Abstract: A system manipulates stimulus/response signal data associated with an integrated circuit design, such as from a computer-aided engineering simulator, and converts the data into a format acceptable by a tester device which tests a prototype or production integrated circuit. The data is graphically displayed as a waveform and as a vector sequence. On-screen editing of either display is reflected in the other display. Further, the same displays are used to convert the data from event-based data into cycle-based template data compatible with a tester. A mix between event and state data during the conversion is allowed. A standard frame generation language is presented for defining tester frames for each signal within a template or timeset. A workbench editor provides for icon-based control of the system.