Patents by Inventor Daniel G. Knierim

Daniel G. Knierim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11041884
    Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: June 22, 2021
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman
  • Publication number: 20210148951
    Abstract: An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.
    Type: Application
    Filed: November 16, 2020
    Publication date: May 20, 2021
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Josiah A. Bartlett, Amr Haj-Omar, Donald J. Dalebroux, Barton T. Hickman, Alexander Krauska
  • Patent number: 11002764
    Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes.
    Type: Grant
    Filed: February 11, 2020
    Date of Patent: May 11, 2021
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman, Joshua J. O'Brien
  • Patent number: 10996178
    Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: May 4, 2021
    Assignee: Tektronix, Inc.
    Inventors: Jonathan S. Dandy, Daniel G. Knierim
  • Publication number: 20210088553
    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
    Type: Application
    Filed: December 7, 2020
    Publication date: March 25, 2021
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, William A. Hagerup, Barton T. Hickman, Ira G. Pollock
  • Patent number: 10859598
    Abstract: A method for electrically connecting a test and measurement instrument to a via of a printed circuit board, PCB, the method comprising: dispensing a UV-curable conductive adhesive into a back-drilled hole formed in the PCB, the back-drilled hole extending to the via, such that the dispensed adhesive contacts the via; curing the dispensed adhesive by applying a UV light source to the dispensed adhesive; and connecting a test and measurement instrument to the cured adhesive using a conductive member.
    Type: Grant
    Filed: February 27, 2019
    Date of Patent: December 8, 2020
    Assignee: Tektronix, Inc.
    Inventors: Julie A. Campbell, Karl A. Rinder, Daniel G. Knierim
  • Publication number: 20200304110
    Abstract: Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
    Type: Application
    Filed: June 6, 2020
    Publication date: September 24, 2020
    Applicant: Tektronix, Inc.
    Inventors: Patrick A. Smith, Daniel G. Knierim
  • Publication number: 20200256893
    Abstract: A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes.
    Type: Application
    Filed: February 11, 2020
    Publication date: August 13, 2020
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman, Joshua J. O'Brien
  • Patent number: 10735013
    Abstract: A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: August 4, 2020
    Assignee: Tektronix, Inc.
    Inventors: Karen Hovakimyan, Gregory A. Martin, Daniel G. Knierim
  • Patent number: 10720295
    Abstract: An electronic switch includes a substrate and a rotator assembly. The rotator assembly is configured to prevent rotation between a first rotational configuration and a second rotational configuration in a first translational position of the rotator assembly, while the rotator assembly is configured to rotate between the first rotational configuration and the second rotational configuration in a second translational position of the rotator assembly. The second translational position of the rotator assembly is translationally offset from the first translational position of the rotator assembly.
    Type: Grant
    Filed: July 23, 2018
    Date of Patent: July 21, 2020
    Assignee: Tektronix, Inc.
    Inventors: James D. Pileggi, Daniel G. Knierim
  • Publication number: 20200212923
    Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
    Type: Application
    Filed: August 28, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Gregory A. Martin, Patrick Satarzadeh, John J. Pickerd, Daniel G. Knierim
  • Publication number: 20200212922
    Abstract: A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.
    Type: Application
    Filed: July 30, 2019
    Publication date: July 2, 2020
    Applicant: Tektronix, Inc.
    Inventors: Karen Hovakimyan, Gregory A. Martin, Daniel G. Knierim
  • Publication number: 20200200794
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: June 18, 2018
    Publication date: June 25, 2020
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Patent number: 10680588
    Abstract: Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.
    Type: Grant
    Filed: January 13, 2016
    Date of Patent: June 9, 2020
    Assignee: Tektronix, Inc.
    Inventors: Patrick A. Smith, Daniel G. Knierim
  • Publication number: 20200027676
    Abstract: An electronic switch includes a substrate and a rotator assembly. The rotator assembly is configured to prevent rotation between a first rotational configuration and a second rotational configuration in a first translational position of the rotator assembly, while the rotator assembly is configured to rotate between the first rotational configuration and the second rotational configuration in a second translational position of the rotator assembly. The second translational position of the rotator assembly is translationally offset from the first translational position of the rotator assembly.
    Type: Application
    Filed: July 23, 2018
    Publication date: January 23, 2020
    Applicant: Tektronix, Inc.
    Inventors: James D. Pileggi, Daniel G. Knierim
  • Publication number: 20190377008
    Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
    Type: Application
    Filed: June 24, 2019
    Publication date: December 12, 2019
    Applicant: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman
  • Patent number: 10365300
    Abstract: This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or based on another event, trigger, or signal. Stored data in the acquisition memory may be marked relative to the detection of the final event. An external forced timeout signal may control which in a series of events is marked as a final event. The triggering on final event may be enabled after another trigger is satisfied, and may be used as one of many different types of triggers.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: July 30, 2019
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, David L. Kelly, Patrick A. Smith
  • Publication number: 20190204356
    Abstract: A mechanism is included for receiving a phase modulated optical signal. The phase modulated signal is modulated by a remote electrical test signal at a sensor head. A reference optical signal is also received. A phase difference between the phase modulated optical signal and the reference optical signal is then determined. The phase difference is employed to recover the remote electrical test signal from the sensor head. The phase difference may be determined by employing a phase modulator in a controller that tracks a phase modulator in the sensor head. The phase difference may also be determined by comparison of the signals in the complex signal domain.
    Type: Application
    Filed: December 31, 2017
    Publication date: July 4, 2019
    Applicant: Tektronix, Inc.
    Inventors: Michael J. Mende, Daniel G. Knierim, Richard A. Booman
  • Patent number: 10330705
    Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
    Type: Grant
    Filed: December 27, 2016
    Date of Patent: June 25, 2019
    Assignee: Tektronix, Inc.
    Inventors: Daniel G. Knierim, Barton T. Hickman
  • Patent number: 10225022
    Abstract: An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to transmit the optical signal via a downstream fiber. The electro-optical sensor employs a variation output configured to transmit variation data indicating variation in the received optical carrier to support compensation for corresponding variation in the optical signal.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: March 5, 2019
    Assignee: Tektronix, Inc.
    Inventors: Richard A. Booman, Michael J. Mende, Daniel G. Knierim