inspection apparatus and a read/write test apparatus, in which apparatus configuration the read/write test apparatus uses position information on any defects detected by the optical type of inspection apparatus and conducts read/write tests only upon neighboring areas of the defects detected by the optical type of inspection apparatus.
    Type: Application
    Filed: January 25, 2011
    Publication date: August 4, 2011
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kenichi SHITARA, Ayumu ISHIHARA
  • Publication number: 20110158073
    Abstract: An apparatus for optically checking magnetic disk defects that makes possible more accurate determination of positions of minute defects by illuminating an area greater than a checkup area with an illuminating beam having a Gaussian distribution is to be provided. The apparatus is configured of a specular reflection detecting device including a detector having a detecting face including an array of multiple pixels, and a processing device that figures out the position of each defect by using, in addition to the output signal from each of the pixels of the detector that detected a specular reflection from the checkup area, also output signals of some pixels out of the multiple pixels having detected the specular reflection from the checkup area of one turn before and the checkup area of one turn after, both adjoining in the radial direction, and determines the type of the defect.
    Type: Application
    Filed: December 22, 2010
    Publication date: June 30, 2011
    Inventors: Ayumu ISHIHARA, Hiroshi Nakajima
  • Publication number: 20100246357
    Abstract: An optical defect detection method for patterned media includes: irradiating a laser beam onto a patterned medium and obtaining reflected light by reflection very close to a sample; outputting the reflected light as an analog electrical signal from an optical receiver; converting the analog signal to a digital signal; obtaining a surface profile in a track direction by sampling the analog signal; obtaining a servo area profile by setting a slice for detecting servo area; calculating an average value in a track width direction based on plural servo area profiles; generating a master servo area profile based on the average value; obtaining a difference between the master servo area profile and the specific servo area profile; and detecting the presence of a defect including surface roughness, process fluctuation, and adhesion of foreign matters, from a differential waveform.
    Type: Application
    Filed: March 2, 2010
    Publication date: September 30, 2010
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventor: Ayumu ISHIHARA