Abstract: A package structure including a semiconductor die, a redistribution circuit structure and an electronic device is provided. The semiconductor die is laterally encapsulated by an insulating encapsulation. The redistribution circuit structure is disposed on the semiconductor die and the insulating encapsulation. The redistribution circuit structure includes a colored dielectric layer, inter-dielectric layers and redistribution conductive layers embedded in the inter-dielectric layers. The electronic device is disposed over the colored dielectric layer and electrically connected to the redistribution circuit structure.

Abstract: A close-loop deep brain stimulation algorithm system for Parkinson's disease includes a memory and a processor. The processor includes a deep brain stimulation (DBS) simulation module, a virtual brain network module, a feature extraction module, and a reinforcement learning module. The deep brain stimulation simulation module is adapted to combine a deep brain stimulation waveform according to the stimulation frequency and the stimulation amplitude and output the deep brain stimulation waveform. The virtual brain network module is adapted to receive the deep brain stimulation waveform to output a synaptic signal and calculate a reward parameter. The feature extraction module is adapted to receive the synaptic signal and extract a plurality of feature values according to the synaptic signal.

Abstract: A method of training AI for label-free cell viability determination includes a step of providing a cell sample, a step of obtaining a fluorescence image and a DHM image of the cell sample, a step of determining a first cell viability of the cell sample according to the fluorescence image of the cell sample, a step of labeling the DHM image of the cell sample as a model specifying the first cell viability, and a step of performing AI training by using the model containing the DHM image of the cell sample.

Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.

Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Abstract: An optical measurement system comprises a polarization beam splitter for dividing an incident beam into a reference beam and a measurement beam, a first beam splitter for reflecting the measurement beam to form a first reflected measurement beam, a spatial light modulator for modulating the first reflected measurement beam to form a modulated measurement beam, a condenser lens for focusing the modulated measurement beam to an object to form a penetrating measurement beam, an objective lens for converting the penetrating measurement beam into a parallel measurement beam, a mirror for reflecting the parallel measurement beam to form an object beam, a second beam splitter for reflecting the reference beam to a path coincident with that of the object beam, and a camera for receiving an interference signal generated by the reference beam and the object beam to generate an image of the object.

Abstract: A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Abstract: A detection system for a multilayer film is provided. The detection system for a multilayer film includes a light source device, a first image capture device, a second image capture device and an image processing device. The light source device projects a pair of parallel incident light to a transparent multilayer film obliquely. The pair of parallel incident light is projected onto the transparent multilayer film for producing and enabling a forward scattered light and a back scattered light to be projected therefrom. The first image capture device captures the back scattered light to produce a first image. The second image capture device captures the forward scattered light to produce a second image. The image processing device is coupled to the first image capture device and the second image capture device. The image processing device is used to compares and detect the differences between the second image and the first image.

Abstract: A detection system for a multilayer film is provided. The detection system for a multilayer film includes a light source device, a first image capture device, a second image capture device and an image processing device. The light source device projects a pair of parallel incident light to a transparent multilayer film obliquely. The pair of parallel incident light is projected onto the transparent multilayer film for producing and enabling a forward scattered light and a back scattered light to be projected therefrom. The first image capture device captures the back scattered light to produce a first image. The second image capture device captures the forward scattered light to produce a second image. The image processing device is coupled to the first image capture device and the second image capture device. The image processing device is used to compares and detect the differences between the second image and the first image.

Abstract: A structured light generating device and a measuring system and method are provided. The structured light generating device includes: a light modulating element for receiving a projection light beam and modulating the projection light beam into a first structured light beam having a pattern, and a light shifting element corresponding to the light modulating element for receiving and shifting the first structured light beam to generate a second structured light beam having the pattern. A shift difference is formed between the first structured light beam and the second structured light beam, and the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam so as to improve resolution.

Abstract: A three-dimensional measurement system includes a projector, an image sensor, an image analyzing module and a measurement module. The projector provides a structured light pattern. The image sensor captures an object image of an object on which the structured light pattern is projected. The image analyzing module analyzes the object image to obtain a space coding image and a phase coding image according to gray level distribution of the object image. The measurement module calculates phase information of each of coordinate points in the phase coding image, calculates compensation information of a coordinate position, corresponding to a coordinate position of a point of discontinuity, in the space coding image, compensates the phase information of the point of discontinuity in the phase coding image by the compensation information, and calculates height information of the object according to the phase information of each of the coordinate points.

Abstract: A three-dimensional measurement system includes a projector, an image sensor, an image analyzing module and a measurement module. The projector provides a structured light pattern. The image sensor captures an object image of an object on which the structured light pattern is projected. The image analyzing module analyzes the object image to obtain a space coding image and a phase coding image according to gray level distribution of the object image. The measurement module calculates phase information of each of coordinate points in the phase coding image, calculates compensation information of a coordinate position, corresponding to a coordinate position of a point of discontinuity, in the space coding image, compensates the phase information of the point of discontinuity in the phase coding image by the compensation information, and calculates height information of the object according to the phase information of each of the coordinate points.

Abstract: A surface measurement device includes a rotating platform, a motion lever, a measuring module and a control module. The rotating platform rotates an object at a rotating speed. The motion lever is above the rotating platform. The measuring module moves to a variety of measuring positions on the motion lever. When the measuring module is at one of the measuring positions, the measuring module measures the heights of a plurality of sampling points on the surface of the object in a sampling frequency. The control module selectively modifies the rotating speed of the rotating platform or the sampling frequency of the measuring module according to the measuring position of the measuring module to make the distance between the sampling points in at least a region of the surface of the object match a sampling rule.

Abstract: A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.

Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.

Abstract: A measurement system is configured to measure a surface structure of a sample. The surface of the sample has a thin film and a via, the depth of the via is larger than the thickness of the thin film. The measurement system includes a light source, a first light splitter, a first aperture stop, a lens assembly, a second aperture stop, a spectrum analyzer and an analysis module. The first light splitter disposed in the light emitting direction of the light source. The first aperture stop disposed between the light source and the first light splitter. The lens assembly is disposed between the first light splitter and the sample. The second aperture stop is disposed between the lens assembly and the first light splitter. The spectrum analyzer is disposed to at a side of the first light splitter opposite to the sample.

Abstract: A structured light generating device and a measuring system and method are provided. The structured light generating device includes: a light modulating element for receiving a projection light beam and modulating the projection light beam into a first structured light beam having a pattern, and a light shifting element corresponding to the light modulating element for receiving and shifting the first structured light beam to generate a second structured light beam having the pattern. A shift difference is formed between the first structured light beam and the second structured light beam, and the first structured light beam and the second structured light beam are superimposed to form a superimposed structured light beam so as to improve resolution.

Abstract: A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.

Abstract: A surface measurement device includes a rotating platform, a motion lever, a measuring module and a control module. The rotating platform rotates an object at a rotating speed. The motion lever is above the rotating platform. The measuring module moves to a variety of measuring positions on the motion lever. When the measuring module is at one of the measuring positions, the measuring module measures the heights of a plurality of sampling points on the surface of the object in a sampling frequency. The control module selectively modifies the rotating speed of the rotating platform or the sampling frequency of the measuring module according to the measuring position of the measuring module to make the distance between the sampling points in at least a region of the surface of the object match a sampling rule.

Abstract: A scattering measurement system is provided, including: a light source generator for generating a detection light beam with multi-wavelengths, wherein the detection light beam is incident on an object so as to generate a plurality of multi-order diffraction light beams with three-dimensional feature information; a spatial filter for filtering out zero-order light beams from the plurality of multi-order diffraction light beams; and a detector having a photosensitive array for receiving the plurality of multi-order diffraction light beams filtered out by the spatial filter and converting the filtered plurality of multi-order diffraction light beams into multi-order diffraction signals with the three-dimensional feature information. As such, the three-dimensional structure of the object can be obtained by comparing the multi-order diffraction signals with a database.