Abstract: A method of detecting and preventing over current induced system failure is provided. An OC protect controller monitors a CPU total power consumption based on received CPU activity information. In response to the monitoring, if the CPU power consumption is over a threshold, then the OC protect controller outputs a frequency dithering control signal to reduce the CPU clock frequency such that the CPU does not reach an OC limit. The OC protect controller also outputs a PLL frequency control signal to reduce the PLL clock frequency to improve system efficiency.

Abstract: A control method for a clock signal for a CPU contained in a CMOS circuit includes: when a load current for the CMOS circuit is enabled, generating a first clock signal; in a first period, selectively gating certain cycles of the first clock signal to generate a second clock signal which has a clock rate less than a clock rate of the first clock signal; and in a second period, dithering in the gated cycles to increase the clock rate of the second clock signal to be equal to that of the first clock signal. The second clock signal is continuously input to the CMOS circuit during the first period and the second period.

Abstract: A method of detecting and preventing over current induced system failure is provided. An OC protect controller monitors a CPU total power consumption based on received CPU activity information. In response to the monitoring, if the CPU power consumption is over a threshold, then the OC protect controller outputs a frequency dithering control signal to reduce the CPU clock frequency such that the CPU does not reach an OC limit. The OC protect controller also outputs a PLL frequency control signal to reduce the PLL clock frequency to improve system efficiency.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC maybe set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC maybe set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: The performance, thermal and power management system is configured to perform DVFS calibration, temperature compensation adjustment, aging calibration, and DC offset calibration in an IC. The initial voltage supplied to the IC may be set to an initial value which takes chip-to-chip process variations into account and then dynamically adjusted according to temperature variations, DC offset and/or aging effects. Therefore, the performance, thermal and power management system may achieve optimized thermal and power performance of the IC.

Abstract: A control method for a clock signal for a CPU contained in a CMOS circuit includes: when a load current for the CMOS circuit is enabled, generating a first clock signal; in a first period, selectively gating certain cycles of the first clock signal to generate a second clock signal which has a clock rate less than a clock rate of the first clock signal; and in a second period, dithering in the gated cycles to increase the clock rate of the second clock signal to be equal to that of the first clock signal. The second clock signal is continuously input to the CMOS circuit during the first period and the second period.

Abstract: Clock phases of clock signals in a dual clock tree are adjusted to compensate for variances in propagation delays of buffers in the clock tree. A first input clock and a second input clock are generated with the second input clock having a phase that is programmably shifted relative to the first input clock when the system is operating at a lowered operating voltage or different temperature, for example. The first and second input clocks are coupled to a dually clocked flip flop, each having a primary latch and a secondary latch. A composite clock signal is generated in response to the first input clock and the second input clock. For example, a first signal is latched in the primary latch in response to the composite clock signal and a second signal is latched in the secondary latch in response to the first input clock signal.

Abstract: Clock phases of clock signals in a dual clock tree are adjusted to compensate for variances in propagation delays of buffers in the clock tree. A first input clock and a second input clock are generated with the second input clock having a phase that is programmably shifted relative to the first input clock when the system is operating at a lowered operating voltage or different temperature, for example. The first and second input clocks are coupled to a dually clocked flip flop, each having a primary latch and a secondary latch. A composite clock signal is generated in response to the first input clock and the second input clock. For example, a first signal is latched in the primary latch in response to the composite clock signal and a second signal is latched in the secondary latch in response to the first input clock signal.

Abstract: A method is described for simulating the f-sigma timing path delay of an integrated circuit design when local transistor variations determine the stochastic delay. This is achieved by determining an estimated delay time for a first timing path using non-linear operating point analysis of local variations (NLOPALV). An operating point is calculated for each cell that is included in a timing path in the integrated circuit design. The f-sigma operating point of a cell-arc is a point on the cell-arc delay function (CADF). An f-sigma delay value is determined for each cell using the selected operating point on the CADF of the cell. The determined delay values of the plurality of cells in the timing path may then be combined to predict the estimated delay for the entire timing path. The method may be extended to deal with slew rate, predict hold time statistics, prune paths, and deal with convergent paths.

Abstract: Memory power management systems and methods are provided. One embodiment of the present invention includes a memory power management system. The system comprises a first low dropout (LDO) regulator that provides an active operating voltage that is derived from a first supply voltage to power a memory array during an active mode. The system further comprises a second LDO regulator that provides a minimum memory retention voltage that is derived from a second supply voltage to power the memory array in a standby mode, wherein the second supply voltage also powers at least one peripheral circuit for reading from and/or writing to the memory array.

Abstract: Memory power management systems and methods are provided. One embodiment of the present invention includes a memory power management system. The system comprises a first low dropout (LDO) regulator that provides an active operating voltage that is derived from a first supply voltage to power a memory array during an active mode. The system further comprises a second LDO regulator that provides a minimum memory retention voltage that is derived from a second supply voltage to power the memory array in a standby mode, wherein the second supply voltage also powers at least one peripheral circuit for reading from and/or writing to the memory array.

Abstract: A method includes parsing a design of the integrated circuit to define cells in automatic power gating power domains, automatically creating an automatic power gating power domain netlist from the parsed design of the integrated circuit, and placing and routing the automatic power gating power domain netlist to produce a layout for the integrated circuit. The parsing partitions a high-level power domain of the integrated circuit into one or more automatic power gating power domains. The automatic power gating power domains have substantially zero-cycle power up times, thereby enabling transparent operation. Furthermore, the automatic power gating power domains may be automatically inserted into designs of integrated circuits, thereby relieving integrated circuit designers of the task of inserting power domains and associated hardware and software.

Abstract: A method is described for simulating the f-sigma timing path delay of an integrated circuit design when local transistor variations determine the stochastic delay. This is achieved by determining an estimated delay time for a first timing path using non-linear operating point analysis of local variations (NLOPALV). An operating point is calculated for each cell that is included in a timing path in the integrated circuit design. The f-sigma operating point of a cell-arc is a point on the cell-arc delay function (CADF). An f-sigma delay value is determined for each cell using the selected operating point on the CADF of the cell. The determined delay values of the plurality of cells in the timing path may then be combined to predict the estimated delay for the entire timing path. The method may be extended to deal with slew rate, predict hold time statistics, prune paths, and deal with convergent paths.

Abstract: A method includes parsing a design of the integrated circuit to define cells in automatic power gating power domains, automatically creating an automatic power gating power domain netlist from the parsed design of the integrated circuit, and placing and routing the automatic power gating power domain netlist to produce a layout for the integrated circuit. The parsing partitions a high-level power domain of the integrated circuit into one or more automatic power gating power domains. The automatic power gating power domains have substantially zero-cycle power up times, thereby enabling transparent operation. Furthermore, the automatic power gating power domains may be automatically inserted into designs of integrated circuits, thereby relieving integrated circuit designers of the task of inserting power domains and associated hardware and software.

Abstract: One embodiment of the present invention includes an adaptive voltage scaling system associated with an integrated circuit (IC). The system comprises at least one target performance circuit comprising a first semiconductor material and being configured to determine at least one voltage potential in response to achieving a target performance based on an applied voltage. The system also comprises a controller configured to set an output of a variable power supply to the determined at least one voltage potential, and an aging controller configured to control the at least one target performance circuit to age the first semiconductor material at a rate that is at least substantially commensurate with a rate at which other circuitry in the IC ages.