Abstract: A memory device includes at least one bitcell coupled to a local bitline. The at least one bitcell includes multiple sets of a plurality of transistor devices. The first set of the plurality of transistor devices is configured to form a single write (1W) port for receiving digital data. The second set of the plurality of transistor devices is configured as an inverter pair. The inverter pair stores the digital data. The third set of the plurality of transistor devices is configured to form a single read (1R) port. The 1R port can be used to access the digital data stored at the inverter pair and output the digital data on the local bitline. The plurality of transistor devices includes an equal number of P-channel transistor devices and N-channel transistor devices.

Abstract: A memory device includes at least one bitcell coupled to a local bitline. The at least one bitcell includes first, second, and third sets of a plurality of transistor devices. The first set is configured to form at least one write port. The at least one write port receives digital data. The second set of the plurality of transistor devices is configured as an inverter pair that stores the digital data. The third set of the plurality of transistor devices is configured to form at least one read port. The at least one read port is used to access the digital data from the inverter pair and output the digital data on the local bitline. The plurality of transistor devices consists of an equal number of P-channel transistor devices and N-channel transistor devices.

Abstract: Embodiments herein relate to circuitry which allows data to be processed and written back within an SRAM device. In a toggle operation, a memory cell is read and the bit at the complementary output node of a sense amplifier is written back to the memory cell. In a copy operation, a memory cell is read and the bit at the primary output node of the sense amplifier is written to another memory cell in the column. In another aspect, logic operations such as AND, OR, majority, AND-OR, OR-AND, and associated inverse operations can be performed within the SRAM device. This can involve writing data to one or more control memory cells in the same column as the data memory cells involved in the logic operation, and setting the respective word lines to be active concurrently.

Abstract: An apparatus is provided which comprises: a plurality of devices coupled to an input power supply rail and an output power supply rail; a first circuitry coupled to the plurality of devices, wherein the first circuitry is to turn on or off one or more devices of the plurality according to a control; and a second circuitry coupled to the first circuitry, wherein the second circuitry comprises an all-digital proportional-derivative mechanism to generate the control according to a digital representation of voltage on the output power supply rail.

Abstract: An apparatus is provided which comprises: a plurality of devices coupled to an input power supply rail and an output power supply rail; a first circuitry coupled to the plurality of devices, wherein the first circuitry is to turn on or off one or more devices of the plurality according to a control; and a second circuitry coupled to the first circuitry, wherein the second circuitry comprises an all-digital proportional-derivative mechanism to generate the control according to a digital representation of voltage on the output power supply rail.

Abstract: An apparatus comprising: a flip-flip comprising a master stage and a slave stage, wherein the slave stage is coupled to the master stage, wherein the master and slave stages are coupled to a first power supply rail; and a scan circuitry coupled to the slave stage of the flip-flip, wherein at least a portion of the scan circuitry is coupled to a second power supply rail.

Abstract: Described is an apparatus which comprises: a pass-gate; a sleep transistor configured as a diode-connected device controllable by the pass-gate; and a word-line driver coupled to the sleep transistor and the pass-gate.

Abstract: Memory with asymmetric power delivery for keeper cells in the memory are provided. In some embodiments, first and second power delivery circuits use separate first and second independently regulated power supplies. The first supply may be a supply nominally used for the memory structure, while the second supply may be lower than the first supply. In some embodiments, during a write operation, the first (higher) supply is used for one of the logic elements in a keeper cell, while the second (lower) supply is used for the other keeper logic element.

Abstract: Methods and systems to implement voltage level shifting with interim-voltage-controlled contention-interruption. A voltage level shifter (VLS) may include voltage level shift circuitry to level shift an input logical state from an input voltage swing to an output voltage swing. The VLS may include contention circuitry, a contention interrupter, and an interrupt controller to generate a contention-interrupt control having an interim voltage swing. A lower limit of the interim voltage swing may correspond to a lower limit of the output voltage swing. An upper limit of the interim voltage swing may correspond to an upper limit of the input voltage swing. The VLS may be implemented to level shift true and complimentary logical states, such as with cascode voltage switch logic (CVSL).

Abstract: Methods and systems to implement voltage level shifting with interim-voltage-controlled contention-interruption. A voltage level shifter (VLS) may include voltage level shift circuitry to level shift an input logical state from an input voltage swing to an output voltage swing. The VLS may include contention circuitry, a contention interrupter, and an interrupt controller to generate a contention-interrupt control having an interim voltage swing. A lower limit of the interim voltage swing may correspond to a lower limit of the output voltage swing. An upper limit of the interim voltage swing may correspond to an upper limit of the input voltage swing. The VLS may be implemented to level shift true and complimentary logical states, such as with cascode voltage switch logic (CVSL).

Abstract: Methods and systems to dynamically control state-retention strengths of a plurality of memory cells during a write operation to a subset of the memory cells. Dynamic control may include weakening state-retention strengths of the plurality of memory cells during a write operation to a subset of the memory cells, while preserving state-retention abilities of remaining ones of the plurality of memory cells. Weakening may include adjusting one or more resistances between one or more power supplies and the plurality of memory cells. Dynamic control may be selectively performed on portions of each of the memory cells in response to an input data logic state. Dynamic control may reduce a write contention within the subset of memory cells without disabling state-retention abilities of remaining ones of the plurality of memory cells, and may improve write response times of the memory cells.

Abstract: Methods and systems to dynamically control state-retention strengths of a plurality of memory cells during a write operation to a subset of the memory cells. Dynamic control may include weakening state-retention strengths of the plurality of memory cells during a write operation to a subset of the memory cells, while preserving state-retention abilities of remaining ones of the plurality of memory cells. Weakening may include adjusting one or more resistances between one or more power supplies and the plurality of memory cells. Dynamic control may be selectively performed on portions of each of the memory cells in response to an input data logic state. Dynamic control may reduce a write contention within the subset of memory cells without disabling state-retention abilities of remaining ones of the plurality of memory cells, and may improve write response times of the memory cells.