Patents by Inventor Bryan Edward Cole

Bryan Edward Cole has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180364301
    Abstract: A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.
    Type: Application
    Filed: December 16, 2016
    Publication date: December 20, 2018
    Applicant: TeraView Limited
    Inventors: Bryan Edward Cole, Darius Sullivan, Simon Chandler
  • Publication number: 20180275190
    Abstract: A reflectometer for allowing a test of a device. The reflectometer comprises a source of pulsed radiation, a first photoconductive element configured to output a pulse in response to irradiation from the pulsed source, a second photoconductive element configured to receive a pulse, a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element, and a termination resistance provided for the transmission line configured to match the impedance of the transmission line.
    Type: Application
    Filed: May 29, 2018
    Publication date: September 27, 2018
    Inventor: Bryan Edward Cole
  • Patent number: 10076261
    Abstract: A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.
    Type: Grant
    Filed: March 5, 2001
    Date of Patent: September 18, 2018
    Assignee: TeraView Limited
    Inventors: Donald Dominic Arnone, Bryan Edward Cole, Craig Michael Ciesla
  • Patent number: 10006960
    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.
    Type: Grant
    Filed: February 13, 2012
    Date of Patent: June 26, 2018
    Assignee: TeraView Limited
    Inventor: Bryan Edward Cole
  • Patent number: 9006660
    Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: April 14, 2015
    Assignee: TeraView Limited
    Inventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
  • Publication number: 20140021963
    Abstract: A reflectometer for allowing a test of a device, the reflectometer comprising: a source of pulsed radiation; a first photoconductive element configured to output a pulse in response to irradiation from said pulsed source; a second photoconductive element configured to receive a pulse; a transmission line arrangement configured to direct the pulse from the first photoconductive element to the device under test and to direct the pulse reflected from the device under test to the second photoconductive element; and a termination resistance provided for said transmission line configured to match the impedance of the transmission line.
    Type: Application
    Filed: February 13, 2012
    Publication date: January 23, 2014
    Applicant: TERAVIEW LIMITED
    Inventor: Bryan Edward Cole
  • Publication number: 20110028824
    Abstract: A THz radiation probe (1) for examining an object (8), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (5), said probe further comprising at least one THz emitter (15), directing means (7) for directing THz radiation emitted from said emitter to said object via an aperture (2) located at said first portion and subsequently from said object to at least one THz detector (17) and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction (5).
    Type: Application
    Filed: August 28, 2008
    Publication date: February 3, 2011
    Inventors: Bryan Edward Cole, Vincent Patrick Wallace, Michael John Withers, John Baker, Brian Robertson
  • Patent number: 7335883
    Abstract: A method of imaging a sample, the method comprising: (a) irradiating a sample with a pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 25 GHz to 100 THz; (b) determining a first parameter related to the amplitude of the radiation, which is either reflected from and/or transmitted by the sample, in the time domain; (c) calculating the value of the first parameter at a first time value relative to the value of the first parameter at a second time value which coincides with a physical feature of the dataset of the first parameter with respect to time; and (d) generating an image by plotting the value calculated in step (c) for different points of the sample.
    Type: Grant
    Filed: July 29, 2002
    Date of Patent: February 26, 2008
    Assignee: Teraview Limited
    Inventors: Vincent Patrick Wallace, Ruth Mary Woodward, Donald Dominic Arnone, Bryan Edward Cole
  • Patent number: 7315175
    Abstract: A probe for examining a sample (5), the probe including an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: January 1, 2008
    Assignee: TeraView Limited
    Inventor: Bryan Edward Cole
  • Patent number: 7214940
    Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.
    Type: Grant
    Filed: January 16, 2002
    Date of Patent: May 8, 2007
    Assignee: TeraView Limited
    Inventors: Julian Alexander Cluff, Bryan Edward Cole, Donald Dominic Arnone
  • Patent number: 7174037
    Abstract: An apparatus and method for imaging a sample, the apparatus including a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25 GHz to 100 THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.
    Type: Grant
    Filed: February 28, 2001
    Date of Patent: February 6, 2007
    Assignee: Teraview Limited
    Inventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole
  • Patent number: 7152007
    Abstract: A system for investigating a sample, the system including a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillator signal and the other signal being a sample signal carrying information about the sample being investigated, the system further having a quantum cascade laser for providing at least the local oscillator signal.
    Type: Grant
    Filed: December 9, 2003
    Date of Patent: December 19, 2006
    Assignee: Tera View Limited
    Inventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole, Stefano Barbieri
  • Patent number: 6865014
    Abstract: An apparatus for investigating a sample, the apparatus comprising an emitter (1) for irradiating the sample (27) with a beam of emitted electromagnetic radiation; and a detector (49) for detecting the radiation reflected from the sample, wherein there is an optically non-linear member (15) which functions as both an active part of the emitter and an active part of the detector, said emitter and detector using the same part of the optically non-linear member (15). The electromagnetic radiation is primarily intended to be in the terahertz (THz) frequency range.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: March 8, 2005
    Assignee: Teraview Limited
    Inventors: Craig Michael Ciesla, Bryan Edward Cole, Donald Dominic Arnone
  • Publication number: 20040155665
    Abstract: A system for investigating a sample, the system comprising a detector having non-linear current voltage characteristics and being configured to mix two radiation signals having frequencies in the range from 25 GHz to 100 THz, one of the signals being a local oscillator signal and the other signal being a sample signal carrying information about the sample being investigated, the system further comprising a quantum cascade laser for providing at least the local oscillator signal.
    Type: Application
    Filed: December 9, 2003
    Publication date: August 12, 2004
    Applicant: Tera View Limited
    Inventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole, Stefano Barbieri
  • Publication number: 20040095147
    Abstract: A probe for examining a sample (5), the probe comprising an emitter (1) for emitting radiation, a detector (1) for detecting radiation and a dielectric member (3) configured to direct radiation from the emitter (1) to the sample (5) and to direct radiation reflected by the sample (5) to the detector (1), wherein in use, the dielectric member (3) occupies at least half of the radiation path length from the emitter (1) to the sample (5) to the detector (1).
    Type: Application
    Filed: December 11, 2003
    Publication date: May 20, 2004
    Inventor: Bryan Edward Cole
  • Publication number: 20040065832
    Abstract: An apparatus for investigating a sample comprising a source of a beam of radiation, a detector for detecting a beam of radiation reflected by or transmitted through a sample to be imaged, an optical subsystem for manipulating the beam between the source and detector and means for translating the optical subsystem along a first translation axis relative to the source and detector to scan the beam across the sample, wherein the source and the detector are on opposite sides of the subsystem and the beam from the source and the beam reflected or transmitted each enter and exit the subsystem in a direction parallel to the first direction of translation. The apparatus is also suitable for maintaining the relative phase of two beams of radiation, during translation of an optical subsystem.
    Type: Application
    Filed: October 30, 2003
    Publication date: April 8, 2004
    Inventors: Julian Alexander Cluff, Bryan Edward Cole, Donald Dominic Arnone
  • Publication number: 20030178584
    Abstract: An apparatus and method for imaging a sample, the apparatus comprising: a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25 GHz to 100 THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.
    Type: Application
    Filed: March 24, 2003
    Publication date: September 25, 2003
    Inventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole
  • Publication number: 20030165003
    Abstract: An apparatus for investigating a sample, the apparatus comprising an emitter (1) for irradiating the sample (27) with a beam of emitted electromagnetic radiation; and a detector (49) for detecting the radiation reflected from the sample, wherein there is an optically non-linear member (15) which functions as both an active part of the emitter and an active part of the detector, said emitter and detector using the same part of the optically non-linear member (15). The electromagnetic radiation is primarily intended to be in the terahertz (THz) frequency range.
    Type: Application
    Filed: January 28, 2003
    Publication date: September 4, 2003
    Inventors: Craig Michael Ciesla, Bryan Edward Cole, Donald Dominic Arnone
  • Publication number: 20030155512
    Abstract: An apparatus and method for investigating a sample, the apparatus comprising: means (61) for irradiating the sample (21) with a first beam of electromagnetic radiation configured to excite an optically non-linear process within the sample; means (61) for irradiating the sample with a second beam of electromagnetic radiation; and a detector (41) for detecting a change the second beam after it has been reflected from or transmitted through the sample. If the optically non-linear process is a second order process, the detector could be used to detect a change in the polarisation of the second beam. Apparatus and method find application of samples with terahertz (THZ) radiation locally generated and detected within the sample.
    Type: Application
    Filed: March 24, 2003
    Publication date: August 21, 2003
    Inventors: Donald Dominic Arnone, Craig Michael Ciesla, Bryan Edward Cole
  • Publication number: 20030149346
    Abstract: A range of technique for investigating a sample such as obtaining images and/or spectral information are described. The techniques include a method for deriving structural information about a sample as a continuous function of the depth below the surface of the sample, a method for evaluating a part of the structure of a sample located between two interfaces within the sample, and a contrast enhancing method and apparatus which has a quick image acquisition time.
    Type: Application
    Filed: November 25, 2002
    Publication date: August 7, 2003
    Inventors: Donald Dominic Arnone, Bryan Edward Cole, Craig Michael Ciesla