Patents by Inventor Brett Allen Pawlanta

Brett Allen Pawlanta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measuring an appearance property of a surface using a bidirectional reflectance distribution function
    Patent number: 7944561
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: June 4, 2007
    Date of Patent: May 17, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function
    Patent number: 7940396
    Abstract: An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
    Type: Grant
    Filed: April 25, 2006
    Date of Patent: May 10, 2011
    Assignee: X-Rite, Inc.
    Inventors: Jon Kenneth Nisper, Patrick S. Rood, Brett Allen Pawlanta, Thomas M. Richardson, Brian Dale Teunis
  • Systems and methods for profiling and synchronizing a fleet of color measurement instruments
    Patent number: 7499164
    Abstract: A method for adjusting a color measurement of a secondary color measurement instrument. The method includes generating a profile for the secondary color measurement instrument based on color measurements of a master color measurement instrument, and applying the profile to adjust the color measurement of the secondary color measurement instrument.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: March 3, 2009
    Assignee: X-Rite, Inc.
    Inventors: Brett Allen Pawlanta, James W. Vogh, Thomas W. Michaels, Kraig D. Spear, Timothy L. Walker