Patents by Inventor Elsworth Stearns

Elsworth Stearns has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and on-chip apparatus for continuity testing
    Patent number: 4894605
    Abstract: A method of performing continuity testing of individual lead sets bonded to an integrated semiconductor component with a continuity test circuit fabricated on the component. The continuity test circuit includes a plurality of current gates, each of which is associated with a different semiconductor component contact pad a lead set is bonded to. Each current gate includes a first terminal connected to the associated contact pad and a second terminal connected to a common conductor all the current gate second terminals are connected to. The common conductor terminates at a semiconductor component contact test pad a lead set is bonded to. Whenever a test signal is applied to either the first or second terminal of a current gate, a measurable response signal is generated by the current gate over the other terminal.
    Type: Grant
    Filed: February 24, 1988
    Date of Patent: January 16, 1990
    Assignee: Digital Equipment Corporation
    Inventors: Diethelm Ringleb, Reinhard Schumann, Elsworth Stearns, Tom Stylianos, Jr., John Sweeney