Abstract: Example embodiments of systems and methods for data transmission system between transmitting and receiving devices are provided. In an embodiment, each of the transmitting and receiving devices can contain a master key. The transmitting device can generate a diversified key using the master key, protect a counter value and encrypt data prior to transmitting to the receiving device, which can generate the diversified key based on the master key and can decrypt the data and validate the protected counter value using the diversified key.

Abstract: Systems, methods and apparatus for controlling operation of dual fuel engines are disclosed that regulate the fuelling amounts provided by a first fuel and a second fuel during operation of the engine. The first fuel can be a liquid fuel and the second fuel can be a gaseous fuel. The fuelling amounts are controlled to improve operational outcomes of the duel fuel engine.

Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Abstract: An apparatus and associated method are provided for collecting debris from a tool. A housing defines a channel, at least one of the tool and the housing being selectively movable to operably orient the tool at a predefined reference relationship to the channel. A magnetic member is operable to demagnetize at least one of the tool and the debris. A windage source in fluid communication with the channel is operable to establish a windage contacting the tool to cooperate with the magnetic member in removing the debris from the tool. A conduit connected to the channel collects the removed debris.

Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Abstract: An apparatus and associated method are provided for collecting debris from a tool. A housing defines a channel, at least one of the tool and the housing being selectively movable to operably orient the tool at a predefined reference relationship to the channel. A magnetic member is operable to demagnetize at least one of the tool and the debris. A windage source in fluid communication with the channel is operable to establish a windage contacting the tool to cooperate with the magnetic member in removing the debris from the tool. A conduit connected to the channel collects the removed debris.

Abstract: An apparatus and associated method for collecting debris from a tool, wherein programming instructions are stored in memory and executed by a machine tool controller, and wherein the controller is responsive to an intermittent debris collect signal in altering an operative path of the tool in order to engage the tool with a debris collecting device.

Abstract: Customer problem reports are collected and analyzed in order to monitor, analyze, and proactively prevent the same or similar problems from reoccurring in the future. A selection of customer problem reports are received and may be prioritized for analysis. Associated network elements may be scheduled for monitoring and/or testing at a greater frequency. Network elements may be the subject of new problem reports which may be dispatched to technicians for proactive analysis and repair.

Abstract: A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

Abstract: An apparatus and associated method for collecting debris from a tool, wherein programming instructions are stored in memory and executed by a machine tool controller, and wherein the controller is responsive to an intermittent debris collect signal in altering an operative path of the tool in order to engage the tool with a debris collecting device.

Abstract: Customer problem reports are collected and analyzed in order to monitor, analyze, and proactively prevent the same or similar problems from reoccurring in the future. A selection of customer problem reports are received and may be prioritized for analysis. Associated network elements may be scheduled for monitoring and/or testing at a greater frequency. Network elements may be the subject of new problem reports which may be dispatched to technicians for proactive analysis and repair.

Abstract: A bipolar transistor includes a base layer design and a method for fabricating such a bipolar transistor that employ a built-in accelerating field focused on a base region adjacent to a collector, where minority carrier transport is otherwise retarded. The accelerating field of the base layer includes on average, a relatively low p-doping level in a first region proximate to the collector and a relatively high p-doping level in a second region proximate to an emitter. Alternatively, the accelerating field can be derived from band gap grading, wherein the grade of band gap in the first region is greater than the grade of band gap in the second region, and the average band gap of the first region is lower than that of the second region.

Abstract: A semiconductor material which has a high carbon dopant concentration includes gallium, indium, arsenic and nitrogen. The disclosed semiconductor materials have a low sheet resistivity because of the high carbon dopant concentrations obtained. The material can be the base layer of gallium arsenide-based heterojunction bipolar transistors and can be lattice-matched to gallium arsenide emitter and/or collector layers by controlling concentrations of indium and nitrogen in the base layer. The base layer can have a graded band gap that is formed by changing the flow rates during deposition of III and V additive elements employed to reduce band gap relative to different III-V elements that represent the bulk of the layer. The flow rates of the III and V additive elements maintain an essentially constant doping-mobility product value during deposition and can be regulated to obtain pre-selected base-emitter voltages at junctions within a resulting transistor.

Abstract: A semiconductor material which has a high carbon dopant concentration includes gallium, indium, arsenic and nitrogen. The disclosed semiconductor materials have a low sheet resistivity because of the high carbon dopant concentrations obtained. The material can be the base layer of gallium arsenide-based heterojunction bipolar transistors and can be lattice-matched to gallium arsenide emitter and/or collector layers by controlling concentrations of indium and nitrogen in the base layer. The base layer can have a graded band gap that is formed by changing the flow rates during deposition of III and V additive elements employed to reduce band gap relative to different III-V elements that represent the bulk of the layer. The flow rates of the III and V additive elements maintain an essentially constant doping-mobility product value during deposition and can be regulated to obtain pre-selected base-emitter voltages at junctions within a resulting transistor.

Abstract: The invention is method for preventing sepsis-induced ARDS in a mammal in need thereof, the method comprises administering to the mammal a tetracycline compound in an amount that is effective to prevent sepsis-induced ARDS but has substantially no antibiotic activity.

Abstract: The invention discloses a novel method for preventing acute lung injury in a mammal following trauma. The method includes treating the mammal with an effective amount of a tetracycline prior to intrapulmonary accumulation of neutrophils.