Patents by Inventor Chizuru Arai

Chizuru Arai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEST APPARATUS AND CIRCUIT SUBSTRATE UNIT
    Publication number: 20150276858
    Abstract: A test apparatus that tests a device under test, comprising first and second test substrates facing each other; test circuits provided respectively on a first substrate surface of the first test substrate facing the second test substrate and a second substrate surface of the second test substrate facing the first test substrate; a first cooling section provided on the first substrate surface of the first test substrate to house the test circuit and to have a cooling medium introduced therein; and a second cooling section provided on the second substrate surface of the second test substrate to house the test circuit and to have a cooling medium introduced therein. The first and second cooling sections include respective contact portions in contact with each other, and each contact portion has a connection opening that connects inside of the first cooling section and inside of the second cooling section to each other.
    Type: Application
    Filed: March 26, 2014
    Publication date: October 1, 2015
    Applicant: ADVANTEST CORPORATION
    Inventors: Hidehiko YASUNO, Chizuru ARAI
  • Network analyzer
    Patent number: D377319
    Type: Grant
    Filed: December 12, 1995
    Date of Patent: January 14, 1997
    Assignee: Advantest Corporation
    Inventors: Hiroaki Amano, Chizuru Arai