Patents by Inventor FRANCIS VANIER

FRANCIS VANIER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10948418
    Abstract: A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.
    Type: Grant
    Filed: May 16, 2018
    Date of Patent: March 16, 2021
    Inventors: Alain Blouin, Mohamad Sabsabi, Jean-Pierre Monchalin, Francis Vanier
  • Publication number: 20200182795
    Abstract: A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.
    Type: Application
    Filed: May 16, 2018
    Publication date: June 11, 2020
    Inventors: ALAIN BLOUIN, MOHAMAD SABSABI, JEAN-PIERRE MONCHALIN, FRANCIS VANIER