Abstract: The electronic device includes a first (BP) and a second (BN) terminal and electronic means coupled between said two terminals; the electronic means include at least one block (BLC) comprising an MOS transistor (TR) including a parasitic bipolar transistor, the MOS transistor having the drain (D) thereof coupled to the first terminal (BP), the source (S) thereof coupled to the second terminal (BN) and being additionally configured, in the event of a current pulse (IMP) between the two terminals, to operate in a hybrid mode including MOS operation in a subthreshold mode and operation of the parasitic bipolar transistor. The device can comprise two blocks (BLC1, BLC2) connected symmetrically between the two terminals (BP, BN) with a triac (TRC) the trigger of which is connected to the common terminal (BC) of the two blocks.

Abstract: A structure for protecting an integrated circuit against electrostatic discharges, comprising an assembly of identical cells, each of which is connected to a terminal forming a pad of the circuit, a first supply rail, or a second supply rail, the cells forming between any two of said terminals an assembly of four alternated layers of different conductivity types.

Abstract: An integrated circuit protected against electrostatic discharges, including: first and second supply rails; first and second intermediary rails normally connected to the first and second supply rails; inverters formed of a P-channel MOS transistor series-connected to an N-channel MOS transistor, the sources of the P-channel and N-channel MOS transistors being respectively connected to the first and second supply rails and the bodies of the P-channel and N-channel transistors being respectively connected to the first and second intermediary rails; a positive overvoltage detector between the first and second supply rails; and a switch for connecting the first and second intermediary rails to the second and first supply rails when a positive overvoltage is detected.

Abstract: The integrated circuit may include at least one electronic protection circuit for protecting against at least one electrostatic discharge and being able to discharge the overvoltage current generated by the electrostatic discharge. The electronic protection circuit includes a controlled short-circuiting switch embodied in CMOS technology including a CMOS technology TRIAC or a CMOS technology thyristor arranged in anti-parallel with a CMOS technology diode, and a triggering circuit for controlling the short-circuiting switch.

Abstract: A structure for protecting an integrated circuit against electrostatic discharges, including a device for removing overvoltages between first and second power supply rails; and a protection cell connected to a pad of the circuit including a diode having an electrode, connected to a region of a first conductivity type, connected to the second power supply rail and having an electrode, connected to a region of a second conductivity type, connected to the pad and, in parallel with the diode, a thyristor having an electrode, connected to a region of the first conductivity type, connected to the pad and having a gate, connected to a region of the second conductivity type, connected to the first rail, the first and second conductivity types being such that, in normal operation, when the circuit is powered, the diode is non-conductive.

Abstract: A structure for protecting an integrated circuit against electrostatic discharges, comprising an assembly of identical cells, each of which is connected to a terminal forming a pad of the circuit, a first supply rail, or a second supply rail, the cells forming between any two of said terminals an assembly of four alternated layers of different conductivity types.

Abstract: An integrated circuit protected against electrostatic discharges, including: first and second supply rails; first and second intermediary rails normally connected to the first and second supply rails; inverters formed of a P-channel MOS transistor series-connected to an N-channel MOS transistor, the sources of the P-channel and N-channel MOS transistors being respectively connected to the first and second supply rails and the bodies of the P-channel and N-channel transistors being respectively connected to the first and second intermediary rails; a positive overvoltage detector between the first and second supply rails; and a switch for connecting the first and second intermediary rails to the second and first supply rails when a positive overvoltage is detected.

Abstract: The integrated circuit may include at least one electronic protection circuit for protecting against at least one electrostatic discharge and being able to discharge the overvoltage current generated by the electrostatic discharge. The electronic protection circuit includes a controlled short-circuiting switch embodied in CMOS technology including a CMOS technology TRIAC or a CMOS technology thyristor arranged in anti-parallel with a CMOS technology diode, and a triggering circuit for controlling the short-circuiting switch.

Abstract: An embodiment of a protection circuit, comprising a first PNP-type bipolar transistor and a second NPN-type bipolar transistor, the base of the first transistor being connected to the collector of the second transistor and the collector of the first transistor being connected to the base of the second transistor, in which a MOS transistor is connected between the collector and the emitter of the second transistor.

Abstract: An embodiment of a protection circuit, comprising a first PNP-type bipolar transistor and a second NPN-type bipolar transistor, the base of the first transistor being connected to the collector of the second transistor and the collector of the first transistor being connected to the base of the second transistor, in which a MOS transistor is connected between the collector and the emitter of the second transistor.