Patents by Inventor George Skidmore

George Skidmore has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11565936
    Abstract: The present invention relates to the unexpected discovery of novel methods of preparing nanodevices and/or microdevices with predetermined patterns. In one aspect, the methods of the invention allow for engineering structures and films with continuous thickness equal to or less than 50 nm.
    Type: Grant
    Filed: May 25, 2017
    Date of Patent: January 31, 2023
    Assignees: The Regents of the University of Colorado, DRS Network & Imaging Systems, LLC
    Inventors: Steven M. George, Victor M. Bright, Joseph J. Brown, Jonas Gertsch, Nathan Thomas Eigenfeld, George Skidmore
  • Publication number: 20200316645
    Abstract: The present invention relates to the unexpected discovery of novel methods of preparing nanodevices and/or microdevices with predetermined patterns. In one aspect, the methods of the invention allow for engineering structures and films with continuous thickness equal to or less than 50 nm.
    Type: Application
    Filed: May 25, 2017
    Publication date: October 8, 2020
    Applicants: The Regents of the University of Colorado, a Body Corporate, DRS Network & Imaging Systems, LLC
    Inventors: Steven M. GEORGE, Victor M. BRIGHT, Joseph J. BROWN, Jonas GERTSCH, Nathan Thomas EIGENFELD, George SKIDMORE
  • Publication number: 20200099825
    Abstract: A method of determining a temperature of an element in a scene includes providing a set of targets each characterized by a target temperature and measuring pixel output values for pixels in a detector array for the targets in the set of targets. Measuring pixel output values is performed at a plurality of detector temperatures. The method also includes mapping each pixel output value to one of a plurality of constant values, each of the plurality of constant values being associated with one of the target temperatures, assembling a scene temperature profile using the mapped pixel output values, and obtaining an image of the scene including the element, wherein the element is associated with a pixel of the detector array. The method further includes determining a pixel value associated with the element and computing the temperature of the element using the scene temperature profile.
    Type: Application
    Filed: November 26, 2019
    Publication date: March 26, 2020
    Inventors: Steven J. Marteney, Richard L. Southerland, Kristina F. Jeppson, George Skidmore
  • Patent number: 10542193
    Abstract: A method of performing non-uniformity correction for an imaging system includes receiving image data from a detector. The method also includes retrieving stored correction coefficients from the memory. The method also includes retrieving a stored factory calibration reference frame. The method also includes acquiring an operational calibration reference frame. The method also includes computing updated correction coefficients based on the stored correction coefficients, the stored factory calibration reference frame, and the operational calibration reference frame. The method also includes computing the non-uniformity correction based on the updated correction coefficients. The method also includes forming a corrected image by applying the non-uniformity correction to the image data. The method further includes outputting the corrected image.
    Type: Grant
    Filed: November 5, 2014
    Date of Patent: January 21, 2020
    Assignee: DRS NETWORK & IMAGING SYSTEMS, LLC
    Inventors: Steven J. Marteney, Richard L. Southerland, Kristina F. Jeppson, George Skidmore
  • Publication number: 20080092803
    Abstract: A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.
    Type: Application
    Filed: December 13, 2007
    Publication date: April 24, 2008
    Applicant: ZYVEX LABS, LLC
    Inventors: John Randall, Jingping Peng, Jun-Fu Liu, George Skidmore, Christof Baur, Richard Stallcup, Robert Folaron
  • Publication number: 20070187623
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Application
    Filed: April 17, 2007
    Publication date: August 16, 2007
    Applicant: ZYVEX INSTRUMENTS, LLC
    Inventors: George SKIDMORE, Matthew ELLIS, Aaron GEISBERGER, Kenneth BRAY, Kimberly TUCK, Robert Folaron
  • Publication number: 20070158768
    Abstract: An apparatus and method for a micromachined mechanical switch device having first and second cooperating electrical switch contacts formed by respective first and second patterns of robust carbon nanotube thin film structures for forming intermittent electrical contact between the first and second conductors in response to the applied force urging the first and second cooperating patterns of carbon nanotube thin film structures together into momentary or substantially permanent physical contact.
    Type: Application
    Filed: January 6, 2006
    Publication date: July 12, 2007
    Applicant: Honeywell International, Inc.
    Inventors: Jorg Pilchowski, George Skidmore
  • Patent number: 7227140
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: June 5, 2007
    Assignee: Zyvex Instruments, LLC
    Inventors: George Skidmore, Matthew D. Ellis, Aaron Geisberger, Kenneth Bray, Kimberly Tuck, Robert Folaron
  • Publication number: 20050223968
    Abstract: A patterned layer is formed by removing nanoscale passivating particle from a first plurality of nanoscale structural particles or by adding nanoscale passivating particles to the first plurality of nanoscale structural particles. Each of a second plurality of nanoscale structural particles is deposited on each of corresponding ones of the first plurality of nanoscale structural particles that is not passivated by one of the plurality of nanoscale passivating particles.
    Type: Application
    Filed: March 25, 2005
    Publication date: October 13, 2005
    Applicant: Zyvex Corporation
    Inventors: John Randall, Jingping Peng, Jun-Fu Liu, George Skidmore, Christof Baur, Richard Stallcup, Robert Folaron
  • Publication number: 20050181658
    Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.
    Type: Application
    Filed: February 13, 2004
    Publication date: August 18, 2005
    Applicant: Zyvex Corporation
    Inventors: Kenneth Tsui, Aaron Geisberger, George Skidmore
  • Publication number: 20050178980
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Application
    Filed: September 23, 2004
    Publication date: August 18, 2005
    Applicant: Zyvex Corporation
    Inventors: George Skidmore, Matthew Ellis, Aaron Geisberger, Kenneth Bray, Kimberly Tuck, Robert Folaron
  • Patent number: 6923669
    Abstract: A MEMS microconnector including a compliant handle and a deflectable connection member. The compliant handle is configured to frictionally engage a manipulation probe. The deflectable connection member includes a first end coupled to the handle and a second end configured to deflect and thereby engage a receptacle in response to disengagement of the manipulation probe from the handle.
    Type: Grant
    Filed: February 13, 2004
    Date of Patent: August 2, 2005
    Assignee: Zyvex Corporation
    Inventors: Kenneth Tsui, Aaron Geisberger, George Skidmore