Patents by Inventor Christopher Kenneth GLENISTER

Christopher Kenneth GLENISTER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • XPS and Raman sample analysis system and method
    Patent number: 10816476
    Abstract: A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
    Type: Grant
    Filed: February 8, 2017
    Date of Patent: October 27, 2020
    Assignees: VG SYSTEMS LIMITED, THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
    Inventors: Timothy Sion Nunney, Christopher Kenneth Glenister, Matthew Wayne Meyer, Noah Hibbard
  • XPS AND RAMAN SAMPLE ANALYSIS SYSTEM AND METHOD
    Publication number: 20190285548
    Abstract: A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
    Type: Application
    Filed: February 8, 2017
    Publication date: September 19, 2019
    Inventors: Timothy Sion NUNNEY, Christopher Kenneth GLENISTER, Matthew Wayne MEYER, Noah HIBBARD