Patents by Inventor Byong Deok Choi

Byong Deok Choi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10778679
    Abstract: A semiconductor chip comprises at least one data bus to transmit data processed by the semiconductor chip, an electric potential generator block packaged together with the at least one data bus to be blocked from external light by a package, the electric potential generator block to detect an event in which the package is unable to block the external light, and a switch configured to block a transmission of at least some data in the at least one data bus if the event is detected. A semiconductor chip comprises an energy harvesting element inside a package. The energy harvesting element may comprise an on-chip photodiode. A depackaging attack causes the generation of a voltage of a photodiode, and thus a change in physical state of the packaging can be detected.
    Type: Grant
    Filed: February 10, 2017
    Date of Patent: September 15, 2020
    Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY
    Inventors: Hyoung Ho Ko, Byong Deok Choi
  • Patent number: 10771268
    Abstract: Provided is an apparatus for generating digital values to provide a random digital value. The apparatus may generate the digital value based on a semiconductor process variation. The apparatus may include a generating unit to generate a plurality of digital values, based on the semiconductor process variation, and a processing unit to process the digital values and to provide a first digital value. The generating unit may include a plurality of physically unclonable functions (PUFs). A parameter may be differently applied to the PUFs, and the PUFs may generate the digital values.
    Type: Grant
    Filed: October 3, 2018
    Date of Patent: September 8, 2020
    Assignee: ICTK HOLDINGS CO., LTD
    Inventors: Dong Kyue Kim, Byong Deok Choi
  • Patent number: 10769309
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Grant
    Filed: February 4, 2019
    Date of Patent: September 8, 2020
    Assignee: ICTK HOLDINGS CO., LTD
    Inventors: Byong Deok Choi, Dong Kyue Kim, Tae Wook Kim
  • Patent number: 10659232
    Abstract: Disclosed is an authentication apparatus using a public key encryption algorithm. An apparatus according to an embodiment generates a first instant public key through a random number generation process in response to an electronic signature generation request corresponding to a message. Further, the apparatus calculates and uses a first instant private key making a pair with the first instant public key, using the first instant public key.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: May 19, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Dong Hyun Kim, Sang Seon Park
  • Patent number: 10658311
    Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.
    Type: Grant
    Filed: January 17, 2019
    Date of Patent: May 19, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10629549
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated by means of process variation, and if ordinary turn-on voltage is not applied to the base in the produced BJT, whether or not there is a short circuit is identified by means of a reader and an identifier is provided.
    Type: Grant
    Filed: April 19, 2019
    Date of Patent: April 21, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10629548
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.
    Type: Grant
    Filed: February 7, 2019
    Date of Patent: April 21, 2020
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Publication number: 20190391485
    Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.
    Type: Application
    Filed: August 26, 2019
    Publication date: December 26, 2019
    Inventors: Byong Deok Choi, Dong Kyue Kim, Kwang Hyun Jee
  • Patent number: 10423067
    Abstract: Disclosed is a method of generating a physical unclonable function (PUF) by causing unpredictable partial process failure for a semiconductor process. In a designing process, a second mask pattern may be printed by distorting a size and/or shape of at least one mask window included in a designed first mask pattern, without violating semiconductor design rules. A PUF may be generated using a photomask including the printed second mask pattern for photolithography.
    Type: Grant
    Filed: August 26, 2014
    Date of Patent: September 24, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Kwang Hyun Jee
  • Publication number: 20190244916
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated by means of process variation, and if ordinary turn-on voltage is not applied to the base in the produced BJT, whether or not there is a short circuit is identified by means of a reader and an identifier is provided.
    Type: Application
    Filed: April 19, 2019
    Publication date: August 8, 2019
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Publication number: 20190172801
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.
    Type: Application
    Filed: February 7, 2019
    Publication date: June 6, 2019
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Publication number: 20190172799
    Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.
    Type: Application
    Filed: January 17, 2019
    Publication date: June 6, 2019
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Publication number: 20190171850
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Application
    Filed: February 4, 2019
    Publication date: June 6, 2019
    Applicant: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok CHOI, Dong Kyue KIM, Tae Wook KIM
  • Publication number: 20190123917
    Abstract: Provided is an information processing apparatus including a physical unclonable function (PUF) to generate a unique key using a process variation in a semiconductor manufacturing process, and an encryption unit to encrypt a password and/or bio-information received from a user using the unique key.
    Type: Application
    Filed: December 14, 2018
    Publication date: April 25, 2019
    Inventors: Dong Kyue Kim, Byong Deok Choi, Dong Hyun Kim, Kwang Hyun Jee
  • Publication number: 20190114437
    Abstract: A vehicle security network design device may comprise: a level assigning unit for assigning an automobile safety integrity level (ASIL) which provides a risk management standard for each of a plurality of functional elements in a vehicle that is at least temporarily implemented by a processor; a calculation unit for calculating device's controllability with respect to each of the plurality of functional elements on the basis of a connection structure between the plurality of functional elements and a difference value of the ASIL; and a management unit for generating a risk analysis model of a plurality of functional elements.
    Type: Application
    Filed: January 19, 2017
    Publication date: April 18, 2019
    Applicants: IUCF-HYU(Industry-University Cooperation Foundation Hanyang University, ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue KIM, Byong Deok CHOI
  • Patent number: 10263781
    Abstract: An IC chip for preventing an authentication key from leaking, and an authentication key setting and authentication key verifying method are provided. A part performing connection or disconnection between an external terminal and a smartcard chip may be configured by a separate chip or may be incorporated into the smartcard chip to configure a single chip. When the part is configured by the separate chip, the disconnection between the external terminal and the smart card chip can be performed according to whether an authentication key is verified. When the part is configured by the one chip, the disconnection between the external terminal and the smart card chip can be performed under a control of the smartcard chip according to whether the authentication key is verified.
    Type: Grant
    Filed: January 15, 2014
    Date of Patent: April 16, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Sang Seon Park, Kwang Hyun Jee, Dong Hyun Kim
  • Patent number: 10235540
    Abstract: Provided is an apparatus for generating an identification key by a probabilistic determination of a short occurring between nodes constituting a circuit, by violating a design rule provided during a semiconductor manufacturing process. The identification key generating apparatus may include an identification key generator to generate an identification key based on whether a contact or a via used to electrically connect conductive layers in a semiconductor chip shorts the conductive layers, and an identification key reader to read the identification key by reading whether the contact or the via shorts the conductive layers.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: March 19, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim, Tae Wook Kim
  • Patent number: 10235261
    Abstract: A randomness testing apparatus is disclosed. A randomness testing apparatus according to an embodiment includes a randomness testing module to conduct a randomness test on physically unclonable function (PUF)-based hardware and a processing device to determine whether the PUF-based hardware is defective on the basis of a randomness test result.
    Type: Grant
    Filed: July 28, 2014
    Date of Patent: March 19, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Dong Kyue Kim, Byong Deok Choi, Kwang Hyun Jee
  • Patent number: 10224296
    Abstract: Provided is a device for generating an identification key using a process variation during a manufacturing process of a conductive layer. The device for generating an identification key may include a plurality of conductive layers designed so as to be formed in a first region within a semiconductor chip, the density in which the plurality of conductive layers are disposed in the first region being at least a first threshold value and not more than a second threshold value, the first and second threshold values being less than a minimum density according to the design rules for ensuring that all of the plurality of conductive layers are formed in the first region; and a reader which provides an identification key by identifying if, among the plurality of conductive layers, a previously designated first conductive layer has been formed.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: March 5, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim
  • Patent number: 10224295
    Abstract: Provided are a device and method for generating an identification key using process variation during a bipolar junction transistor (BJT) process. A BJT may be produced by designing such that the effective base width of the BJT is at least a first threshold value but not more than a second threshold value, or, such that the total of the width of a second depletion region formed by connection with a collector region and the width of a first depletion region formed by connection with an emitter region, within a base region, differs from the width of the base region by a value that is at least the first threshold value but not more than the second threshold value. Whether or not there is a short circuit between the emitter region and the collector region is stochastically generated, and if ordinary turn-on voltage is not applied, whether or not there is a short circuit is identified.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: March 5, 2019
    Assignee: ICTK Holdings Co., Ltd.
    Inventors: Byong Deok Choi, Dong Kyue Kim