Patents by Inventor Franz Pfeiffer

Franz Pfeiffer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100246769
    Abstract: In a method for the production of x-ray-optical gratings composed of a first material forming of periodically arranged grating webs and grating openings, a second material is applied by electroplating to fill the grid openings. The electroplating is continued until a cohesive layer of the second material with uniform height is created over the grating webs with this layer having a large absorption coefficient, the absorption properties of the grating structure of the grating are homogenized, so an improvement of the measurement signals that are generated with this grating is improved. Moreover, the mechanical stability of gratings produced in such a manner is improved.
    Type: Application
    Filed: September 25, 2009
    Publication date: September 30, 2010
    Inventors: Christian David, Tilman Donath, Eckhard Hempel, Martin Hoheisel, Barbara Matthis, Franz Pfeiffer, Stefan Popescu
  • Publication number: 20100177864
    Abstract: An arrangement and a method are disclosed for projective and/or tomographic phase-contrast imaging using X-ray radiation. In at least one embodiment, one or more phase grids is/are arranged in the beam path such that during a rotation of the at least one X-ray source, the examination object is scanned with different spatial orientations of the grid lines relative to the examination object such that the complete refraction angle, and hence the complete phase shift gradient, can be determined for each X-ray beam from the two scans with differently oriented phase grids in order to be able to show the phase shift of an examination object in terms of projections or in a tomographic image.
    Type: Application
    Filed: January 13, 2010
    Publication date: July 15, 2010
    Inventors: Tilman Donath, Martin Hoheisel, Christian David, Eckhard Hempel, Franz Pfeiffer, Stefan Popescu
  • Publication number: 20100091936
    Abstract: An x-ray CT system for x-ray phase contrast and/or x-ray dark field imaging has a grating interferometer that has a first grating structure that has a number of band-shaped x-ray emission maxima and minima arranged in parallel, the maxima and minima exhibiting a first grating period, a second band-shaped grating structure that produces, as a phase grating, a partial phase offset of x-ray radiation passing therethrough and that exhibits a second grating period, a third band-shaped grating structure with a third grating period with which relative phase shifts of adjacent x-rays and/or their scatter components are detected, and a device for value-based determination of the phase between adjacent x-rays and/or for value-based determination of the spatial intensity curve per detector element perpendicular to the bands of the grating structures. The third grating structure has a grating period that is larger by a factor of 2 to 5 than the grating period of the first grating structure.
    Type: Application
    Filed: September 30, 2009
    Publication date: April 15, 2010
    Inventors: Christian David, Tilman Donath, Eckhard Hempel, Martin Hoheisel, Franz Pfeiffer, Stefan Popescu
  • Publication number: 20100080341
    Abstract: An x-ray CT system that generates tomographic phase contrast or dark field exposures, has at least one grating interferometer with three grating structures arranged in series in the radiation direction, with a modular design of the second and third grating structures. The distance between the first grating structure of the x-ray source and the second grating structure (fashioned as a phase grating) of the respective grating/detector modules is adapted, depending on the fan angle, corresponding to a period of the grating structure of the x-ray source projected onto the grating detector module at a respective fan angle (?i).
    Type: Application
    Filed: September 24, 2009
    Publication date: April 1, 2010
    Inventors: Stefan Popescu, Christian David, Tilman Donath, Eckhard Hempel, Martin Hoheisel, Franz Pfeiffer
  • Patent number: 7653177
    Abstract: A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) consisting of a base liquid and a multiplicity of particles contained therein is used, the refractive index of the base liquid being different to the refractive index of the particles.
    Type: Grant
    Filed: June 26, 2008
    Date of Patent: January 26, 2010
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Matthias Honal, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20090325652
    Abstract: A user replaceable cover for a flip part of an apparatus, such as a mobile cellular telephone. The user replaceable cover may overlie a display on the exterior of the flip part of the phone. The display is not visible through the cover in ambient lighting. However, when the display is activated the content of the display is visible through the cover.
    Type: Application
    Filed: June 25, 2008
    Publication date: December 31, 2009
    Inventors: Eero Ilmari Suontila, Franz Pfeiffer, Sandra Kimmig, Tim Sobig, Ulrich Buschmann
  • Patent number: 7639786
    Abstract: An X-ray optical transmission grating of a focus-detector arrangement of an X-ray apparatus is disclosed, for generating projective or tomographic phase contrast recordings of a subject. In at least one embodiment, the grating includes a multiplicity of grating bars and grating gaps arranged periodically on at least one surface of at least one wafer, wherein the X-ray optical transmission grating includes at least two sub-gratings arranged in direct succession in the beam direction.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: December 29, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20090316857
    Abstract: The present invention relates to an interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, comprising: a) an x-ray source, preferably a standard polly chromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase-stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.
    Type: Application
    Filed: June 28, 2007
    Publication date: December 24, 2009
    Applicant: PAUL SCHERRER INSTITUT
    Inventors: Christian David, Franz Pfeiffer
  • Patent number: 7564941
    Abstract: A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings with a phase grating. According to at least one embodiment of the invention, in the gaps between its bars, the phase grating includes a filler material whose linear attenuation coefficient in the relevant energy range is greater than that of the bars. The height of the filler material in the gaps is dimensioned on the one hand so that the X-radiation with the energy used for measuring the phase shift generates a phase shift in the X-radiation such that, after the phase grating, the rays which pass through the bars are phase shifted by one half wavelength relative to the rays which pass through the gaps with the filler material.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: July 21, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20090154640
    Abstract: In a focus detector arrangement and method for an x-ray apparatus for generating projection or tomographic phase-contrast images of an examination subject, a beam of coherent x-rays is generated by an anode that has areas of different radiation emission characteristics arranged in bands thereon, that proceed parallel to grid lines of a phase grid that is used to generate the phase-contrast images.
    Type: Application
    Filed: December 6, 2006
    Publication date: June 18, 2009
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20090092227
    Abstract: An interferometer for X-rays, in particular hard X-rays, for obtaining quantitative phase contrast images, includes a standard polychromatic X-ray source, a diffractive optical beam splitter other than a Bragg crystal in transmission geometry, and a position-sensitive detector with spatially modulated detection sensitivity.
    Type: Application
    Filed: May 30, 2006
    Publication date: April 9, 2009
    Inventors: Christian David, Franz Pfeiffer, Timm Weitkamp
  • Patent number: 7492871
    Abstract: A focus/detector system of an X-ray apparatus and a method for generating projective or tomographic phase contrast recordings, are disclosed. In an embodiment of the system, the system includes a beam source equipped with a focus and a focus-side source grating, arranged in the beam path and generates a field of ray-wise coherent X-rays, a grating/detector arrangement having a phase grating and grating lines arranged parallel to the source grating for generating an interference pattern, and a detector having a multiplicity of detector elements arranged flat for measuring the position-dependent radiation intensity behind the phase grating. Finally, the detector elements are formed by a multiplicity of elongate scintillation strips, which are aligned parallel to the grating lines of the phase grating and have a small period, whose integer multiple corresponds to the average large period of the interference pattern which is formed by the phase grating.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: February 17, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventors: Stefan Popescu, Björn Heismann, Eckhard Hempel, Christian David, Franz Pfeiffer
  • Patent number: 7486770
    Abstract: A focus-detector arrangement includes a radiation source with a focus, arranged on a first side of the subject, for generating a fan-shaped or conical beam of rays; at least one X-ray optical grating arranged in the beam path, with at least one phase grating arranged on the opposite second side of the subject in the beam path generating an interference pattern of the X-radiation preferably, in a particular energy range; and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. According to at least one embodiment of the invention, at least one X-ray optical grating including bars which are free from overhangs form shadows in the beam path of the fan-shaped or conical beam of rays.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: February 3, 2009
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20090003526
    Abstract: A method and a measurement system are disclosed for the noninvasive determination of properties of an object to be examined and to the use of a contrast medium for X-ray phase-contrast measurement. in at least one embodiment of the invention, a mixture (suspension) consisting of a base liquid and a multiplicity of particles contained therein is used, the refractive index of the base liquid being different to the refractive index of the particles.
    Type: Application
    Filed: June 26, 2008
    Publication date: January 1, 2009
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Matthias Honal, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Patent number: 7433444
    Abstract: A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings of an observed region of a subject. In at least one embodiment, the arrangement includes a radiation source which emits a coherent or quasi-coherent X-radiation and irradiates the subject, a phase grating which is arranged behind the subject in the beam path of the radiation source and generates an interference pattern of the X-radiation in a predetermined energy range, and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. Further, the beam path of the X-radiation used diverges in at least one plane between the focus and the detector.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: October 7, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jörg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20070183580
    Abstract: A focus/detector system of an X-ray apparatus and a method for generating projective or tomographic phase contrast recordings, are disclosed. In an embodiment of the system, the system includes a beam source equipped with a focus and a focus-side source grating, arranged in the beam path and generates a field of ray-wise coherent X-rays, a grating/detector arrangement having a phase grating and grating lines arranged parallel to the source grating for generating an interference pattern, and a detector having a multiplicity of detector elements arranged flat for measuring the position-dependent radiation intensity behind the phase grating. Finally, the detector elements are formed by a multiplicity of elongate scintillation strips, which are aligned parallel to the grating lines of the phase grating and have a small period, whose integer multiple corresponds to the average large period of the interference pattern which is formed by the phase grating.
    Type: Application
    Filed: January 31, 2007
    Publication date: August 9, 2007
    Inventors: Stefan Popescu, Bjorn Heismann, Eckhard Hempel, Christian David, Franz Pfeiffer
  • Publication number: 20070183583
    Abstract: A focus-detector arrangement and an X-ray apparatus for generating projective or tomographic phase contrast recordings of a subject are disclosed. In at least one embodiment, the focus-detector arrangement includes a radiation source with a focus, arranged on a first side of the subject, for generating a fan-shaped or conical beam of rays; at least one X-ray optical grating arranged in the beam path, with at least one phase grating arranged on the opposite second side of the subject in the beam path generating an interference pattern of the X-radiation preferably, in a particular energy range; and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. According to at least one embodiment of the invention, at least one X-ray optical grating including bars which are free from overhangs form shadows in the beam path of the fan-shaped or conical beam of rays.
    Type: Application
    Filed: January 31, 2007
    Publication date: August 9, 2007
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20070183582
    Abstract: A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings with a phase grating. According to at least one embodiment of the invention, in the gaps between its bars, the phase grating includes a filler material whose linear attenuation coefficient in the relevant energy range is greater than that of the bars. The height of the filler material in the gaps is dimensioned on the one hand so that the X-radiation with the energy used for measuring the phase shift generates a phase shift in the X-radiation such that, after the phase grating, the rays which pass through the bars are phase shifted by one half wavelength relative to the rays which pass through the gaps with the filler material.
    Type: Application
    Filed: January 31, 2007
    Publication date: August 9, 2007
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20070183579
    Abstract: An X-ray optical transmission grating of a focus-detector arrangement of an X-ray apparatus is disclosed, for generating projective or tomographic phase contrast recordings of a subject. In at least one embodiment, the grating includes a multiplicity of grating bars and grating gaps arranged periodically on at least one surface of at least one wafer, wherein the X-ray optical transmission grating includes at least two sub-gratings arranged in direct succession in the beam direction.
    Type: Application
    Filed: January 31, 2007
    Publication date: August 9, 2007
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster
  • Publication number: 20070183563
    Abstract: A focus-detector arrangement of an X-ray apparatus is disclosed for generating projective or tomographic phase contrast recordings of an observed region of a subject. In at least one embodiment, the arrangement includes a radiation source which emits a coherent or quasi-coherent X-radiation and irradiates the subject, a phase grating which is arranged behind the subject in the beam path of the radiation source and generates an interference pattern of the X-radiation in a predetermined energy range, and an analysis-detector system which detects at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution. Further, the beam path of the X-radiation used diverges in at least one plane between the focus and the detector.
    Type: Application
    Filed: January 31, 2007
    Publication date: August 9, 2007
    Inventors: Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel, Martin Hoheisel, Thomas Mertelmeier, Franz Pfeiffer, Stefan Popescu, Manfred Schuster