Patents by Inventor Christopher SUPRANOWITZ

Christopher SUPRANOWITZ has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEFLECTOMETRY DEVICE FOR DIFFERENTIAL METROLOGY OF MATERIAL REMOVAL
    Publication number: 20230089973
    Abstract: A deflectometry device comprising a kinematic spot part holder, a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera having a detector. Additionally is described, a deflectometry device that is part of a deterministic finishing machine comprising a display, an imaging optic, a stop, and a camera imaging assembly including a camera lens and a camera. Additionally, a method for characterizing material removal created by a deterministic finishing machine is provided.
    Type: Application
    Filed: September 16, 2022
    Publication date: March 23, 2023
    Inventors: Johnathan DAVIS, Christopher SUPRANOWITZ, William MESSNER, Matthew SIDARE, Brian LACHANCE, Andrew JONES