Patents by Inventor Carlos Alberto SING-LONG COLLAO

Carlos Alberto SING-LONG COLLAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Digital multiplexing readout for sparse signals on imaging arrays
    Patent number: 9197805
    Abstract: A method for providing an image from a device with a plurality of sensors and a plurality of time to digital converters (TDC) is provided. Data signals are generated by some of the plurality of sensors, wherein each sensor of the plurality of sensors provides output in parallel to more than one TDC of the plurality of TDCs and wherein each TDC of the plurality of TDCs receives in parallel input from more than one sensor of the plurality of sensors and where a binary matrix indicates which sensors are connected to which TDC. The data signals are transmitted from the sensors to the TDCs. TDC signals are generated from the data signals. Group testing is used to decode the TDC signals based on the binary matrix.
    Type: Grant
    Filed: February 11, 2014
    Date of Patent: November 24, 2015
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Garry Chinn, Peter D. Olcott, Craig Steven Levin, Ewout Van Den Berg, Carlos Alberto Sing-Long Collao, Emmanuel J. Candes
  • DIGITAL MULTIPLEXING READOUT FOR SPARSE SIGNALS ON IMAGING ARRAYS
    Publication number: 20140226043
    Abstract: A method for providing an image from a device with a plurality of sensors and a plurality of time to digital converters (TDC) is provided. Data signals are generated by some of the plurality of sensors, wherein each sensor of the plurality of sensors provides output in parallel to more than one TDC of the plurality of TDCs and wherein each TDC of the plurality of TDCs receives in parallel input from more than one sensor of the plurality of sensors and where a binary matrix indicates which sensors are connected to which TDC. The data signals are transmitted from the sensors to the TDCs. TDC signals are generated from the data signals. Group testing is used to decode the TDC signals based on the binary matrix.
    Type: Application
    Filed: February 11, 2014
    Publication date: August 14, 2014
    Inventors: Garry CHINN, Peter D. OLCOTT, Craig Steven LEVIN, Ewout VAN DEN BERG, Carlos Alberto SING-LONG COLLAO, Emmanuel J. CANDES