Abstract: The present disclosure is generally related to modified filamentous fungal strains (cells) comprising enhanced protein productivity phenotypes, wherein such modified strains are particularly well-suited for growth in submerged cultures (e.g., large-scale production of proteins for industrial/commercial applications). Thus, certain embodiments of the disclosure are related to such variant (modified) strains of filamentous fungus derived (obtained) from parental strains comprising a gene encoding a native GEF1 protein, wherein the variant strain comprises a genetic modification which disrupts or deletes a gene encoding a native GEF1 protein, wherein the variant strain comprises an increased protein productivity phenotype (i.e., relative to the parental strain) when grown/cultivated/fermented under the same conditions.

Abstract: Methods of manufacturing and processing semiconductor devices (i.e., electronic devices) are described. The methods include treating a surface of a metal gate stack with a radical treatment. The radical treatment may be used to treat one or more layers or surfaces of layers in the metal gate stack. The radical treatment may be performed once or multiple times during the methods described herein. The radical treatment comprises flowing one or more of nitrogen radicals (N2*) and hydrogen radicals (H*) over the surface of the metal gate stack.

Abstract: A testing system for analyzing a 3D digital volume of a material sample. The testing system defines several test volume sizes with each test volume size including a different numbers of voxels, defining the size of portions of the 3D digital volume to analyze. For each test volume size, the testing system acquires two adjacent portions of 3D digital volume at the test volume size currently being analyzed. The testing system calculates a material property value for the two adjacent portions of the 3D digital volume, and a difference value between the two adjacent portions of the 3D digital volume. The process is repeated over the different test volume sizes. The testing system calculates mean difference values for the different test volume sizes, from which it determines a representative elementary volume.

Abstract: A testing system for analyzing a 3D digital volume of a material sample. The testing system defines several test volume sizes with each test volume size including a different numbers of voxels, defining the size of portions of the 3D digital volume to analyze. For each test volume size, the testing system acquires two adjacent portions of 3D digital volume at the test volume size currently being analyzed. The testing system calculates a material property value for the two adjacent portions of the 3D digital volume, and a difference value between the two adjacent portions of the 3D digital volume. The process is repeated over the different test volume sizes. The testing system calculates mean difference values for the different test volume sizes, from which it determines a representative elementary volume.

Abstract: A testing system can analyze a 3D digital volume of a material sample. The testing system can define several test volumes with each test volume including a different numbers of voxels. The test volumes can define the size of portions of the 3D digital volume to analyze. For each test volume, the testing system can acquire two adjacent portions of 3D digital volume that are the size of the test volume currently being analyzed. The testing system can calculate a petrophysical property value for the two adjacent portions of the 3D digital volume and can calculate the difference value between the two adjacent portions of the 3D digital volume. The testing system can repeat the process for the different test volumes. The testing system can plot the mean difference values for the different test volumes. The testing system can analyze the plot to determine a representative elementary volume that meets a predefined difference value.