Abstract: A method of method of forming a wide band-gap semiconductor transient voltage suppressor (TVS) assembly and a system for a transient voltage suppressor (TVS) assembly are provided. The TVS assembly includes a connecting component configured to electrically couple a first electrical component to a second electrical component located remotely from the first electrical component through one or more electrical conduits and a transient voltage suppressor device positioned within the connecting component and electrically coupled to the one or more electrical conduits wherein the TVS device includes a wide band-gap semiconductor material.

Abstract: A method of forming a silicon carbide transient voltage suppressor (TVS) assembly and a system for a transient voltage suppressor (TVS) assembly are provided. The transient voltage suppressor (TVS) assembly includes a semiconductor die including a contact surface on a single side of the die, the die further including a substrate comprising a layer of at least one of an electrical insulator material, a semi-insulating material, and a first wide band gap semiconductor having a conductivity of a first polarity, at least a TVS device including a plurality of wide band gap semiconductor layers formed on the substrate; a first electrode coupled in electrical contact with the TVS device and extending to the contact surface, and a second electrode electrically coupled to the substrate extending to the contact surface.

Abstract: A method includes providing a substrate with at least one semiconducting layer. The method also includes forming a plurality of isolation barriers within the at least one semiconducting layer, thereby forming a plurality of device islands. The method further includes inserting a plurality of electronic devices into a portion of the at least one semiconducting layer such that each electronic device is substantially isolated from each other electronic device by the device islands.

Abstract: A sensor system for measuring a clearance parameter between a stationary component and a rotating component of a rotating machine is provided. The system includes a clearance sensor to output a clearance measurement signal. A sensor memory is attached to the sensor for storing a first sensor information. A second sensor information is stored in a electronics interface memory. The first and the second sensor information are read and the clearance sensor is matched with a respective plurality of calibration data by an electronic interface based on the first and the second sensor information.

Abstract: A method of forming a silicon carbide transient voltage suppressor (TVS) assembly and a system for a transient voltage suppressor (TVS) assembly are provided. The TVS assembly includes a semiconductor die in a mesa structure that includes a first layer of a first wide band gap semiconductor having a conductivity of a first polarity, a second layer of the first or a second wide band gap semiconductor having a conductivity of a second polarity coupled in electrical contact with the first layer wherein the second polarity is different than the first polarity. The TVS assembly also includes a third layer of the first, the second, or a third wide band gap semiconductor having a conductivity of the first polarity coupled in electrical contact with the second layer. The layer having a conductivity of the second polarity is lightly doped relative to the layers having a conductivity of the first polarity.

Abstract: A system and method for determining physiological parameters based on electrical impedance measurements is provided. One method includes obtaining electrical measurement signals acquired from a plurality of transducers coupled to a surface of an object and spatially pre-conditioning the obtained electrical measurement signals. The method also includes performing multiple-input-multiple-output (MIMO) analog to information conversion (AIC) of the spatially pre-conditioned electrical measurement signals to correlate the spatially pre-conditioned electrical measurement signals to separate the electrical measurement signals.

Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. A reduction in a cross-sectional area of the at least one resistive due to wearing out of the shroud results in a change in a resistance of the at least one resistive. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.

Abstract: A method and apparatus for determining axial clearance data between a rotor and a stator are disclosed. At least one radial clearance sensor is positioned on the stator and is configured to gather radial clearance data, i.e., measurements of a radial distance between the rotor and the stator taken at discrete time intervals. A computing device is operably connected with the at least one radial clearance sensor and is configured to use the radial clearance data to determine axial clearance data, i.e., an axial distance between the stator and the rotor. In one embodiment, the computing device uses, among other data points, an indication of a loss of signal from at least one radial clearance sensor to extrapolate the axial clearance data.

Abstract: A method of forming a silicon carbide transient voltage suppressor (TVS) assembly and a system for a transient voltage suppressor (TVS) assembly are provided. The TVS assembly includes a semiconductor die in a mesa structure that includes a first layer of a first wide band gap semiconductor having a conductivity of a first polarity, a second layer of the first or a second wide band gap semiconductor having a conductivity of a second polarity coupled in electrical contact with the first layer wherein the second polarity is different than the first polarity. The TVS assembly also includes a third layer of the first, the second, or a third wide band gap semiconductor having a conductivity of the first polarity coupled in electrical contact with the second layer. The layer having a conductivity of the second polarity is lightly doped relative to the layers having a conductivity of the first polarity.

Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.

Abstract: A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.

Abstract: A system for online relative phase calibration is provided. The system includes at least one excitation source configured to generate multiple excitation signals. The system also includes at least two sensors coupled to respective ones of the at least one excitation source via a transmission line, wherein the two sensors are configured to receive respective ones of the excitation signals. The system further includes at least two phase detectors configured to receive at least two reflected signals from the two sensors via the transmission line, wherein each of the two phase detectors are configured to output a respective voltage representing a phase difference between respective ones of the reflected signals and respective ones of the excitation signals. The system also includes a switch coupled to the sensors and the phase detectors, the switch configured to switch the phase detectors between the sensors at a pre-determined switching interval.

Abstract: A system for monitoring health of an electrical machine is provided. The system includes at least one sensor element embedded in at least one substrate element located in a stator core. The system further includes a measuring subsystem coupled to the at least one sensor element and configured to monitor the health based on changes in electromagnetic characteristics of the sensor element due to changes in force acting on the substrate element or compression of the substrate element.

Abstract: A condition monitoring method for an electrical machine is provided. The method includes providing at least one first sensor element embedded in or disposed on at least one substrate element located in a stator core for obtaining a first set of data. The method also includes providing at least one second sensor element for obtaining a second set of data from the electrical machine. Further, the method includes generating signals indicative of changes in characteristics of the first sensor element based on the second set of data. Finally, the method includes refining the first set of data by combining the first set of data with the generated signals.

Abstract: A high accuracy wireless sensing platform assembly comprising a sensor subassembly that is configured to obtain measurement data from a device in response to a measurand; a data transceiver assembly that is configured to communicate with an antenna assembly; a parameter coder, in communication with the sensor subassembly, that is configured to control the data transceiver assembly and/or the sensor subassembly, based on the measurement data; and a resonant circuit that is formed by the data transceiver, the sensor subassembly, and/or the parameter coder. Embodiments are capable of provide robust performance and high accuracy in harsh (e.g., hot environments). The present invention has been described in terms of specific embodiment(s), and it is recognized that equivalents, alternatives, and modifications, aside from those expressly stated, are possible and within the scope of the appending claims.

Abstract: Self-calibration of a multiple channel clearance sensor system, which in one embodiment includes at least one sensor for measuring at least one clearance parameter signal between a stationary object and a rotating object of a rotating machine. The sensor output is processed as a clearance parameter by an offset correction section configured to determine an offset error in the clearance parameter signal which is used by a level shifter. The level shifter is also switchably coupled to the clearance parameter signal wherein the output of the level shifter, which may be amplified and digitally converted, is processed by a signal level analyzer to determine a channel gain signal.

Abstract: A system and method for measuring a thickness of a refractory wall of a gasifier using electromagnetic energy is disclosed. The system includes a waveguide with a bistatic or monostatic phased array antenna at one end. The waveguide is operably connected to a Network Analyzer that generates a pulse of electromagnetic energy with a desired bandwidth. The pulse is transmitted through a coaxial cable to the waveguide. The reflection of the pulse is received by the waveguide and input to a data acquisition system. An output device displays the resolvable discontinuities in impedance encountered by the pulse in its propagation path in the system.

Abstract: A method and system for monitoring creep in a moving object are provided. The creep monitoring system includes a creep sensor assembly formed onto a surface of an object rotatable about an axis, the creep sensor assembly includes at least one of an image pattern and a radio frequency interrogatable circuit. The creep monitoring system also includes an online monitoring system communicatively coupled to the creep sensor assembly. The online monitoring system configured to collect information from the creep sensor assembly relative to an amount and a rate of creep of the object. The creep monitoring system also includes a processor programmed to receive the information, correct the information for movement of the creep sensor assembly during the collection, and determine a creep rate, a crack presence, and a temperature of the object simultaneously.

Abstract: A method includes providing a substrate with at least one semiconducting layer. The method also includes forming a plurality of isolation barriers within the at least one semiconducting layer, thereby forming a plurality of device islands. The method further includes inserting a plurality of electronic devices into a portion of the at least one semiconducting layer such that each electronic device is substantially isolated from each other electronic device by the device islands.

Abstract: A method of detecting rubs during operation of a turbomachine comprising at least one rotating object having a tip and a shelf is provided. The method includes generating signals representative of a sensed parameter and processing the signals to generate height versus time data for the tip. The height of the tip corresponds to the distance between the tip and the shelf. The method further includes monitoring the height versus time data, in order to determine whether a change in the height data exceeds a threshold value, and detecting a rub of the rotating object(s) on a second object, when the change in the height data exceeds the threshold value. A rub detection system for a turbomachine and a turbine engine system with rub detection are also provided.