Patents by Inventor Gad Yaron

Gad Yaron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9799454
    Abstract: An AC capacitor including a first electrode with an electrically conductive rod protruding from surface of the first electrode, a second electrode including an opening, a bobbin located between the first and the second electrode the bobbin includes a hollow central section. The axis of the electrically conductive rod protruding from surface of the first electrode is coaxial with axis of the hollow bobbin and the electrically conductive rod passes through the hollow central section of the bobbin and through the opening in the second electrode allowing current flow.
    Type: Grant
    Filed: May 24, 2017
    Date of Patent: October 24, 2017
    Assignee: Celem Passive Components LTD.
    Inventors: Anat Jakoubovitch, Benjamin Jakoubovitch, Gad Yaron
  • Patent number: 6408219
    Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.
    Type: Grant
    Filed: May 11, 1998
    Date of Patent: June 18, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Patrick H Lamey, Jr., Amotz Maimon, Gad Yaron
  • Publication number: 20010051836
    Abstract: A yield enhancement system organizes defect classification and attribute information into a global classification scheme. The global classes are used to identify defect sources and to generate inspection and review plans. The system accumulates defect information in a database and continually refines the information to improve the accuracy of the classification assignments and the identification of the defect sources.
    Type: Application
    Filed: May 11, 1998
    Publication date: December 13, 2001
    Inventors: PATRICK H. LAMEY, AMOTZ MAIMON, GAD YARON