Abstract: A flip-flop includes non-volatile storage of a bit for encryption purposes or other applications. The non-volatile bit remains in the flip-flop, substantially unaltered, irrespective of normal flip-flop operation, and is available to be recalled whenever it is needed. The flip-flop is implemented using a pair of CMOS cells. Each cell includes a floating gate formed by connecting the gates of an n-mos transistor and a p-mos transistor. One of the two floating gates is selectively charged by hot electron injection, thereby raising the threshold of that cell. Depending upon which of the two cells is programmed by this process, the flip-flop outputs a logic one or a logic zero during a recall mode.

Abstract: The invention comprises an FPGA having a plurality of input reference voltages and/or output voltage supplies. In one embodiment, two or more differential amplifiers in the same configurable input buffer use different input reference voltages. According to a second aspect of the invention, the I/O pad line is configurably connected to the input reference voltage line, so that any configurable Input/Output Block (IOB) can be used to supply the input reference voltage. According to a third aspect of the invention, the reference input of an I/O is configurably connected to any of two or more input reference voltage lines.

Abstract: A method and apparatus for creating and utilizing a database of defective antifuses on a programmable logic device and comparing the list to a catalog of required connections in a design, wherein the process of comparing the two lists will determine whether the device, although flawed, is nonetheless compatible with the design to be implemented, thereby increasing device yield.

Abstract: A method of providing placement information during design entry is described which includes the steps of indicating an element type in an instance, identifying a port list for a specific element in the instance, and providing embedded placement information regarding the specific element in the instance. In one embodiment, the embedded placement information includes a cell location, whereas in another embodiment, the embedded placement information includes a block location. This method eliminates the need for a separate file with placement information, thereby improving user efficiency and significantly minimizing user error.

Abstract: An FPGA combines antifuse and static memory cell programing technologies. Static memory cells determine the functions of the FPGA logic cells. Antifuses establish routing through the interconnect structure. Associated with each logic cell are configuration control units which store configuration information which configures the cell during normal operation. Each configuration control unit includes an SRAM memory cell. For each input terminal of a logic cell an SRAM configuration control unit selects whether an input signal is inverted or not. Other SRAM cells control whether a signal is cascaded into the logic cell from an adjacent cell, whether the cell operates as a combinational element or a latch, and whether the cell performs NOR or NAND functions.

Abstract: A method and system for measuring programmed antifuse resistance in an FPGA without disturbing the antifuse resistance. The method includes estimating a plurality of subparts of the programming path connecting low and high programming voltage sources on the FPGA device, measuring the path as a whole, and subtracting the sum total of the subparts from the whole path measurement, thereby deriving the antifuse resistance. If the derived antifuse resistance is higher than desired, programming and measurement may be repeated to ensure device longevity and accurate timing for implemented designs.

Abstract: A method and structure for verifying interconnect structure of an FPGA device after programming. In a preferred embodiment, after programming, a single wire segment on each net of a layout is pulled down to a low reference voltage. Voltage levels on all wire segments of the device are then captured and shifted out of the device for comparison to the expected values. Low voltage levels on segments expected to remain high reveal short circuit flaws. High voltage levels on segments expected to remain low reveal open circuit flaws. The test is conducted simultaneously on a group of packed nets, wherein each group comprises a number of disjoint nets separated from one another by at least two MicroVia.TM. interconnects. A preferred packing method minimizes the number of net groups on a device for maximum test efficiency.

Abstract: A latch may be formed as a two-part structure, one part for data input and one part for feeding back the data to form the latch. A clock signal controls whether data from a data input terminal will be forwarded to the output or whether the output signal will be provided as input and forwarded, thus forming the latch. A problem called the static ones hazard, namely registering a logical 0 when data input is logical 1, can occur with a latch of this logic structure when the circuit is entering the latch mode. In accordance with the invention, this static ones hazard is avoided by controlling trip points in the gates of the cell and input buffers of the cell so that the cell implements a make-before-break transition.

Abstract: A method and structure for verifying interconnect structure of an FPGA device after programming. In a preferred embodiment, after programming, a single wire segment on each net of a layout is pulled down to a low reference voltage. Voltage levels on all wire segments of the device are then captured and shifted out of the device for comparison to the expected values. Low voltage levels on segments expected to remain high reveal short circuit flaws. High voltage levels on segments expected to remain low reveal open circuit flaws.

Abstract: The logic cell of the current invention is useful in a field programmable logic device, particularly a device in which an interconnect structure is interconnected by antifuses, and logic cells are programmed using pass transistors. All input leads of the logic cell can be selectively inverted. The output signal from one logic cell can be cascaded as input to the adjacent cell for efficiently computing wide functions. An optional feedback path allows the cell to be optionally used for sequential functions without the delay caused by a feedback path through field programmed connections. Configuration units can serve the multiple purposes of selectively applying programming voltages to the interconnect structure, shifting in configuration information for configuring the interconnect structure, and capturing and shifting out states of the interconnect lines. A novel output buffer allows 3-state control from multiple sources.

Abstract: For antifuse programmable integrated circuit devices, in particular FPGA devices, the invention allows for alternative routing around antifuses which fail to program. The chip architecture includes wiring segments and antifuses which together allow for alternative routes around every antifuse in the event of failure of that antifuse. The method includes programming the device under control of a computer which can recalculate routes in the event of an antifuse which fails to program. Preferably the initial routing distributes unused wiring segments through the chip to be available for routing around a failed antifuse. When a failure occurs, the method includes determining an alternative route around every failed antifuse. The alternative route may be established directly after the antifuse has failed or after all initially selected antifuses have been programmed.

Abstract: A low power optional inverter uses P-channel and N-channel transistors in series as in a conventional CMOS inverter, but in one embodiment connects complementary signals to the sources of the P-channel and N-channel transistors such that when the complementary signals are switched the circuit switches between an inverting and a non-inverting buffer. In some embodiments P-channel and/or N-channel pass transistors are used in the non-inverting mode to avoid the threshold voltage drop associated with a CMOS non-inverting buffer. In another embodiment, in the noninverting mode, at least one bypass transistor is turned on and power is not supplied to the inverter. In yet another embodiment, in the inverting mode a CMOS inverter is powered with conventional voltages and in the noninverting mode the CMOS inverter is disabled and a bypass transistor connects input to output.

Abstract: The logic cell of the current invention is useful in a field programmable logic device, particularly a device in which an interconnect structure is interconnected by antifuses, and logic cells are programmed using pass transistors. All input leads of the logic cell can be selectively inverted. The output signal from one logic cell can be cascaded as input to the adjacent cell for efficiently computing wide functions. An optional feedback path allows the cell to be optionally used for sequential functions without the delay caused by a feedback path through field programmed connections. Configuration units can serve the multiple purposes of selectively applying programming voltages to the interconnect structure, shifting in configuration information for configuring the interconnect structure, and capturing and shifting out states of the interconnect lines. A novel output buffer allows 3-state control from multiple sources.

Abstract: This invention provides a structure and method for interconnecting logic devices through line segments which can be joined by programming antifuses. One of several programming lines can be connected through an interconnect line segment to each terminal of each antifuse in the array. Interconnect line segments connected to opposite terminals of the same antifuse are connected to a different programming line in order to be able to apply different voltages to the two terminals of the antifuse. An addressing structure selectively connects interconnect line segments to their respective programming lines, and programming voltages applied to the programming lines cause a selected antifuse to be programmed. A novel addressing feature sequentially addresses two transistors for the line segments to be connected, and takes advantage of a capacitive pumped decoder to maintain the addressed transistors turned on while programming voltages are applied.

Abstract: The logic cell of the current invention is useful in a field programmable logic device, particularly a device in which an interconnect structure is interconnected by antifuses, and logic cells are programmed using pass transistors. All input leads of the logic cell can be selectively inverted. The output signal from one logic cell can be cascaded as input to the adjacent cell for efficiently computing wide functions. An optional feedback path allows the cell to be optionally used for sequential functions without the delay caused by a feedback path through field programmed connections. Configuration units can serve the multiple purposes of selectively applying programming voltages to the interconnect structure, shifting in configuration information for configuring the interconnect structure, and capturing and shifting out states of the interconnect lines. A novel output buffer allows 3-state control from multiple sources.

Abstract: For antifuse programmable integrated circuit devices, in particular FPGA devices, the invention allows for alternative routing around antifuses which fail to program. The chip architecture includes wiring segments and antifuses which together allow for alternative routes around every antifuse in the event of failure of that antifuse. The method includes programming the device under control of a computer which can recalculate routes in the event of an antifuse which fails to program. Preferably the initial routing distributes unused wiring segments through the chip to be available for routing around a failed antifuse. When a failure occurs, the method includes determining an alternative route around every failed antifuse. The alternative route may be established directly after the antifuse has failed or after all initially selected antifuses have been programmed.

Abstract: According to the present invention, logic cells in a logic device include optional inverters on each input to the cell. This selective inversion allows the designer to use inverters without consuming resources available for other functions, and eliminates the need for output inverters. Since any number of inputs to the cell can be inverted, the cell can decode any address equally fast, and a designer can therefore rely on the time required to decode an address regardless the ratio and arrangement of 0's and 1's (inversions and noninversions) in the address. Also a signal which fans out from an output port and is inverted at some destinations and not others is handled easily with the present invention, because providing inverters on all inputs allows full flexibility.

Abstract: A latch may be formed as a two-part structure, one part for data input and one part for feeding back the data to form the latch. A clock signal controls whether data from a data input terminal will be forwarded to the output or whether the output signal will be provided as input and forwarded, thus forming the latch. A problem called the static ones hazard, namely registering a logical 0 when data input is logical 1, can occur with a latch of this logic structure when the circuit is entering the latch mode. In accordance with the invention, this static ones hazard is avoided by controlling trip points in the gates of the cell and input buffers of the cell so that the cell implements a make-before-break transition.

Abstract: The present invention is used in an FPGA device having programmable logic cells and a programmable interconnect array. In a preferred embodiment in which the logic cells are programmed using transistors controlled by memory cells and the interconnect structure is programmed using antifuses, a configuration control unit (CCU) of the present invention can accomplish three functions: 1) applying programming voltages to terminals of the interconnect antifuses; 2) configuring the logic cells; and 3) reading status of signals on the interconnect structure. The CCUs are connected together into a shift register. Each CCU connects to a horizontal or vertical interconnect line. At intersections of these interconnect lines are antifuses. By loading logical 1's into the two CCUs, it is possible to address the antifuse at the intersection of the two interconnect lines. A voltage difference can then be directed to the two terminals of that antifuse for programming the antifuse.