Abstract: A method for fabricating caterpillar trenches for wafer dicing includes forming at least one opening within a mask formed on a substrate to protect an electronics device disposed on the substrate during isotropic etching, and isotropically etching through the at least one opening to form at least one wafer dicing channel, including laterally etching a collection of nested trenches including trenches each having a non-circular cross-section from a first surface of the substrate to a second surface of the substrate opposite the first surface.

Abstract: A resistive processing unit cell includes a weight storage device to store a weight value of the resistive processing unit cell, and multiple circuit blocks. Each circuit block includes a weight update circuit coupled to dedicated update control lines, and a weight read circuit coupled to dedicated read control lines. The circuit blocks are configured to operate in parallel to (i) perform separate weight read operations in which each read circuit generates a read current based on a stored weight value, and outputs the read current on the dedicated read control lines of the read circuit, and (ii) perform separate weight update operations in which each update circuit receives respective update control signals on the dedicated update control lines, generates update currents based on the respective update control signals, and applies the update current to the weight storage device to adjust the weight value based on the update current.

Abstract: A cognitive learning device includes inputs with each including an input path having a transistor device having a storage capacity. A circuit is responsive to the inputs and selects an input set in accordance with a current task, wherein the input set selected modifies a characteristic of the transistor device of one or more corresponding input paths to bias the input set for selection for subsequent accesses.

Abstract: A liquid cooled semiconductor package and method for forming a liquid cooled semiconductor package is described. The device includes at least one semiconductor device mounted on a substrate. An impermeable housing is disposed on the substrate with an internal cavity. A liquid coolant is within the internal cavity such that the coolant immerses at least one semiconductor device.

Abstract: An integrated circuit includes pads formed on a back end of the line surface, and decoupling capacitor stacks monolithically formed about the pads. Solder balls are formed on the pads and connect to metal layers within the decoupling capacitor stacks to reduce noise and voltage spikes between the solder balls.

Abstract: Embodiments of the present invention provide methods for fabricating a semiconductor device with buried local interconnects. One method may include providing a semiconductor substrate with fins etched into the semiconductor substrate; forming a first set of spacers along the sides of the fins; depositing a tungsten film over the top surface of the substrate; etching the tungsten film to form a buried local interconnect; forming a set of gates and a second set of spacers; forming a source and drain region adjacent to the fins; depositing a first insulating material over the top surface of the substrate; and creating contact between the set of gates and the source and drain region using an upper buried local interconnect.

Abstract: A computer-implemented real-time visualization method, system, and computer program product including determining a current sentiment and a current state of a user from user data, creating at least one layer including at least one of an image and an animation based on at least one of an aggregation and a combination of the current sentiment and the current state of the user, and compiling the at least one layer into a single image or a single animation for display on an image display medium.

Abstract: A computer-implemented method, the method comprising: in an initial setup of weights for a floating gate including rows, columns, and a separate input line: comparing a current weight to a desired weight; performing a feedback to the input line to set a voltage to change the floating gate field effect transistor (FET) threshold voltage (VT) and the current weight; and checking that the current weight is within a predetermined tolerance of the desired weight; and performing a stochastic pulse update on the floating gate based on the checking.

Abstract: A method for fabricating a semiconductor device including a vertically oriented memory structure includes forming at least one pillar including phase-change memory (PCM) material on at least one electrode, forming a plurality of spacers on the electrode and along sidewalls of the pillar, and forming, by processing the plurality of spacers and the pillar, a modified pillar having a vertically oriented dumbbell shape associated with a vertically oriented PCM memory structure.

Abstract: Embodiments of the invention include a method for fabricating a semiconductor device, the resulting structure, and a method for using the resulting structure. A substrate is provided. A hard mask layer is patterned over at least a portion of the substrate. Regions of the substrate not protected by the hard mask are doped to form a source region and a drain region. The hard mask layer is removed. A dielectric layer is deposited on the substrate. An insulative layer is deposited on the dielectric layer. A nano-channel is created by etching a portion of the insulative layer which passes over the source region and the drain region.

Abstract: A vertical injection punchthrough based metal oxide semiconductor (VIPMOS) device and method of manufacturing the same, include a control gate, an erase gate, a floating gate, and an active area where the control gate, the erase gate, and the floating gate are coplanar and perpendicular to the active area.

Abstract: A method for determining the authenticity of a trackable item is provided. The method includes maintaining a database including first scan history data associated with a given integrated circuit associated with a given item. Second scan history data associated with the given integrated circuit is received. An authenticity of the given item is determined based on a comparison of the first scan history data to the second scan history data.

Abstract: A method of fabricating a semiconductor device includes depositing a first hard mask layer on a recessed gate stack arranged between gate spacers. The method further includes depositing a second hard mask layer on the first hard mask layer between the gate spacers.

Abstract: A method for manufacturing a semiconductor device includes forming a plurality of transistors on a semiconductor substrate. The formation of the plurality of transistors includes recessing channels of at least two transistors of the plurality of transistors. In the method, a stacked capacitor is formed on the semiconductor substrate, and the stacked capacitor is electrically connected in parallel to the at least two transistors of the plurality of transistors comprising the recessed channels and to an additional one of the plurality of transistors. The stacked capacitor, the at least two transistors and the additional one of the plurality of transistors form a memory cell of a plurality of memory cells of a memory device.

Abstract: Embodiments of the invention are directed to a method of fabricating a semiconductor device. A non-limiting example of the method includes forming a fin over a substrate. The fin includes an upper fin region and a lower fin region. The lower fin region is physically coupled to the upper fin region and the substrate. A portion of the fin is removed to form a fin tunnel configured to physically separate the upper fin region from the lower fin region. A gate structure is formed and configured to fill the fin tunnel and cover a top surface, a bottom surface, a first sidewall, and a second sidewall of the upper fin region.

Abstract: A method for forming a thin film lithium ion battery includes, under a same vacuum seal, forming a stack of layers on a substrate including an anode layer, an electrolyte, a cathode layer and a first cap over the stack of layers to protect the layers from air. Under a same vacuum seal, the stack of layers is etched with a non-reactive etch process in accordance with a hardmask, and a second cap layer is formed over the stack of layers without breaking the vacuum seal. Contacts coupled to the cathode and the anode are formed.

Abstract: A method for forming active regions of a semiconductor device comprising forming a nanosheet stack on a substrate, forming the nanosheet stack comprising forming a sacrificial nanosheet layer on the substrate, and forming a nanosheet layer on the sacrificial nanosheet layer, forming an etch stop layer on the nanosheet stack, forming a mandrel layer on the etch stop layer, removing portions of the mandrel layer to form a mandrel on the etch stop layer, forming sidewalls adjacent to sidewalls of the mandrel, depositing a fill layer on exposed portions of the etch stop layer, removing the sidewalls and removing exposed portions of the etch stop layer and the nanosheet stack to expose portions of the substrate.

Abstract: An advanced security method for verifying that integrated circuit patterns being processed into one or more layers provided to a wafer are trusted patterns and that the wafer being used during processing is a trusted wafer is provided. The method includes separate steps of pattern verification and wafer verification. Notably, the method includes first verifying that a pattern printed on a wafer matches a pattern of a trusted reference. Next, a peak and valley profile present at a specific location on a backside surface of the wafer is measured. The method further includes second verify that the measured peak and valley profile matches an original peak and valley profile measured at the same location on the backside surface of the wafer.

Abstract: A semiconductor structure includes a free-floating silicon-bridge chip electrically joined on a top portion to two or more semiconductor chips and electrically joined on a bottom portion to a substrate structure that includes a plurality of metal interconnect structures and a plurality of metal layers disposed on an interlevel dielectric. The silicon bridge chip is aligned with and extends into a recess located in a region of the substrate structure away from the plurality of metal interconnect structures and the plurality of metal layers such that a top surface of the silicon bridge chip is substantially flush with a top surface of the substrate structure.

Abstract: A method of forming a self-forming spacer using oxidation. The self-forming spacer may include forming a fin field effect transistor on a substrate, the fin field effect transistor includes a gate on a fin, the gate is perpendicular to the fin; forming a gate spacer on the gate and a fin spacer on the fin, the gate spacer and the fin spacer are formed in a single step by oxidizing an exposed surface of the gate and an exposed surface of the fin; and removing the fin spacer from the fin.