Abstract: Methods, systems, and devices for limiting regulator overshoot during power up are described. In some examples, a memory device may generate a first voltage at a first input node of an amplifier of a memory device based on an application, by an external supply, of a second voltage to a terminal of the memory device. The memory device may generate a third voltage at a second node of the amplifier at an amplifier at an offset to the first voltage, where the second node is coupled with a first gate of a first cascode transistor and a second gate of a second cascode transistor. The memory device may activate the amplifier based on generating the third voltage at the second node of the amplifier.

Abstract: Apparatus and methods that have a semiconductor charge pump can be implemented in a variety of applications. Such a charge pump can have a charge pump unit core that includes a pump section and a single passgate coupled to the pump section to transfer charge, where the single passgate is a n-channel metal-oxide semiconductor (NMOS) transistor coupled directly to an input and an output of the charge pump unit core. The transfer of charge can be based on a set of clock signals. Additional apparatus, systems, and methods are disclosed.

Abstract: A multi-mode voltage pump may be configured to select an operational mode based on a temperature of a semiconductor device. The selected mode for a range of temperature values may be determined based on process variations and operational differences caused by temperature changes. The different selected modes of operation of the multi-mode voltage pump may provide pumped voltage having different voltage magnitudes. For example, the multi-mode voltage pump may operate in a first mode that uses two stages to provide a first VPP voltage, a second mode that uses a single stage to provide a second VPP voltage, or a third mode that uses a mixture of a single stage and two stages to provide a third VPP voltage. The third VPP voltage may be between the first and second VPP voltages, with the first VPP voltage having the greatest magnitude. Control signal timing of circuitry of the multi-mode voltage pump may be based on an oscillator signal.

Abstract: Methods, systems, and devices for operating an amplifier with a controllable pull-down capability are described. A memory device may include a memory array and a power circuit that generates an internal signal for components in the memory array. The power circuit may include an amplifier and a power transistor that is coupled with the amplifier. A pull-down capability of the amplifier may be controllable using an external signal that is based on a difference between a reference signal and the internal signal. The power circuit may also include a comparator that is coupled with the amplifier and configured to compare the reference signal and the internal signal. Components of the comparator may be integrated with components of the amplifier, may share a bias circuit, and may use nodes within the amplifier to control the comparator. A signal output by the comparator may control the pull-down capability of the amplifier.

Abstract: Systems and devices are provided for tracking pullup current generated by power amplifiers regardless of variations in PVT conditions. An apparatus may include one or more power amplifiers that powers components of the apparatus, a tracking circuit, and a pulse generation circuit. The tracking circuit may include an amplifier. Further, the tracking circuit may include pullup current tracking circuitry that is coupled to the amplifier and generates a first current that tracks pullup current generated by the one or more power amplifiers. Furthermore, the pulse generation circuit may include pullup current generator circuitry that generates a second current that mirrors the first current. In addition, the pulse generation circuit may also include pulse generator circuitry that is coupled to the pullup current generator circuitry and that generates a pulse to control operation of the one or more power amplifiers based at least in part on the second current.

Abstract: Methods, systems, and devices for limiting regulator overshoot during power up are described. In some examples, a memory device may generate a first voltage at a first input node of an amplifier of a memory device based on an application, by an external supply, of a second voltage to a terminal of the memory device. The memory device may generate a third voltage at a second node of the amplifier at an amplifier at an offset to the first voltage, where the second node is coupled with a first gate of a first cascode transistor and a second gate of a second cascode transistor. The memory device may activate the amplifier based on generating the third voltage at the second node of the amplifier.

Abstract: Apparatuses, systems, and methods for refresh modes. A memory may need to perform targeted refresh operations to refresh the ‘victim’ word lines which are near to frequently accessed ‘aggressor’ word lines. To refresh the victims at a high enough rate, it may be desirable to refresh multiple victims as part of the same refresh operation. However, certain word lines (e.g., word lines in a same section or adjacent sections of the memory) cannot be refreshed together. The memory may have a section comparator, which may check stored aggressor addresses and may provide a signal if there are not two stored addresses which can be refreshed together. Based, in part, on the signal, the memory may activate one of several different refresh modes, which may control the types of refresh operation performed responsive to a refresh signal.

Abstract: Counters may be provided for individual word lines of a memory for tracking word line accesses. In some examples, multiple counters may be provided for individual word lines. In some examples, the counters may be included on the word lines. The counters may be incremented responsive to word line accesses in some examples. In some examples, the counters may be incremented responsive for a time period for which a word line is held open. In some examples, the counters may be incremented responsive to both word line accesses and time periods for which the word line is held open. In some examples, count values for the counters may be written back to the counters after incrementing. In some examples, the count values may be written back prior to receiving a precharge command.

Abstract: Methods, systems, and devices for timing signal delay for a memory device are described. In some memory devices, operations for accessing memory cells may be performed with timing that is asynchronous relative to an input signal. To support asynchronous timing, a memory device may include delay components that support generating a timing signal having aspects that are delayed relative to an input signal. A memory device may include delay components having a configurable impedance based at least in part on one or more fabrication characteristics of the memory device, one or more operating conditions of the memory device, one or more bias voltages, or a combination thereof.

Abstract: Methods, systems, and devices for voltage drop mitigation techniques for memory devices are described. A memory device may include an array of memory cells, a conductive line, a pull-up circuit, and an output circuit. The conductive line may be configured to convey a first voltage for performing an operation with the array of memory cells. The pull-up circuit may be configured to couple the conductive line with a voltage source during at least a portion of a duration in which the operation is performed based on a first signal that enables applying a current to the array of memory cells as part of the operation. The output circuit may be configured to output a second signal to deactivate the pull-up circuit before the operation is complete. Outputting the second signal may be based on the first signal and a difference between the first voltage and a reference voltage.

Abstract: Methods, systems, and devices for timing signal delay for a memory device are described. In some memory devices, operations for accessing memory cells may be performed with timing that is asynchronous relative to an input signal. To support asynchronous timing, a memory device may include delay components that support generating a timing signal having aspects that are delayed relative to an input signal. A memory device may include delay components having a configurable impedance based at least in part on one or more fabrication characteristics of the memory device, one or more operating conditions of the memory device, one or more bias voltages, or a combination thereof.

Abstract: This invention relates to a rubber compound for tire treads, comprising: 30 to 70 parts by weight per hundred parts by weight rubber (phr) of a cyclopentene ring-opening rubber having a Tg of ?120° C. to ?80° C. and a ratio of cis to trans of 5:95 to 40:60; and 20 phr to 60 phr of a high vinyl polybutadiene rubber.

Abstract: Various embodiments of a monolithic avalanche photodiode (APD) are described, which may be fabricated on a silicon-on-insulator substrate. The monolithic APD includes an optical waveguide that guides an incident light to an active region of the APD. An optical coupler is integrally formed with the optical waveguide to capture the incident light. The monolithic APD also includes an optical reflector to reflect a portion of the incident light that is not readily captured by the optical coupler back to the optical coupler for further capturing. The active region includes an absorption layer for converting the incident light into a photocurrent, an epitaxial structure for amplifying the photocurrent by avalanche multiplication, as well as a pair of electrical conductors for conducting the amplified photocurrent.

Abstract: Methods, systems, and devices for voltage drop mitigation techniques for memory devices are described. A memory device may include an array of memory cells, a conductive line, a pull-up circuit, and an output circuit. The conductive line may be configured to convey a first voltage for performing an operation with the array of memory cells. The pull-up circuit may be configured to couple the conductive line with a voltage source during at least a portion of a duration in which the operation is performed based on a first signal that enables applying a current to the array of memory cells as part of the operation. The output circuit may be configured to output a second signal to deactivate the pull-up circuit before the operation is complete. Outputting the second signal may be based on the first signal and a difference between the first voltage and a reference voltage.

Abstract: Devices and methods include distributing biases for input buffers of a memory device. The devices include multiple input buffers configured to buffer data for storage in the multiple memory banks. The devices also include biasing generation and distribution circuitry configured to generate and distribute biases to the multiple input buffers. The biasing generation and distribution circuitry includes bias voltage generation circuitry and multiple remote resistor stacks each located at a corresponding input buffer of the input buffers and remote from the bias voltage generation circuitry.

Abstract: An image processing device including a memory; and at least one image signal processor configured to: generate, using a first neural network, a feature value indicating whether to correct a global pixel value sensed during a unit frame interval, and generate a feature signal including the feature value; generate an image signal by merging the global pixel value with the feature signal; split a pixel value included in the image signal into a first sub-pixel value and a second sub-pixel value, split a frame feature signal included in the image signal into a first sub-feature value corresponding to the first sub-pixel value and a second sub-feature value corresponding to the second sub-pixel value, and generate a first sub-image signal including the first sub-pixel value and the first sub-feature value, and a second sub-image signal including the second sub-pixel value and the second sub-feature value; and sequentially correct the first sub-image signal and the second sub-image signal using a second neural netwo

Abstract: Systems and methods are provided that sense a state of a fuse located in a fuse array. These methods involve a logic gate that selectively transmits outputs from respective comparators based on the combination of outputs received at the logic gate. The comparators generate outputs based on comparing a signal received indicative of the fuse state and a reference voltage. The described systems and methods reduce power consumption of a fuse sensing device since portions of the fuse sensing device are deactivated when not sensing and enable single fuse reading to occur, among other advantages.

Abstract: Methods, systems, and devices for timing signal delay compensation in a memory device are described. In some memory devices, operations for accessing memory cells may be performed with timing that is asynchronous relative to an input signal. To support asynchronous timing, a memory device may include delay components that support generating a timing signal having aspects that are delayed relative to an input signal. In accordance with examples as disclosed herein, a memory device may include delay components having a variable and configurable impedance, where the configurable impedance may be based at least in part on a configuration signal generated at the memory device. A configuration signal may be generated based on fabrication characteristics of the memory device, or based on operating conditions of the memory device, or various combinations thereof.

Abstract: Methods, systems, and devices for compensating for kickback noise are described. A regulator may include an input circuit, a bias circuit, and an enable circuit. The regulator may be configured so that the enable circuit is positioned between the input circuit and the bias circuit. A balance resistor may be included in a path between an input of the regulator and a gate of a bias transistor included in the bias transistor. A size of the balance resistor may be based on an amount of charge drawn by the bias transistor during an activation event. Dimensions of the bias transistor may be modified based on an amount of charge drawn by the bias transistor during an activation event.

Abstract: Apparatuses, systems, and methods for refresh modes. A memory may need to perform targeted refresh operations to refresh the ‘victim’ word lines which are near to frequently accessed ‘aggressor’ word lines. To refresh the victims at a high enough rate, it may be desirable to refresh multiple victims as part of the same refresh operation. However, certain word lines (e.g., word lines in a same section or adjacent sections of the memory) cannot be refreshed together. The memory may have a section comparator, which may check stored aggressor addresses and may provide a signal if there are not two stored addresses which can be refreshed together. Based, in part, on the signal, the memory may activate one of several different refresh modes, which may control the types of refresh operation performed responsive to a refresh signal.