Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. ‘AU Golden Dragon’ has a low chilling requirement, fruit is very early maturing, excellent flavor with a non acid sweet taste, and high soluble solids and dry matter content. ‘AU Golden Dragon’ matures about 50 days ahead of ‘Hort 16A’ (patented), the industry standard for golden flesh kiwi, therefore, the two cultivars will not compete in the market place. ‘AU Golden Dragon’ fruit quality indices are similar to fruit quality indices of ‘Hort 16A’ (patented). There have been no differences in plant performance and fruit quality of ‘AU Golden Dragon’ plants grown in China and Central Alabama.

Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. This cultivar named ‘AU Golden Tiger’ was developed from seeds collected from an open pollinated ‘AU Golden Dragon’ fruit. The seedling has been reproduced by rooted cuttings and grafting and tested in replicated cultivar trials. It maintains all of its unique characteristics after each propagation. Its bloom period overlaps the bloom period of ‘AU Golden Sunshine’ and is the pollinizer for ‘AU Golden Sunshine’.

Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. ‘AU Golden Sunshine’ has a low chilling requirement, fruit is early maturing, excellent flavor with a non acid sweet taste and a high percent soluble solids and dry matter content. ‘AU Golden Sunshine’ matures about 20 days after ‘AU Golden Dragon’ and 30 days before ‘Hort 16A’ (patented), the industry standard for golden flesh kiwi cultivars. ‘AU Golden Sunshine’ fruit quality indices are similar to fruit quality indices of ‘AU Golden Dragon’ and ‘Hort 16A’ (patented). There have been no differences in plant performance and fruit quality of ‘AU Golden Sunshine’ plants grown in China and Alabama.

Abstract: A light emitting diode (10) has a backside and a front-side with at least one n-type electrode (14) and at least one p-type electrode (12) disposed thereon defining a minimum electrodes separation (delectrodes). A bonding pad layer (50) includes at least one n-type bonding pad (64) and at least one p-type bonding pad (62) defining a minimum bonding pads separation (dpads) that is larger than the minimum electrodes separation (delectrodes). At least one fanning layer (30) interposed between the front-side of the light emitting diode (10) and the bonding pad layer (50) includes a plurality of electrically conductive paths passing through vias (34, 54) of a dielectric layer (32, 52) to provide electrical communication between the at least one n-type electrode (14) and the at least one n-type bonding pad (64) and between the at least one p-type electrode (12) and the at least one p-type bonding pad (62).

Abstract: An LED device (90) includes: an epitaxial structure (100) having a plurality of layers of semiconductor material and forming an active light-generating region (120) which generates light in response to electrical power being supplied to the LED device (90); and, a substrate (200) that is substantially transparent in a wavelength range corresponding to the light generated by the active light-generating region (120). The substrate has first and second opposing end faces (202, 206) and a plurality of side walls (210) extending therebetween, including a first side wall having a first portion thereof that defines a first surface (212, 214, 216, 218) which is not substantially normal to the first face (202) of the substrate (200). The epitaxial structure (100) is disposed on the first face (202) of the substrate (200).

Abstract: In a light emitting package fabrication process, a plurality of light emitting chips (10) are attached on a sub-mount wafer (14). The attached light emitting chips (10) are encapsulated. Fracture-initiating trenches (30, 32) are laser cut into the sub-mount wafer (14) between the attached light emitting chips (10) using a laser. The sub-mount wafer (14) is fractured along the fracture initiating trenches (30, 32).

Abstract: A nitride semiconductor is grown on a silicon substrate by depositing a few mono-layers of aluminum to protect the silicon substrate from ammonia used during the growth process, and then forming a nucleation layer from aluminum nitride and a buffer structure including multiple superlattices of AlRGa(1-R)N semiconductors having different compositions and an intermediate layer of GaN or other Ga-rich nitride semiconductor. The resulting structure has superior crystal quality. The silicon substrate used in epitaxial growth is removed before completion of the device so as to provide superior electrical properties in devices such as high-electron mobility transistors.

Abstract: A packaged semiconductor device, in particular a gallium nitride semiconductor structure including a lower semiconductor layer and an upper semiconductor layer disposed over a portion of the lower semiconductor layer. The semiconductor structure includes a plurality of mesas projecting upwardly from the lower layer, each of the mesas including a portion of the upper layer and defining an upper contact surface separated form adjacent mesas by a portion of the lower layer surface. The device further includes a die mounting support, wherein the bottom surface of the die is attached to the top surface of the die mounting support; and a plurality of spaced external conductors extending from the support, at least once of said spaced external conductors having a bond wire post at one end thereof; with a bonding wire extending between the bond wire post and a contact region to the top surface of the plurality of mesas.

Abstract: A gallium nitride based semiconductor Schottky diode fabricated from a n+ doped GaN layer having a thickness between one and six microns disposed on a sapphire substrate; an n? doped GaN layer having a thickness greater than one micron disposed on said n+ GaN layer patterned into a plurality of elongated fingers and a metal layer disposed on the n? doped GaN layer and forming a Schottky junction therewith. The layer thicknesses and the length and width of the elongated fingers are optimized to achieve a device with breakdown voltage of greater than 500 volts, current capacity in excess of one ampere, and a forward voltage of less than three volts.

Abstract: A converter is provided having an AC input and a DC output. The converter includes a rectifier that receives the AC input and that provides a rectifier output, a series connected current to magnetic field energy storage device and current interrupter connected across the rectifier output and a series connected gallium nitride diode and output charge storage device connected between a midpoint of the series connected magnetic field energy storage device and current interrupter and a terminal of the rectifier output and wherein the converter is characterized in not needing a transient voltage suppression circuit.

Abstract: In a light emitting package fabrication process, a plurality of light emitting chips (10) are attached on a sub-mount wafer (14). The attached light emitting chips (10) are encapsulated. Fracture-initiating trenches (30, 32) are laser cut into the sub-mount wafer (14) between the attached light emitting chips (10) using a laser. The sub-mount wafer (14) is fractured along the fracture initiating trenches (30, 32).

Abstract: A sapphire wafer having a thickness greater than 125 microns and having devices disposed thereon is laser scribed to form a grid array pattern of laser scribe lines laser scribed into the sapphire wafer. The sapphire wafer is separated along the laser scribe lines to separate a plurality of device dice defined by the grid array pattern of laser scribe lines. Each device die includes (i) a device and (ii) a portion of the sapphire wafer having the thickness greater than 125 microns. In some embodiments, a GaN LED device die includes a GaN based LED device, and a sapphire substrate supporting the GaN based LED device. The sapphire substrate has: (i) a thickness greater than 125 microns effective for increased light extraction due to a lower critical angle for total internal reflection; and (ii) sides generated by laser scribing.

Abstract: Light emitting diodes are provided with electrode and pad structures that facilitate current spreading and heat sinking. A light emitting diode may be formed as a die with a stacked structure having a first region and a mesa projecting from a surface of the first region. A first electrode may substantially cover the mesa and have a plurality of pads disposed thereon maximizing a contact area in relation to the first electrode. A second electrode may be disposed as a trace on the surface of the first region, the trace having a spiral, segmented/interdigitated, loop or pattern. Optionally, the trace includes corner spikes projecting outwardly toward edges of the first electrode.

Abstract: A flip chip light emitting diode (12) includes a light-transmissive substrate (10) with a base semiconducting layer (40) disposed thereupon. A conductive mesh (18) is disposed on the base semiconducting layer (40) and is in electrically conductive contact therewith. Light-emitting micromesas (30) are disposed in openings (20) of the conductive mesh (18). Each light emitting micromesa (30) has a topmost layer (46) of a second conductivity type that is opposite the first conductivity type. A first conductivity type electrode (14) is disposed on the base semiconducting layer (40) and is in electrical communication with the electrically conductive mesh (18). An insulating layer (60) is disposed over the electrically conductive mesh (18). A second conductivity type electrode layer (24) is disposed over the insulating layer (60) and the light-emitting micromesas (30). the insulating layer (60) insulates the second conductivity type electrode layer (24) from the electrically conductive mesh (18).

Abstract: A light emitting semiconductor device die (10, 110, 210, 310) includes an electrically insulating substrate (12, 112). First and second spatially separated electrodes (60, 62, 260, 262, 360, 362) are disposed on the electrically insulating substrate. The first and second electrodes define an electrical current flow direction directed from the first electrode to the second electrode. A plurality of light emitting diode mesas (30, 130, 130?, 230, 330) are disposed on the substrate between the first and second spatially separated electrodes. Electrical series interconnections (50, 150, 250, 350) are disposed on the substrate between neighboring light emitting diode mesas. Each series interconnection carries electrical current flow between the neighboring mesas in the electrical current flow direction.

Abstract: A guard ring is formed in a semiconductor region that is part of a Schottky junction or Schottky diode. The guard ring is formed by ion implantation into the semiconductor contact layer without completely annealing the semiconductor contact layer to form a high resistance region. The guard ring may be located at the edge of the layer or, alternatively, at a distance away from the edge of the layer. A Schottky metal contact is formed atop the layer, and the edges of the Schottky contact are disposed atop the guard ring.

Abstract: A light emitting diode (10) has a backside and a front-side with at least one n-type electrode (14) and at least one p-type electrode (12) disposed thereon defining a minimum electrodes separation (delectrodes). A bonding pad layer (50) includes at least one n-type bonding pad (64) and at least one p-type bonding pad (62) defining a minimum bonding pads separation (dpads) that is larger than the minimum electrodes separation (delectrodes). At least one fanning layer (30) interposed between the front-side of the light emitting diode (10) and the bonding pad layer (50) includes a plurality of electrically conductive paths passing through vias (34, 54) of a dielectric layer (32, 52) to provide electrical communication between the at least one n-type electrode (14) and the at least one n-type bonding pad (64) and between the at least one p-type electrode (12) and the at least one p-type bonding pad (62).

Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. This cultivar named ‘AU Golden Tiger’ was developed from seeds collected from an open pollinated ‘AU Golden Dragon’ fruit. The seedling has been reproduced by rooted cuttings and grafting and tested in replicated cultivar trials. It maintains all of its unique characteristics after each propagation. Its bloom period overlaps the bloom period of ‘AU Golden Sunshine’ and is the pollinizer for ‘AU Golden Sunshine’.

Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. ‘AU Golden Sunshine’ has a low chilling requirement, fruit is early maturing, excellent flavor with a non acid sweet taste and a high percent solube solids and dry matter content. ‘AU Golden Sunshine’ matures about 20 days after ‘AU Golden Dragon’ and 30 days before ‘Hort 16A’ (patented), the industry standard for golden flesh kiwi cultivars. ‘Au Golden Sunshine’ fruit quality indices are similar to fruit quality indices of ‘AU Golden Dragon’ and ‘Hort 16A’ (patented). There have been no differences in plant performance and fruit quality of ‘AU Golden Sunshine’ plants grown in China and Alabama.

Abstract: A new and distinct cultivar of the species Actinidia chinesis Planch is described. ‘AU Golden Dragon’ has a low chilling requirement, fruit is very early maturing, excellent flavor with a non acid sweet taste, and high soluble solids and dry matter content. ‘AU Golden Dragon’ matures about 50 days ahead of ‘Hort 16A’ (patented), the industry standard for golden flesh kiwi, therefore, the two cultivars will not compete in the market place. ‘AU Golden Dragon’ fruit quality indices are similar to fruit quality indices of ‘Hort 16A’ (patented). There have been no differences in plant performance and fruit quality of ‘AU Golden Dragon’ plants grown in China and Central Alabama.