Patents by Inventor Donald J. Parker
Donald J. Parker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090324054Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: ApplicationFiled: June 22, 2009Publication date: December 31, 2009Inventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Publication number: 20080133160Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: ApplicationFiled: October 31, 2007Publication date: June 5, 2008Inventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Patent number: 6930309Abstract: One embodiment disclosed relates to a method of electron beam inspection or review of a substrate having insulating materials therein. An area of the substrate is simultaneously exposed to a lower-energy electron beam and an overlapping higher-energy electron beam. The area is subsequently inspected with another electron beam. Another embodiment disclosed relates to an electron beam tool for examination of a substrate having insulating materials therein. A first cathode is configured as an electron source for a lower-energy electron beam, and a second cathode is configured as an electron source for a higher-energy electron beam. At least one electron lens is configured to focus the lower-energy electron beam and the higher-energy electron beam onto an overlapping area of a substrate. An electron beam column is subsequently used to examine the substrate.Type: GrantFiled: March 26, 2004Date of Patent: August 16, 2005Assignee: KLA-Tencor Technologies CorporationInventors: Marian Mankos, Donald J. Parker
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Publication number: 20040096094Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: ApplicationFiled: November 13, 2003Publication date: May 20, 2004Applicant: KLA-TENCOR CORPORATIONInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Patent number: 6731787Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: GrantFiled: April 30, 2002Date of Patent: May 4, 2004Assignee: KLA-Tencor CorporationInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Publication number: 20030138138Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: ApplicationFiled: January 13, 2003Publication date: July 24, 2003Applicant: KLA-TENCOR CORPORATIONInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Publication number: 20020126888Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: ApplicationFiled: February 11, 2002Publication date: September 12, 2002Applicant: KLA-TENCOR CORPORATIONInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Patent number: 6381358Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: GrantFiled: April 27, 2000Date of Patent: April 30, 2002Assignee: KLA-Tencor CorporationInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley
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Patent number: 6076465Abstract: A method and software program for determining printability of a defect on a reticle or photomask onto a substrate during processing. That is performed by creating a pixel grid image having a plurality of individual pixel images showing the defect. A gray scale value is assigned to each pixel image of the pixel grid image and a probable center pixel of the defect is selected. Then the polarity of the defect is determined, with a coarse center pixel of the defect optionally selected using the probable center defect and polarity of the defect. If a coarse center pixel is selected, then a fine center of the defect can optionally be selected from the coarse center pixel and polarity of the defect. From the center pixel the physical extent of the defect can be determined followed by the determination the transmissivity energy level of the physical extent of the defect.Type: GrantFiled: September 19, 1997Date of Patent: June 20, 2000Assignee: KLA-Tencor CorporationInventors: Anthony Vacca, Thomas Vavul, Donald J. Parker, Zain Saidin, Sterling G. Watson, James N. Wiley