Abstract: One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.

Abstract: One aspect provides a system, including: a sensor adjustment component having: a memory device having adjustment information stored therein; a light engine capable of producing a signal detectable by a light detector of an optical sensor to be adjusted; and one or more processors; where the one or more processors are configured to execute program instructions to operate the light engine to produce a predetermined light pattern detectable by the light detector of the optical sensor to be adjusted; where the predetermined signal pattern comprises the adjustment information; and where the adjustment information configures said light detector that receives said predetermined signal pattern carrying the adjustment information. Other aspects are disclosed.

Abstract: One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.

Abstract: One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.

Abstract: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

Abstract: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

Abstract: Synthesizers are provided to generate synthesizer signals in response to primary digital signal representations that are created by a signal generator. In an important feature, the synthesizers further include a signal corrector that inserts correction digital signal representations to at least partially cancel a corresponding spurious component in the primary digital signal representation and thereby provide synthesizer signals with reduced spurious content.

Abstract: A novel capacitive sensor assembly that utilizes a flex circuit for amplification of capacitively sensed signals and for separating the power, ground, and measurement signals is presented. The use of a flex circuit in the capacitive probe assembly allows implementation of multiple capacitive sensors for respectively capacitively coupling multiple signals from respective multiple test points of a circuit under test. The invention integrates the sensor plate, amplifier, and return wiring for each capacitive sensor all onto one flex circuit.

Abstract: A novel technique for transferring power, measurement signals, and communication signals between two electrical devices over a single wire pair is presented. A host device supplies power to a sensor device over the wire pair. The sensor device obtains A/C signals by modulating the current component of the power signal on the wire pair. The host device de-modulates the current component of the power signal on the wire pair to recover the A/C measurement signals. The sensor device generates a serial bit stream containing sensor communication signals, and modulates it with either the voltage-or current-component of the power signal present on the wire pair. The host device appropriately de-modulates the power signal to recover the serial bit stream containing the sensor communication signals.

Abstract: A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly (106) and a tester electronics assembly (108). The adapter assembly (106) includes two probe plates (200, 202), which hold a probe field (116). The two probe plates (200, 202) include a plurality of holes (208) extending through each probe plate (116). Each hole (208) includes a flange area (206) for accommodating deflection of the probes (204), inserted in the holes (208) extending through the probe plates (200, 202). The flange area (206) and the use of flexible probes (204) facilitate a deflection and an offset (210) of the probes (204) in the probe plates (200, 202). A tester assembly (300) includes a plurality of wear pads (308) on the topside of a printed circuit board (302). The wear pads (308) positioned to engage the bottom end of the probes (204).

Abstract: Disclosed is a novel technique for transferring power, measurement signals, and communication signals between two electrical devices over a single wire pair. A host device supplies power to a sensor device over the wire pair. The sensor device obtains a/c measurement signals. The sensor device transmits the a/c measurement signals by modulating the current component of the power signal on the wire pair. The host device de-modulates the current component of the power signal on the wire pair to recover the a/c measurement signals. The sensor device generates a serial bit stream containing sensor communication signals, and modulates it with either the voltage- or current-component of the power signal present on the wire pair. The host device appropriately de-modulates the power signal to recover the serial bit stream containing the sensor communication signals. The host device may also generate a serial bit stream containing host communication signals.

Abstract: Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.

Abstract: A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly (106) and a tester electronics assembly (108). The adapter assembly (106) includes two probe plates (200, 202), which hold a probe field (116). The two probe plates (200, 202) include a plurality of holes (208) extending through each probe plate (116). Each hole (208) includes a flange area (206) for accommodating deflection of the probes (204), inserted in the holes (208) extending through the probe plates (200, 202). The flange area (206) and the use of flexible probes (204) facilitate a deflection and an offset (210) of the probes (204) in the probe plates (200, 202). A tester assembly (300) includes a plurality of wear pads (308) on the topside of a printed circuit board (302). The wear pads (308) positioned to engage the bottom end of the probes (204).

Abstract: A method and apparatus are disclosed for enabling reconfiguration of a test system. The test system includes an adapter assembly and a tester electronics assembly. The adapter assembly includes two probe plates, which hold a probe field. The two probe plates include a plurality of holes extending through each probe plate. Each hole includes a flange area for accommodating deflection of the probes, inserted in the holes extending through the probe plates. The flange area and the use of flexible probes facilitate a deflection and an offset of the probes in the probe plates. A tester assembly includes a plurality of wear pads on the topside of a printed circuit board. The wear pads positioned to engage the bottom end of the probes. Configurable logic elements located on the underside of the printed circuit board are used to generating and receive test-signals, depending on where the probes make contact with the wear pads on the printed circuit board.

Abstract: Feedback methods and systems are provided to achieve rapid switching of oscillator frequencies without compromising operational feedback loop bandwidths that filter out spurious tones and phase noise to thereby enhance loop spectral and noise performance. The methods respond to frequency changes in a reference signal by providing an open-loop drive current to drive a feedback signal towards the reference signal. The drive current is terminated and the feedback control loop closed when the feedback signal is within a predetermined acquisition range of the reference signal. Preferably, the closed loop is initially configured with a first feedback bandwidth and is subsequently reconfigured with a second steady-state feedback bandwidth that is less than the first feedback bandwidth.

Abstract: Feedback control loop systems are provided that enhance output-signal switching times without degrading other loop performance parameters. The systems reduce “kick-back” voltages that are generated in a loop filter by drive currents which rapidly drive a control loop oscillator to a loop acquisition range. This reduction reduces a frequency step in the oscillator output signal which would otherwise have to be driven to eliminate the frequency step with a consequent increase in the output-signal switching time. Structures are provided that reduce the kick-back voltage to thereby enhance output-signal switching times.

Abstract: The present disclosure relates to a method and apparatus for determining the electrical continuity of an element of an electrical component, for example, a pin of a printed circuit assembly. The method comprises the steps of supplying an electrical stimulus to the element of the electrical component, positioning a sensor adjacent the element of the electrical component, the sensor having multiple axes along which the sensor is responsive to magnetic fields, receiving magnetic field signals created by the element of the electrical component with the sensor, producing electrical signals indicative of the magnetic field strength sensed by the sensor in multiple directions that correspond to the multiple axes, and comparing the electrical signals with predetermined limits associated with the element being tested. In a preferred arrangement, the sensor is provided with three axes which are oriented in orthogonal directions such that the magnetic signals from the element can be detected in three dimensional space.

Abstract: Feedback methods and systems are provided to achieve rapid switching of oscillator frequencies without compromising operational feedback loop bandwidths that filter out spurious tones and phase noise to thereby enhance loop spectral and noise performance. The methods respond to frequency changes in a reference signal by providing an open-loop drive current to drive a feedback signal towards the reference signal. The drive current is terminated and the feedback control loop closed when the feedback signal is within a predetermined acquisition range of the reference signal. This is determined by successively comparing a feedback frequency of the feedback signal to a destination frequency of the reference signal over a comparison window of time. The invention also provides a feedback control system that practices the invention's methods.

Abstract: An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.

Abstract: An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.