Patents by Inventor David Bunimovich

David Bunimovich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240149461
    Abstract: A foolproof device provided to a manufacturing process includes an imaging part that captures an object on which a plurality of identifiable marks are provided, an image processing part that obtains state data including a coordinate position of each mark from at least one captured image captured by the imaging part, a storage that stores reference data obtained by the image processing part, the reference data including a reference position of each mark, and a comparison processing part that compares the reference data stored in the storage with the current state data obtained by the image processing part, and outputs a result of the comparison regarding at least some of the plurality of marks.
    Type: Application
    Filed: November 3, 2023
    Publication date: May 9, 2024
    Applicant: MITUTOYO CORPORATION
    Inventors: Akira TAKADA, Mitsuru FUKUDA, Hirotada ANZAI, Eran YERUHAM, Yuval YERUHAM, David BUNIMOVICH
  • Patent number: 6199024
    Abstract: A calibration method for a shape measurement with a variable distance between the scanning probe datum point and the measuring point on the surface of a workpiece, is provided. Based on the measured distance between the scanning probe datum point and each of a plurality of measuring points on the surface of a calibration object, and on the position of a reference point on a motion system platform on which the scanning probe assembly is mounted, corresponding to the scanning probe being in a sensing position of each of the plurality of measuring points, the method provides the necessary data for calculating the coordinate of a measuring point of the workpiece from the measured distance between the scanning probe datum point and the measuring point, and from the position of the reference point corresponding to the to the scanning probe being in a sensing position of the measuring point.
    Type: Grant
    Filed: September 7, 1999
    Date of Patent: March 6, 2001
    Assignee: Nextel Ltd.
    Inventors: David Bunimovich, Gabi Horovitz
  • Patent number: 6189365
    Abstract: A method for estimating the error of a measured shape of a workpiece, as measured using an optical probe. A series of N equally spaced distance measurements are transformed to a power spectrum. The average power above a cutoff index is divided by N to give an estimate of the variance of the shape measurement.
    Type: Grant
    Filed: December 17, 1998
    Date of Patent: February 20, 2001
    Assignee: Nex Tec Ltd.
    Inventors: Gabi Horovitz, David Bunimovich