Abstract: Disclosed is a successive approximation algorithm-based ADC self-correcting circuit, comprising: a coding circuit, a voltage dividing resistor string, a comparator array, a multi-path selection switch, a first digital-to-analog converter, a reference circuit, a control register, and a data register; an input end of the coding circuit is connected to an output end of the comparator array; a positive-phase input end of each comparator in the comparator array is connected to a mobile end of the multi-path selection switch; a negative-phase input end of each comparator in the comparator array is correspondingly connected between each two neighboring resistors in the voltage dividing resistor string; an enabling end of the comparator array is connected to the control register; a first immobile end of the multi-path selection switch is used for receiving an analog signal, a second immobile send is connected to an output end of the first digital-to-analog converter, and a control end is connected to the control regi

Abstract: The present disclosure provides a negative voltage generating circuit having an automatic voltage adjustment function, including a negative voltage generating circuit and a feedback control module. The negative voltage generated by the negative voltage generating circuit is adjusted by the feedback control module. The negative voltage generating circuit having the automatic voltage adjustment function of the present disclosure can automatically adjust the charge current of the charge pump according to the load current, thereby realizing the stability of the output voltage, such that the traditional analog circuit structure can work normally under the extremely low power supply voltage, and is particularly suitable for the deep submicron process. The present disclosure also realizes the digital adjustment of the output voltage, the negative voltage output is no longer single, and can be adjusted according to actual needs.

Abstract: A high-precision frequency measuring system and method. The system includes: an analog-to-digital conversion module for receiving an analog intermediate frequency signal to convert the analog intermediate frequency signal into a digital intermediate frequency signal; a frequency mixing module for generating two orthogonal local carriers to convert the digital intermediate frequency signal to a digital baseband signal; an extraction filter module for performing low-pass filtering and extraction of the digital baseband signal, so as to reduce a data rate; a Fourier transform module for obtaining a frequency domain signal; a frequency measurement module for obtaining a first frequency measurement value; a scanning module for obtaining a scanned second frequency measurement value; and a selector for selecting either the first frequency measurement value or the second frequency measurement value as a result of frequency measurement. The system and method can improve the accuracy of frequency measurement.

Abstract: A semiconductor cell structure and power semiconductor device, wherein, the semiconductor cell structure includes: a highly-doped semiconductor material region, an epitaxial layer, a dielectric insulating layer, a semi-insulating material, and an active device region, a deep groove is further etched on the epitaxial layer, the deep groove vertically extends into the highly-doped semiconductor material region, the dielectric insulating layer is formed on a side wall inside the deep groove, and the deep groove is filled with the semi-insulating material. The cell structure can be applied to the power semiconductor device during actual application, the present invention dramatically reduces the difficulty of the process implementation, relaxes the harsh requirements on charge balance, broadens the tolerant charge mismatch percentage by approximately ten times, and also improves the long-term reliability of normal operation of the device cell at the same time.

Abstract: A high-speed low-power-consumption trigger, which comprises a control signal generation circuit, an enabling unit, and a latch structure. The latch structure comprises two input ends, two output ends, two enabling ends, a second enabling end, and a ground end. The enabling unit comprises two enabling circuits. An output signal X of the control signal generation circuit and an external control signal D serve as input signals of the first enabling circuit. An output end of the first enabling circuit is connected to the first enabling end. The output signal X of the control signal generation circuit and a phase-inverted signal DB of the external control signal D serve as input signals of the second enabling circuit. An output end of the second enabling circuit is connected to the second enabling end.

Abstract: The present invention provides a device and method for correcting error estimation of an analog-to-digital converter.

Abstract: A high-speed low-power-consumption trigger, which comprises a control signal generation circuit, an enabling unit, and a latch structure. The latch structure comprises two input ends, two output ends, two enabling ends, a second enabling end, and a ground end. The enabling unit comprises two enabling circuits. An output signal X of the control signal generation circuit and an external control signal D serve as input signals of the first enabling circuit. An output end of the first enabling circuit is connected to the first enabling end. The output signal X of the control signal generation circuit and a phase-inverted signal DB of the external control signal D serve as input signals of the second enabling circuit. An output end of the second enabling circuit is connected to the second enabling end.

Abstract: A semiconductor cell structure and power semiconductor device, wherein, the semiconductor cell structure includes: a highly-doped semiconductor material region, an epitaxial layer, a dielectric insulating layer, a semi-insulating material, and an active device region, a deep groove is further etched on the epitaxial layer, the deep groove vertically extends into the highly-doped semiconductor material region, the dielectric insulating layer is formed on a side wall inside the deep groove, and the deep groove is filled with the semi-insulating material. The cell structure can be applied to the power semiconductor device during actual application, the present invention dramatically reduces the difficulty of the process implementation, relaxes the harsh requirements on charge balance, broadens the tolerant charge mismatch percentage by approximately ten times, and also improves the long-term reliability of normal operation of the device cell at the same time.

Abstract: The present invention provides a frequency-compensated transconductance amplifier, includes an input stage consisting of NMOS transistors M1 and M2, a first-stage active load consisting of PMOS transistors M3 and M4, a first-stage tail current source consisting of a constant current source Iss, a second-stage input transistor consisting of a PMOS transistor M5, a second-stage constant current source consisting of an NMOS transistor M6, a load capacitor consisting of a capacitor CL, and a frequency compensation network formed by sequentially connecting a gain stage GAIN, a compensating resistor Rc and a compensating capacitor Cc in series.

Abstract: A method for an analog-to-digital converter correcting error estimation includes: according to a correction parameter preset initial value, generating a control signal and finely tuning a digital control delay cell, adjusting a delay amount, and correcting a clock phase error between channels; according to a correction parameter initial value, correcting a gain error between channels, generating and buffering a general correction signal, and triggering a counting cell to start counting, and calling the general correction signal in a buffer and generating a preliminary estimation result by using a cyclic correlation method; when counting to a preset value, setting low-pass filter accumulating cell enable ends and a correction parameter updating cell, generating an error estimation result from the preliminary estimation result and latching it, updating a clock correction parameter and a gain correction parameter according to a gradient descent method, and latching them, and resetting to carry out cyclic estimat

Abstract: An analog-to-digital converter of non-binary capacitor array with redundancy bits and its chip. The non-binary capacitor array with redundancy bits comprises a common-mode voltage, analog signal input, no less than one redundancy bit capacitor and multiple capacitors; each capacitor of capacitors with redundancy bits and multiple capacitors is connected in parallel between common-mode voltage and analog signal input and marked in a sequence from highest to lowest/lowest to highest bit; the sum of the capacitance of capacitors from the lowest bit capacitor to an random capacitor must be no less than the capacitance of the higher bit capacitor adjacent to the random capacitor. The ratio of the capacitance of each capacitor to the capacitance of unit capacitor is set to be positive. The capacitor array is applied into an analog-to-digital converter or fabricated as a chip.

Abstract: The present invention provides a high-precision analog-to-digital converter, includes a redundant weight capacitor array, a comparator, a code reestablishment circuit, a weight storage circuit and a control logic circuit. The redundant weight capacitor array collects input voltages and generates output voltages in a sampling stage. The comparator compares the output voltages of the redundant weight capacitor array. The code reestablishment circuit calculates an output code of the successive approximation type analog-to-digital converter according to the comparator output result and a capacitor weight in the weight storage circuit. The weight storage circuit stores the capacitor weight. The control logic circuit controls the sampling and conversion stages of the redundant weight capacitor array. The present invention also provides a DNL-based performance improvement method adapted to the analog-to-digital converter.

Abstract: The present invention provides a high-precision analog-to-digital converter, includes a redundant weight capacitor array, a comparator, a code reestablishment circuit, a weight storage circuit and a control logic circuit. The redundant weight capacitor array collects input voltages and generates output voltages in a sampling stage. The comparator compares the output voltages of the redundant weight capacitor array. The code reestablishment circuit calculates an output code of the successive approximation type analog-to-digital converter according to the comparator output result and a capacitor weight in the weight storage circuit. The weight storage circuit stores the capacitor weight. The control logic circuit controls the sampling and conversion stages of the redundant weight capacitor array. The present invention also provides a DNL-based performance improvement method adapted to the analog-to-digital converter.

Abstract: The present invention provides a frequency-compensated transconductance amplifier, includes an input stage consisting of NMOS transistors M1 and M2, a first-stage active load consisting of PMOS transistors M3 and M4, a first-stage tail current source consisting of a constant current source Iss, a second-stage input transistor consisting of a PMOS transistor M5, a second-stage constant current source consisting of an NMOS transistor M6, a load capacitor consisting of a capacitor CL, and a frequency compensation network formed by sequentially connecting a gain stage GAIN, a compensating resistor Rc and a compensating capacitor Cc in series.

Abstract: An analog-to-digital converter of non-binary capacitor array with redundancy bits and its chip. The non-binary capacitor array with redundancy bits comprises a common-mode voltage, analog signal input, no less than one redundancy bit capacitor and multiple capacitors; each capacitor of capacitors with redundancy bits and multiple capacitors is connected in parallel between common-mode voltage and analog signal input and marked in a sequence from highest to lowest/lowest to highest bit; the sum of the capacitance of capacitors from the lowest bit capacitor to an random capacitor must be no less than the capacitance of the higher bit capacitor adjacent to the random capacitor. The ratio of the capacitance of each capacitor to the capacitance of unit capacitor is set to be positive. The capacitor array is applied into an analog-to-digital converter or fabricated as a chip.

Abstract: A high-speed sampling front-end circuit is presented that includes a MDAC sampling network, a reference voltage generator circuit, a comparator array, an operational amplifier, an output short-circuit switch, an adjustable clock duty cycle stabilizer, a status control module and a feedback control module. The circuit features low power, high sampling rate and high input bandwidth of sampling network. The time constant of the MDAC sampling network and the comparator array is precisely matched one another to improve input bandwidth of the sampling network. Sampling capacitors are designed as feedback capacitors and DAC calculation capacitors, thereby the operational amplifier doubles feedback coefficient and features 50% bandwidth and 50% power. The cycle stabilizer is adopted to shorten sampling time and extend amplification phase to greatly improve sampling rate. One input reference voltage tends to simplify the design of the reference voltage generator circuit.

Abstract: The present invention pertains to a high speed duty cycle correction and double to single ended conversion circuit for PLL, comprising a reshaper stage, a single-edge detection circuit and a duty cycle restorer. The present invention introduces a way to convert double-ended output of PLL VCO into single-ended signal and adjust duty cycle of PLL VCO's output waveform by 50%, so that the circuit can output single ended clock signal with 50% duty cycle.

Abstract: A high-speed sampling front-end circuit is presented that includes a MDAC sampling network, a reference voltage generator circuit, a comparator array, an operational amplifier, an output short-circuit switch, an adjustable clock duty cycle stabilizer, a status control module and a feedback control module. The circuit features low power, high sampling rate and high input bandwidth of sampling network. The time constant of the MDAC sampling network and the comparator array is precisely matched one another to improve input bandwidth of the sampling network. Sampling capacitors are designed as feedback capacitors and DAC calculation capacitors, thereby the operational amplifier doubles feedback coefficient and features 50% bandwidth and 50% power. The cycle stabilizer is adopted to shorten sampling time and extend amplification phase to greatly improve sampling rate. One input reference voltage tends to simplify the design of the reference voltage generator circuit.

Abstract: The present invention pertains to a high speed duty cycle correction and double to single ended conversion circuit for PLL, comprising a reshaper stage, a single-edge detection circuit and a duty cycle restorer. The present invention introduces a way to convert double-ended output of PLL VCO into single-ended signal and adjust duty cycle of PLL VCO's output waveform by 50%, so that the circuit can output single ended clock signal with 50% duty cycle.