Patents by Inventor Chih Yuan Chang

Chih Yuan Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8508490
    Abstract: A method of detecting a touch event for a touch panel which comprises a plurality of intersecting traces. The method includes outputting a charge control signal to a trace of the plurality of traces, and keeping other traces except for the trace floating and determining whether the touch event happens according to a voltage signal on the trace.
    Type: Grant
    Filed: September 24, 2009
    Date of Patent: August 13, 2013
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: He-Wei Huang, Hui-Hung Chang, Chih-Yuan Chang
  • Patent number: 8415957
    Abstract: A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor.
    Type: Grant
    Filed: December 16, 2009
    Date of Patent: April 9, 2013
    Assignee: Novatek Microelectronics Corp.
    Inventors: He-Wei Huang, Chih-Yuan Chang, Hui-Hung Chang
  • Publication number: 20130032799
    Abstract: A method includes providing on a substrate having at least two through substrate vias (“TSVs”) a plurality of test structures for de-embedding the measurement of the intrinsic characteristics of a device under test (DUT) including at least two of the TSVs; measuring the intrinsic characteristics [L] for a first and a second test structure on the substrate including two pads coupled with a transmission line of length L; using simultaneous solutions of ABCD matrix or T matrix form equations, and the measured intrinsic characteristics, solving for the intrinsic characteristics of the pads and the transmission lines; de-embedding the measurements of the third and fourth test structures using the intrinsic characteristics of the pads and the transmission lines; and using simultaneous solutions of ABCD matrix or T matrix form equations for BM_L and BM_LX, and the measured intrinsic characteristics, solving for the intrinsic characteristics of the TSVs.
    Type: Application
    Filed: August 3, 2011
    Publication date: February 7, 2013
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Hsiao-Tsung Yen, Yu-Ling Lin, Chin-Wei Kuo, Victor Chih Yuan Chang, Min-Chie Jeng
  • Publication number: 20120249446
    Abstract: A touch-sensing apparatus including a touch panel and a touch-sensing controller is provided. The touch panel includes a plurality of touch blocks. Each of the touch blocks includes a first portion and a second portion. The touch-sensing controller includes a driving line and a plurality of sensing lines. The driving line is coupled to the first portions of the touch blocks, and the sensing lines are respectively coupled to the second portions of the touch blocks. The touch-sensing controller outputs a driving signal to the first portions through the driving line and receives a plurality of sensing signals generated by the second portions according to the driving signal through the sensing lines, so as to determine a touch coordinates corresponding to one of the touch blocks.
    Type: Application
    Filed: January 16, 2012
    Publication date: October 4, 2012
    Applicant: NOVATEK MICROELECTRONICS CORP.
    Inventors: Chun-Hung Chen, Chih-Peng Hsia, Chih-Yuan Chang, He-Wei Huang, Chun-Ching Huang
  • Publication number: 20120105372
    Abstract: An energy-efficient touch panel control device includes a touch panel, a buffer memory, an analog to digital conversion unit, for converting analog output voltage to digital trace data and storing the digital trace data in the buffer memory, and according to a control signal, switching an operating mode, an operation unit, generating a detecting result according to the digital trace data, switching the operating mode according to an interrupt signal, and including a mode control unit, for generating the control signal according to the interrupt signal, and a host interface unit.
    Type: Application
    Filed: January 15, 2012
    Publication date: May 3, 2012
    Inventors: Hui-Hung Chang, He-Wei Huang, Tsung-Yin Yu, Chih-Yuan Chang
  • Patent number: 8115500
    Abstract: Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a target test structure that has to-be-measured contact or via capacitance. Measurements are then repeated on a substantially similar reference test structure that is free of to-be-measured contact or via capacitances. By using the capacitance measurements of the two test structures, the to-be-measured contact and via capacitance can be calculated.
    Type: Grant
    Filed: January 27, 2011
    Date of Patent: February 14, 2012
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd
    Inventors: Yih-Yuh Doong, Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang
  • Patent number: 8115747
    Abstract: An energy-efficient touch panel control device includes a touch panel, a buffer memory, an interrupt initiation unit, for outputting an interrupt signal, an analog to digital conversion unit, for converting analog output voltage to digital trace data and storing the digital trace data in the buffer memory, and according to a control signal, switching an operating mode, an operation unit, generating a detecting result according to the digital trace data, switching the operating mode according to the control signal, a mode control unit, for generating the control signal according to the interrupt signal, and a host interface unit.
    Type: Grant
    Filed: July 8, 2009
    Date of Patent: February 14, 2012
    Assignee: NOVATEK Microelectronics Corp.
    Inventors: Hui-Hung Chang, He-Wei Huang, Tsung-Yin Yu, Chih-Yuan Chang
  • Publication number: 20110273192
    Abstract: A capacitance measurement device includes a charging control unit for charging a measured capacitor, a discharging control unit for discharging the measured capacitor, a first switch coupled to the measured capacitor and the charging control unit for controlling a connection between the measured capacitor and the charging control unit according to a first switching signal, a second switch coupled to the measured capacitor and the discharging control unit for controlling a connection between the measured capacitor and the discharging control unit according to a second switching signal, a first A/D converter coupled to the measured capacitor for converting a voltage signal on the measured capacitor into a first signal, and a duty cycle detecting circuit coupled to the measured capacitor for converting the voltage signal on the measured capacitor into a count value that represents the capacitance of the measured capacitor and outputting the count value to a processing unit.
    Type: Application
    Filed: March 14, 2011
    Publication date: November 10, 2011
    Inventors: He-Wei Huang, Chun-Hung Chen, Chih-Yuan Chang
  • Publication number: 20110273193
    Abstract: A touch detection method for a touch control device including a touch panel includes examining whether a charging capacity for charging a measured capacitor of the touch panel and a discharging capacity for discharging the measured capacitor are determined; charging and discharging the measured capacitor by using the charging capacity and the discharging capacity when the charging capacity and the discharging capacity are determined and receiving a count value representing the capacitance of the measured capacitor, examining whether a base count value is set, calculating a difference between the count value and the base count value when the base count value is set, for determining whether the touch panel is touched, examining whether the count value is in a predetermined range, and performing a charging and discharging capacity setting process when the count value is out of the predetermined range, for adjusting the charging capacity and the discharging capacity.
    Type: Application
    Filed: March 14, 2011
    Publication date: November 10, 2011
    Inventors: He-Wei Huang, Chun-Hung Chen, Chih-Yuan Chang
  • Publication number: 20110210955
    Abstract: The invention provides a gate driver for a liquid crystal display. The gate driver includes a first shift register for sequentially generating a plurality of first scan signals according to a synchronization start signal and a clock signal, an enable control unit for generating an enable signal according to the plurality of first scan signals, a second shift register for generating a plurality of second scan signals sequentially according to the synchronization start signal, the clock signal, and the enable signal, a level shifter for generating a plurality of first output signals and a plurality of second output signals, a logic processing unit for selectively perform logic on the plurality of first output signals and the plurality of second output signals to generate a plurality of gate driving signals, and an output stage for outputting the plurality of gate driving signals.
    Type: Application
    Filed: May 19, 2010
    Publication date: September 1, 2011
    Inventors: Chih-Yuan Chang, Yen-Hong Lin
  • Publication number: 20110168995
    Abstract: Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a target test structure that has to-be-measured contact or via capacitance. Measurements are then repeated on a substantially similar reference test structure that is free of to-be-measured contact or via capacitances. By using the capacitance measurements of the two test structures, the to-be-measured contact and via capacitance can be calculated.
    Type: Application
    Filed: January 27, 2011
    Publication date: July 14, 2011
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yih-Yuh Doong, Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang
  • Patent number: 7880494
    Abstract: Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a target test structure that has to-be-measured contact or via capacitance. Measurements are then repeated on a substantially similar reference test structure that is free of to-be-measured contact or via capacitances. By using the capacitance measurements of the two test structures, the to-be-measured contact and via capacitance can be calculated.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: February 1, 2011
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yih-Yuh Doong, Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang
  • Publication number: 20110001491
    Abstract: A capacitance measurement circuit and method are provided. A storage capacitor is pre-charged. Charge transfer is performed between an under-test capacitor and the storage capacitor. The storage capacitor is discharged and charged according to a relationship between a voltage of the storage capacitor and a reference voltage. The capacitance of the under-test capacitor is measured according to the voltage on the storage capacitor.
    Type: Application
    Filed: December 16, 2009
    Publication date: January 6, 2011
    Applicant: NOVATEK MICROELECTRONICS CORP.
    Inventors: He-Wei Huang, Chih-Yuan Chang, Hui-Hung Chang
  • Publication number: 20100253639
    Abstract: A method of detecting a touch event for a touch panel which comprises a plurality of intersecting traces. The method includes outputting a charge control signal to a trace of the plurality of traces, and keeping other traces except for the trace floating and determining whether the touch event happens according to a voltage signal on the trace.
    Type: Application
    Filed: September 24, 2009
    Publication date: October 7, 2010
    Inventors: He-Wei Huang, Hui-Hung Chang, Chih-Yuan Chang
  • Publication number: 20100214255
    Abstract: An energy-efficient touch panel control device includes a touch panel, a buffer memory, an interrupt initiation unit, for outputting an interrupt signal, an analog to digital conversion unit, for converting analog output voltage to digital trace data and storing the digital trace data in the buffer memory, and according to a control signal, switching an operating mode, an operation unit, generating a detecting result according to the digital trace data, switching the operating mode according to the control signal, a mode control unit, for generating the control signal according to the interrupt signal, and a host interface unit.
    Type: Application
    Filed: July 8, 2009
    Publication date: August 26, 2010
    Inventors: Hui-Hung Chang, He-Wei Huang, Tsung-Yin Yu, Chih-Yuan Chang
  • Patent number: 7772868
    Abstract: Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a target test structure that has to-be-measured contact or via capacitance. Measurements are then repeated on a substantially similar reference test structure that is free of to-be-measured contact or via capacitances. By using the capacitance measurements of the two test structures, the to-be-measured contact and via capacitance can be calculated.
    Type: Grant
    Filed: December 28, 2007
    Date of Patent: August 10, 2010
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yih-Yuh Doong, Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang
  • Publication number: 20100185884
    Abstract: A standby power saving system includes a standby power control module connected to or disposed on a motherboard of a computer for bidirectional signal transmission and transmitting a control signal; and at least one receiving module disposed on at least one AC power line of the computer and/or at least one peripheral apparatus, and connected to the standby power control module for receiving the control signal to switch on or off AC powers of the computer and/or the peripheral apparatus.
    Type: Application
    Filed: April 15, 2009
    Publication date: July 22, 2010
    Inventors: Chieh-Cheng Chen, Chih-Yuan Chang, Ching-Liang Chiu
  • Publication number: 20100156453
    Abstract: Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a target test structure that has to-be-measured contact or via capacitance. Measurements are then repeated on a substantially similar reference test structure that is free of to-be-measured contact or via capacitances. By using the capacitance measurements of the two test structures, the to-be-measured contact and via capacitance can be calculated.
    Type: Application
    Filed: March 2, 2010
    Publication date: June 24, 2010
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yih-Yuh Doong, Keh-Jeng Chang, Yuh-Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang
  • Publication number: 20100026233
    Abstract: A power managing system includes a battery, a solar cell, a detecting circuit and a control module. The solar cell transforms a received light into a voltage and the battery is charged by the solar cell. The detecting circuit detects the voltage and correspondingly generates a detecting signal. The control module controls a pathway between the battery and the solar cell according to the detecting signal.
    Type: Application
    Filed: September 29, 2008
    Publication date: February 4, 2010
    Inventors: Chi-Ching Lee, Chih-Yuan Chang
  • Publication number: 20090278590
    Abstract: A power sequence control circuit receives an input positive voltage and an input negative voltage. The control circuit includes a pull-up stage, having a first terminal receiving the input positive voltage, a second terminal coupled to a node, and a control terminal receiving feedback of an output positive voltage. A pull-down stage has a first terminal coupled to the node and a second terminal coupled to an output negative voltage. A current-limit switching unit has a first terminal receiving the input positive voltage, a second terminal outputting the output positive voltage, and a control terminal coupled to the node. When the output negative voltage decreases, and if the pull-down stage decreases a control voltage at the node and the control voltage is less than a threshold value, the current-limit switching unit is conducted to transmit the input positive voltage as the output positive voltage.
    Type: Application
    Filed: July 22, 2008
    Publication date: November 12, 2009
    Applicant: NOVATEK MICROELECTRONICS CORP.
    Inventor: Chih-Yuan Chang