Patents by Inventor Eugene H. Ratzlaff
Eugene H. Ratzlaff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7705754Abstract: The present invention relates to a method, computer program product and system for the compression of a probability table and the reconstruction of one or more probability elements using the compressed data and method. After determining a probability table that is to be compressed, the probability table is compressed using a first probability table compression method, wherein the probability table compression method creates a first compressed probability table. The first compressed probability table contains a plurality of probability elements. Further, the probability table is compressed using a second probability table compression method, wherein the probability table compression method creates a second compressed probability table. The second compressed probability table containing a plurality of probability elements.Type: GrantFiled: June 25, 2008Date of Patent: April 27, 2010Assignee: International Business Machines CorporationInventors: Michael P. Perrone, Eugene H. Ratzlaff, Jianying Hu
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Publication number: 20080252499Abstract: The present invention relates to a method, computer program product and system for the compression of a probability table and the reconstruction of one or more probability elements using the compressed data and method. After determining a probability table that is to be compressed, the probability table is compressed using a first probability table compression method, wherein the probability table compression method creates a first compressed probability table. The first compressed probability table contains a plurality of probability elements. Further, the probability table is compressed using a second probability table compression method, wherein the probability table compression method creates a second compressed probability table. The second compressed probability table containing a plurality of probability elements.Type: ApplicationFiled: June 25, 2008Publication date: October 16, 2008Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Michael P. Perrone, Eugene H. Ratzlaff, Jianying Hu
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Patent number: 7400277Abstract: The present invention relates to a method, computer program product and system for the compression of a probability table and the reconstruction of one or more probability elements using the compressed data and method. After determining a probability table that is to be compressed, the probability table is compressed using a first probability table compression method, wherein the probability table compression method creates a first compressed probability table. The first compressed probability table contains a plurality of probability elements. Further, the probability table is compressed using a second probability table compression method, wherein the probability table compression method creates a second compressed probability table. The second compressed probability table containing a plurality of probability elements.Type: GrantFiled: April 6, 2004Date of Patent: July 15, 2008Assignee: International Business Machines CorporationInventors: Michael P. Perrone, Eugene H. Ratzlaff, Jianying Hu
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Patent number: 7260779Abstract: In one aspect of the present invention, page breaks are identified in the following manner. A set of ink data and a document description are processed by a variety of scoring methods, each of which generates a score for each possible insertion point in the ink. These scores are combined to produce a ranked list of hypothesized page breaks for the corresponding ink data. This ranked list is then used either to insert page breaks automatically using a predefined threshold to determine a cut-off in the list; or to present, on-line, to a human for verification/approval; or a mixture of the two based on two thresholds: one for automatic insertion and the other for human verification. It is to be understood not all scoring methods need be used, that is, one or more of the scoring methods may be used as needed.Type: GrantFiled: September 30, 2005Date of Patent: August 21, 2007Assignee: International Business Machines CorporationInventors: Paul Turquand Keyser, Michael Peter Perrone, Eugene H. Ratzlaff, Jayashree Subrahmonia
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Patent number: 6826306Abstract: A system and method for automatically providing quality assurance for user enrollment in a recognition system. Advantageously, the quality a new enrollment (i.e., a newly trained user-dependent prototype) is assessed before the new enrollment is accepted in place of a current enrollment. This quality check is performed by decoding stored user test data using the new enrollment, comparing the decoding results of the new enrollment to the known script used to generate the test data to obtain an accuracy score for the new enrollment, and then comparing the accuracy score for the new enrollment with an accuracy score of a previous qualified enrollment (or, in the case where there is no previous, qualified enrollment, to the accuracy of the speaker independent model). If the decoding results of the new enrollment are acceptable, the new enrollment will be used for recognition; otherwise it will be rejected and discarded.Type: GrantFiled: January 29, 1999Date of Patent: November 30, 2004Assignee: International Business Machines CorporationInventors: James R. Lewis, Julia E. Maners, Kerry A. Ortega, Michael P. Perrone, Eugene H. Ratzlaff, Jayashree Subrahmonia, Ron Van Buskirk, Huifang Wang
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Patent number: 6757647Abstract: Systems and methods are described for concisely encoding into a lexicon (or dictionary) and decoding from the lexicon regular expressions that can represent certain huge word lists that might otherwise be considered unmanageably large. Sets of words (character sequences or ‘strings’) that share certain commonalities such as a set of numbers, which share common digits, may be condensed into digital lexicons by representing the set with a regular expression. The regular expression is a string that includes meta-character, where each meta-character is a place-marker that represents a set of at least two normal characters. When accessing or searching the lexicon, the regular expressions are dynamically expanded, as needed, to the underlying, original word list. The methods disclosed are applicable to many lexicon driven language based systems such as spelling verification systems, handwriting recognition systems, speech recognition systems and the like.Type: GrantFiled: July 30, 1998Date of Patent: June 29, 2004Assignee: International Business Machines CorporationInventors: Krishna S. Nathan, Eugene H. Ratzlaff
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Patent number: 6603881Abstract: Systems and methods for reordering unconstrained handwriting data using both spatial and temporal interrelationships prior to recognition, and for spatially organizing and formatting machine recognized transcription results. The present invention allows a machine recognizer to generate and present a full and accurate transcription of unconstrained handwriting in its correct spatial context such that the transcription output can appear to “mirror” the corresponding handwriting.Type: GrantFiled: October 23, 2001Date of Patent: August 5, 2003Assignee: International Business Machines CorporationInventors: Michael P. Perrone, Eugene H. Ratzlaff
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Publication number: 20020097909Abstract: Systems and methods for reordering unconstrained handwriting data using both spatial and temporal interrelationships prior to recognition, and for spatially organizing and formatting machine recognized transcription results. The present invention allows a machine recognizer to generate and present a full and accurate transcription of unconstrained handwriting in its correct spatial context such that the transcription output can appear to “mirror” the corresponding handwriting.Type: ApplicationFiled: October 23, 2001Publication date: July 25, 2002Inventors: Michael P. Perrone, Eugene H. Ratzlaff
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Patent number: 6401067Abstract: A data recognition system and method which allows a user to select between a “default recognition” mode and a “constrained recognition” mode via a user interface. In the default recognition mode, a recognition engine utilizes predetermined default recognition parameters to decode data (e.g., handwriting and speech). In the constrained recognition mode, the user can select one or more of a plurality of recognition constraints which temporarily modify the default recognition parameters to decode uncharacteristic and/or special data. The recognition parameters associated with the selected constraint enable the recognition engine to utilize specific information to decode the special data, thereby providing increased recognition accuracy.Type: GrantFiled: January 28, 1999Date of Patent: June 4, 2002Assignee: International Business Machines CorporationInventors: James R. Lewis, Michael P. Perrone, John F. Pitrelli, Eugene H. Ratzlaff, Jayashree Subrahmonia
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Patent number: 6333994Abstract: Systems and methods for reordering unconstrained handwriting data using both spatial and temporal interrelationships prior to recognition, and for spatially organizing and formatting machine recognized transcription results. The present invention allows a machine recognizer to generate and present a full and accurate transcription of unconstrained handwriting in its correct spatial context such that the transcription output can appear to “mirror” the corresponding handwriting.Type: GrantFiled: March 31, 1999Date of Patent: December 25, 2001Assignee: International Business Machines CorporationInventors: Michael P. Perrone, Eugene H. Ratzlaff
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Publication number: 20010053978Abstract: A data recognition system and method which allows a user to select between a “default recognition” mode and a “constrained recognition” mode via a user interface. In the default recognition mode, a recognition engine utilizes predetermined default recognition parameters to decode data (e.g., handwriting and speech). In the constrained recognition mode, the user can select one or more of a plurality of recognition constraints which temporarily modify the default recognition parameters to decode uncharacteristic and/or special data. The recognition parameters associated with the selected constraint enable the recognition engine to utilize specific information to decode the special data, thereby providing increased recognition accuracy.Type: ApplicationFiled: January 28, 1999Publication date: December 20, 2001Inventors: JAMES R. LEWIS, MICHAEL P. PERRONE, JOHN F. PITRELLI, EUGENE H. RATZLAFF, JAYASHREE SUBRAHMONIA
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Patent number: 6326957Abstract: System and methods for visually displaying page information in a handwriting recording device such as a personal digital notepad (PDN) device, in which constraints exist which limit the size of a user interface display (e.g. LCD). Various methods allow a user to view detailed page information by selecting one or more available display modes which display the selected information using one or more dynamic icons. In addition, the user can view (via the display) selected portions of handwriting content of a given electronic page, thereby affording the user the opportunity to synchronize the stored handwriting data with the handwritten text.Type: GrantFiled: January 29, 1999Date of Patent: December 4, 2001Assignee: International Business Machines CorporationInventors: Krishna S. Nathan, Michael P. Perrone, John F. Pitrelli, Eugene H. Ratzlaff, Jayashree Subrahmonia
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Patent number: 5582746Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process during etching of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing two conductive electrodes in the wet chemical bath, wherein the two electrodes are proximate to but not in contact with a wafer; monitoring an electrical characteristic between the two electrodes as a function of time in the etchant bath of the at least one wafer, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process; and recording a plurality of values of the electrical characteristic as a function of time during etching. From the plurality of recorded values and corresponding times, instantaneous etch rates, average etch rates, and etching end points may be determined. Such a method and the apparatus therefor are particularly useful in a wet chemical etch station.Type: GrantFiled: June 30, 1994Date of Patent: December 10, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong
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Patent number: 5573623Abstract: A contactless method and apparatus for in-situ chemical etch monitoring of an etching process during etching of a workpiece with a wet chemical etchant are disclosed. The method comprises steps of providing at least two toroidal windings in the wet chemical etchant to be proximate to but not in contact with the workpiece; and monitoring an electrical characteristic between said at least two toroidal windings, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process. Such a method and apparatus are particularly useful in a wet chemical etch station.Type: GrantFiled: September 20, 1995Date of Patent: November 12, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Leping Li, Eugene H. Ratzlaff
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Patent number: 5573624Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process during etching of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing two conductive electrodes in the wet chemical bath, wherein the two electrodes are proximate to but not in contact with a wafer; monitoring an electrical characteristic between the two electrodes as a function of time in the etchant bath of the at least one wafer, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process; detecting a minimum and maximum value of the electrical characteristic during etching; determining the times of the minimum and maximum values; and comparing the times of the minimum and maximum values to determine a film etching uniformity value. Such a method and the apparatus therefor are particularly useful in a wet chemical etch station, and are useful for film deposition process quality control.Type: GrantFiled: June 30, 1994Date of Patent: November 12, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong
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Patent number: 5516399Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process for the etching of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing at least two conductive electrodes in the wet chemical bath, wherein the at least two electrodes are proximate to but not in contact with the at least one wafer, and further wherein said two electrodes are positioned on the same side of the wafer; and monitoring an electrical characteristic between the at least two electrodes, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process. Such a method and apparatus are particularly useful in a wet chemical etch station.Type: GrantFiled: June 30, 1994Date of Patent: May 14, 1996Assignee: International Business Machines CorporationInventors: Michael J. Balconi-Lamica, Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin Wai-chow Wong
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Patent number: 5501766Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process to minimize overetch of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing two conductive electrodes in the wet chemical bath, wherein the two electrodes are proximate to but not in contact with a wafer; monitoring an electrical characteristic between the two electrodes as a function of time in the etchant bath of the at least one wafer, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process; detecting a minimum and maximum value of the electrical characteristic during etching; determining the times of the minimum and maximum values; and comparing the times of the minimum and maximum values to determine an overetch value. The overetch value may be compared to a desired value to control the etching process.Type: GrantFiled: June 30, 1994Date of Patent: March 26, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong
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Patent number: 5500073Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process during etching of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing two conductive electrodes in the wet chemical bath, wherein the two electrodes are proximate to but not in contact with a wafer; monitoring an electrical characteristic between the two electrodes as a function of time in the etchant bath of the at least one wafer, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process; and recording a plurality of values of the electrical characteristic as a function of time during etching. From the plurality of recorded values and corresponding times, instantaneous etch rates, average etch rates, and etching end points may be determined. Such a method and the apparatus therefor are particularly useful in a wet chemical etch station.Type: GrantFiled: May 8, 1995Date of Patent: March 19, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong
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Patent number: 5489361Abstract: A contactless method and apparatus for real-time in-situ monitoring of a chemical etching process during etching of at least one wafer in a wet chemical etchant bath are disclosed. The method comprises the steps of providing two conductive electrodes in the wet chemical bath, wherein the two electrodes are proximate to but not in contact with a wafer; monitoring an electrical characteristic between the two electrodes as a function of time in the etchant bath of the at least one wafer, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process; detecting a minimum and maximum value of the electrical characteristic during etching; determining the times of the minimum and maximum values; and comparing the times of the minimum and maximum values to determine a film etching uniformity value. Such a method and the apparatus therefor are particularly useful in a wet chemical etch station, and are useful for film deposition process quality control.Type: GrantFiled: December 13, 1994Date of Patent: February 6, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Yiping Hsiao, Leping Li, Eugene H. Ratzlaff, Justin W. Wong
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Patent number: 5480511Abstract: A contactless method and apparatus for in-situ chemical etch monitoring of an etching process during etching of a workpiece with a wet chemical etchant are disclosed. The method comprises steps of providing at least two toroidal windings in the wet chemical etchant to be proximate to but not in contact with the workpiece; and monitoring an electrical characteristic between said at least two toroidal windings, wherein a prescribed change in the electrical characteristic is indicative of a prescribed condition of the etching process. Such a method and apparatus are particularly useful in a wet chemical etch station.Type: GrantFiled: June 30, 1994Date of Patent: January 2, 1996Assignee: International Business Machines CorporationInventors: Steven G. Barbee, Tony F. Heinz, Leping Li, Eugene H. Ratzlaff