Abstract: A grounding method for use in high frequency electrical circuitry has a conductive elastomeric member with a low resistivity per square. The conductive elastomeric member is placed in contact with the ground plane of a circuit board and a conductive housing within which the circuit board is situated. The conductive elastomeric member is deformed to flow into discontinuities of a ground path between the ground plane and the conductive housing so that the discontinuities do not act as antennae to radiate energy in response to high frequency signals.

Abstract: A mounting and aligning apparatus for a fiber optic cable is formed of segments interconnected by integrally formed shoulders that are rotated with respect to each other so as to be orthogonal. Apertures are formed in each segment normal to the surfaces of the segments and co-existent with a central axis for insertion of the fiber optic cable. The integrally formed shoulders are stressed past the elastic limit of the material used to produce a starting bias point for the adjustment of the fiber optic cable. Machine screws are used to open and close the relative distance between adjacent segments thereby permitting the alignment of the fiber optic cable with a source of laser light.

Abstract: An integrated circuit probe station comprises a table having a substantially planar upper surface, an IC probe positioned over the table in spaced relationship with the upper surface of the table, a chuck carrier, and a chuck. The chuck carrier has a substantially planar lower surface that is positioned in confronting relationship with the upper surface of the table, and a film of viscous material is interposed between the upper surface of the table and the lower surface of the chuck carrier, whereby the chuck carrier may be moved manually relative to the table in horizontal directions while resting on the table. The chuck is carried on the chuck carrier and is movable vertically relative to the chuck carrier. A mechanical prime mover is effective between the chuck carrier and the chuck for bringing about vertical movement of the chuck relative to the chuck carrier.

Abstract: A probe mount carries a probe with test points having ends in a test point plane. The probe mount is supported at three spaced apart locations by respective first, second and third supports, each adjacent to a respective one of the test points. These probe supports permit independent shifting of each of the three locations along respective parallel lines. As these locations are shifted relative to one another, the test point plane is tilted until it is parallel to a second plane containing the surface of an integrated circuit wafer to be probed. A test surface is positioned in the second plane and advanced toward the probe. As the test points contact the test surface, the test point plane is tilted. Microprocessor controlled stepper motors may be used to tilt the test point plane and to shift the test surface.

Abstract: An electro-optic sampler comprises a body of semiconductor material that can be energized to emit polarized light, a photodetector device for generating an electrical output signal representative of the intensity with which light polarized in a predetermined manner is incident on the photodetector device, and a body of electro-optic material defining an optical waveguide for transmitting light from the source of polarized light to the photodetector. First and second electrodes are provided for establishing an electrical field within the body of electro-optic material. The body of electro-optic material has a spherical index ellipsoid when the first and second electrodes are at the same potential and otherwise has a non-spherical index ellipsoid.

Abstract: A pressure sensing apparatus for use in an integrated circuit testing station is disclosed. The testing station includes a probe, a support structure, and lift means for moving an integrated circuit upward toward the probe. The invention specifically consists of a pressure pad secured to the support structure directly above the probe. The pad includes a resilient body portion having a rigid tip. Embedded within the pad is a piezoelectric element having electrical contact leads attached thereto. When the testing station is used, an integrated circuit is moved upward by the lift means toward the probe. As the circuit contacts the probe, it moves the probe upward. As the probe moves upward, it pushes on the pad, causing internal pressures to be generated therein. Such pressures are transmitted to the piezoelectric element which generates electrical impulses proportional to the pressures exerted on the pad.

Abstract: A coaxial switch comprising a metallic cylindrical body and cover assembly having a metallic rotor disposed therein includes transmission line portions having a uniform constant impedance characteristic over the lengths thereof. Both double pole, double throw and single pole, multiple throw switch configurations may be provided. The rotor may be driven either manually or electrically.