Abstract: A method for assembling a secondary collimator including a first face plate having a first surface and an opposing second surface is provided. The method includes positioning a lamella assembly on the first face plate, wherein the lamella assembly includes at least one radiation-absorbing material layer and at least one radiation-transmitting material layer, such that a first surface of the lamella assembly is adjacent the second surface of the first face plate. The method also includes coupling a second face plate to the first face plate and the lamella assembly such that a first surface of the second face plate is adjacent a second surface of the lamella assembly.

Abstract: An x-ray diffraction imaging device includes at least one x-ray detector and at least one scatter collimator positioned upstream of the at least one x-ray detector. The at least one collimator includes a plurality of successive plates. Each of the plurality of plates defines a plurality of rectangular holes. The plurality of successive plates are arranged such that the plurality of rectangular holes define a plurality of quadrilateral passages extending through the at least one scatter collimator. Each of the plurality of quadrilateral passages is configured to increase a rate of detection of first x-rays that define an x-ray transit path enclosed within a single such quadrilateral passage. Also, the plurality of quadrilateral passages is configured to decrease a rate of detection of second x-rays that define an x-ray transit path that intersects more than one such quadrilateral passage.

Abstract: A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel.

Abstract: A system for generating an improved diffraction profile is described. The system includes at least one x-ray source configured to generate x-rays and a primary collimator outputting a first x-ray beam to a first focus point and a second x-ray beam to a second focus point. The primary collimator generates the first and second x-ray beams from the x-rays. The system further includes a container, and a first scatter detector configured to detect a first set of scattered radiation generated upon intersection of the first x-ray beam with the container and to detect a second set of scattered radiation generated upon intersection of the second x-ray beam with the container. An angle of scatter of the first set of scattered radiation detected by the first scatter detector is at most half of an angle of scatter of the second set of scattered radiation detected by the first scatter detector.

Abstract: A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles.

Abstract: A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS includes a plurality of focus points (N) defined along a length of the MFXS collinear with the y-axis. The MFXS is configured to generate the plurality of primary beams, and at least M coherent x-ray scatter detectors are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P = W s · V M · U , where Ws is a lateral extent of the plurality of focus points, U is a distance from the y-axis to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X=L.

Abstract: A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.

Abstract: A method for reducing an artifact within an image of a substance is described. The method includes generating the image of the substance, and constraining a measured linear attenuation coefficient of a pixel of the image based on at least one of a measured diffraction profile, a measured effective atomic number, and a measured packing fraction of the substance.

Abstract: A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel.

Abstract: A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.

Abstract: A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially from a plurality of focus points denoted by F1, F2, . . . Fn with a running index i. The method includes measuring a diffraction profile Xk for each coherent scatter detector Dk of the plurality of coherent scatter detectors. The diffraction profile includes a spectrum of a number of photons measured in a plurality of corresponding coherent scatter detectors. Each coherent scatter detector Dk is corrected to remove scatter from a plurality of primary beams directed to remaining coherent scatter detectors of the plurality of coherent scatter detectors.

Abstract: An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

Abstract: Systems for improving a spatial resolution of an image are described. One of the systems includes an X-ray source configured to generate X-rays, a transmission detector configured to detect the X-rays to output a plurality of electrical signals, and a plate configured to improve the spatial resolution upon receiving the X-rays. The plate is configured to output a fan-beam upon receiving the X-rays.

Abstract: A method for developing a secondary collimator is described. The method includes orienting a plurality of collimator elements in a plane such that a gap is defined between a first collimator element and a second collimator element. The first collimator element has a first curved end, and the first curved end faces the second collimator element across the gap.

Abstract: A method for determining a type of substance is described. The method includes determining an effective atomic number of the substance based on a measured ratio of numbers of detected x-ray scatter photons in a diffraction profile.

Abstract: A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.

Abstract: A method for developing a secondary collimator is described. The method includes orienting a plurality of collimator elements in a plane such that a gap is defined between a first collimator element and a second collimator element. The first collimator element has a first curved end, and the first curved end faces the second collimator element across the gap.

Abstract: Method and system for distinguishing a special nuclear material from a non-threat, high-density metal using X-ray Diffraction. In one embodiment, an X-ray image of an object is examined to detect those voxels having intense XRD profiles, indicating the presence of a high-Z metal. Second, the XRD profiles of such voxels are examined to find the widths and positions of any bands of momentum that are empty of Bragg diffraction peaks. If no such bands are found, then each XRD profile is uniformly populated with Bragg peaks; and it is determined that a special nuclear material is present. If such bands are found, then at least one XRD profile is not uniformly populated with Bragg peaks; and it is determined that a non-threat, high-Z metal is present.

Abstract: The invention relates to a method and a device for determining the distribution of an X-ray fluorescence (XRF) marker (16) in a body volume (14). The body volume (14) is irradiated with a beam of rays (12) from an X-ray source (10) with a first ray component with a quantum energy just above and a second ray component with a quantum energy just below the K-edge of the XRF marker (16). Secondary radiation emitted from the body volume (14) is detected in a location-resolved way by a detector (30). To separate the X-ray fluorescence components in the secondary radiation from background radiation, the body volume is irradiated for a second time with a beam of rays from which the first ray component has been substantially removed by a filter (22) made from the material of the XRF marker.

Abstract: A system, a processor, and a method for tracking a focus of a beam are described. The method includes determining a plurality of intensities corresponding to a plurality of voltages, and applying a first voltage of the plurality of voltages corresponding to a maximum intensity of the plurality of intensities during a scan.