Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: Described herein is a projective optical metrology system including: a light target formed by a first number of light sources having a pre-set spatial arrangement; and an optical unit including an optoelectronic image sensor, which receives a light signal coming from the light target and defines two different optical paths for the light signal towards the optoelectronic image sensor. The two optical paths are such that the light signal forms on the optoelectronic image sensor at most an image of the light target that can be processed for determining at least one quantity indicating the mutual arrangement between the light target and the optical unit.

Abstract: Described herein is a projective optical metrology system including: a light target equipped with a plurality of light sources having a pre-set spatial arrangement; an optoelectronic image sensor; an optical unit receiving a light signal coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images of the light target; and an electronic processing unit coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.

Abstract: A projective optical metrology system including a first optical unit, which includes: an optical input that receives a first light signal; a number of optical paths; and a separator, which is optically interposed between the optical input and the optical paths and separates a number of components of the first light signal received by the optical input and couples each of the separate components to a corresponding optical path. The first optical unit also includes a light target, which emits a second light signal and is formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to the corresponding optical path. The metrology system also includes a second optical unit, which generates the first light signal and receives the second light signal.

Abstract: Described herein is a projective optical metrology system including: a light target formed by a first number of light sources having a pre-set spatial arrangement; and an optical unit including an optoelectronic image sensor, which receives a light signal coming from the light target and defines two different optical paths for the light signal towards the optoelectronic image sensor. The two optical paths are such that the light signal forms on the optoelectronic image sensor at most an image of the light target that can be processed for determining at least one quantity indicating the mutual arrangement between the light target and the optical unit.

Abstract: Described herein is a projective optical metrology system including: a light target equipped with a plurality of light sources having a pre-set spatial arrangement; an optoelectronic image sensor; an optical unit receiving a light signal coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images of the light target; and an electronic processing unit coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.