Patents by Inventor Chang Chen E Shang

Chang Chen E Shang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7580188
    Abstract: A CWDM filter includes a substrate and a multi-layer structure coated on one side of the substrate. The multi-layer structure has the construction of H(LH)24L(HL)3H(LH)34L(HL)3H(LH)44L(HL)4H(LH)34 L(HL)3H(LH)44L(HL)4H(LH)34L(HL)3H(LH)34L(HL)2HLH4LH/NS, wherein NS is the substrate, L is a low (refraction) index layer with a thickness of ?0/4, H is a high (refraction) index layer with a thickness of ?0/4, and ?0 is the center wavelength of the light transmitting through the CWDM filter.
    Type: Grant
    Filed: September 8, 2006
    Date of Patent: August 25, 2009
    Assignee: Asia Optical Co., Inc
    Inventor: Chang Chen E. Shang
  • Patent number: 7405415
    Abstract: An ion source (1) to be used in optical thin film deposition by IAD process includes a discharge chamber (10), a gas source, an actuator (11), a grid assembly (20) and an outer shell (30). The grid assembly includes a screen grid (21), an accelerator grid (22) and a decelerator grid (23). The screen grid is kept at anode potential and is disposed near the ions. The accelerator grid is kept at cathode potential and is spaced from the screen grid. The decelerator grid is equal to the ground and is disposed beyond the accelerator grid. Each grid has a curved central portion (24) defining a plurality of apertures aligned with those of the other two grids to form extraction channels for an ion beam (40).
    Type: Grant
    Filed: February 11, 2005
    Date of Patent: July 29, 2008
    Assignee: Asia Optical Co., Inc.
    Inventor: Chang Chen E Shang
  • Patent number: 7355792
    Abstract: A CWDM filter of the present invention comprises a substrate; a first portion formed on the substrate having at least two first stacking structures; a second portion superposed on the first portion including at least two second stacking structures; and a first matching layer sandwiched between the first and second portions. Each of the first stacking structures of the first portion has a Fabry-Perot cavity and a first coupling layer which are stacked over each other in turn from the substrate. Each second stacking structure has a (HnLH) structure and a second coupling layer, wherein n represents a positive integer greater than 1, L represents a low index layer with a thickness of ?o/4, H represents a high index layer with a thickness of ?o/4, and ?o is the center wavelength of said noise.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: April 8, 2008
    Assignee: Asia Optical Co., Inc
    Inventor: Chang Chen E Shang
  • Patent number: 7333266
    Abstract: A CWDM filter of the present invention comprises a first portion and a second portion. The first portion includes at least two Fabry-Perot cavity structures, and the second portion comprises a non ?/4 multi-layer structure which has a plurality of alternately superposed high refraction index layers and low refraction index layers on the first portion thereof. The thicknesses of the non ?/4 layers are randomly produced as per a pre-set wavelength range which takes 1470 nm as the center wavelength thereof by computer.
    Type: Grant
    Filed: April 15, 2005
    Date of Patent: February 19, 2008
    Assignee: Asia Optical Co., Inc
    Inventor: Chang Chen E Shang
  • Patent number: 7315420
    Abstract: A CWDM filter having four channels of the present invention comprises a substrate and odd number of stack structures. Each stack structure includes a first multi-layer stack, a spacer layer, a second multi-layer stack and a coupling layer arranged in turn from the side thereof approaching the substrate. The rules of the coupling layer of the No. [(N+1)/2?1] stack structure and the coupling layer of the No. [(N+1)/2+1] stack structure both are (2n+1)L, among which, n being a positive whole number, L representing for a low refraction index layer with a thickness of ?0/4 and ?0 representing for the center wavelength thereof. While the coupling layers of the other stack structures can be expressed as L.
    Type: Grant
    Filed: July 1, 2005
    Date of Patent: January 1, 2008
    Assignee: Asia Optical Co., Inc.
    Inventor: Chang Chen E Shang
  • Publication number: 20070109649
    Abstract: A CWDM filter includes a substrate and a multi-layer structure coated on one side of the substrate. The multi-layer structure has the construction of H(LH)24L(HL)3H(LH)34L(HL)3H(LH)44L(HL)4H(LH)34 L(HL)3H(LH)44L(HL)4H(LH)34L(HL)3H(LH)34L(HL)2HLH4LH/NS, wherein Ns is the substrate, L is a low (refraction) index layer with a thickness of ?0/4, H is a high (refraction) index layer with a thickness of ?0/4, and ?0 is the center wavelength of the light transmitting through the CWDM filter.
    Type: Application
    Filed: September 8, 2006
    Publication date: May 17, 2007
    Applicant: Asia Optical Co., Inc
    Inventor: Chang Chen E. Shang