Patents by Inventor Frank G. J. DeRuyck

Frank G. J. DeRuyck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High temperature range electrical circuit testing
    Patent number: 7816930
    Abstract: An electrical circuit testing assembly that includes a mechanical reference that is relatively stationary as compared to a circuit under test. A probe support assembly is coupled to the mechanical reference and includes probes for contacting interconnect pads on the circuit under test. Optionally, the probe support structure is attached to the mechanical reference via a column that is thermally resistive. Also optionally, a testing circuitry support structure (e.g., a printed circuit board) is not rigidly attached to the mechanical reference or to the probe support structure, thereby permitting the testing circuitry support structure to float with respect to the probe support structure.
    Type: Grant
    Filed: October 12, 2007
    Date of Patent: October 19, 2010
    Assignee: ON Semiconductor
    Inventors: Ronald W. Young, Frank G. J. DeRuyck