Abstract: Embodiments herein describe a self-biased divider for a clock in an integrated circuit. In one embodiment, the clock includes a VCO that generates a clock signal that is output to the self-biased divider. However, because the VCO may generate an analog clocking signal (e.g., a low amplitude sine wave of unknown common mode) to reduce jitter, the amplitude can vary which means it may not sufficiently track CMOS parameters. The clocking signals generated by the self-biased divider are used as feedback signals for DC biasing (or DC leveling). In this manner, the divider is referred to a self-biased divider since signals generated by the divider are used to perform DC biasing/leveling.

Abstract: On-chip spread spectrum synchronization between spread spectrum sources is provided. A spread spectrum amplitude of a signal of a spread spectrum reference clock is obtained using one or more delay lines of one or more delay elements in a skitter circuit. A spread width of the spread spectrum amplitude of the signal is determined, using one or more sticky latches in the skitter circuit, based on one or more edges of the signal. A delay line of the one or more delay elements corresponding to a falling edge of the spread width of the signal is identified using combinational circuitry of the skitter circuit. A spread spectrum signal of a spread spectrum slave clock is synchronized with the signal of the spread spectrum reference clock based on the delay line.

Abstract: On-chip spread spectrum synchronization between spread spectrum sources is provided. A spread spectrum amplitude of a signal of a spread spectrum reference clock is obtained using one or more delay lines of one or more delay elements in a skitter circuit. A spread width of the spread spectrum amplitude of the signal is determined, using one or more sticky latches in the skitter circuit, based on one or more edges of the signal. A delay line of the one or more delay elements corresponding to a falling edge of the spread width of the signal is identified using combinational circuitry of the skitter circuit. A spread spectrum signal of a spread spectrum slave clock is synchronized with the signal of the spread spectrum reference clock based on the delay line.

Abstract: Embodiments herein describe a self-biased divider for a clock in an integrated circuit. In one embodiment, the clock includes a VCO that generates a clock signal that is output to the self-biased divider. However, because the VCO may generate an analog clocking signal (e.g., a low amplitude sine wave of unknown common mode) to reduce jitter, the amplitude can vary which means it may not sufficiently track CMOS parameters. The clocking signals generated by the self-biased divider are used as feedback signals for DC biasing (or DC leveling). In this manner, the divider is referred to a self-biased divider since signals generated by the divider are used to perform DC biasing/leveling.

Abstract: A phase locked loop includes a pulse limiter between a phase frequency detector and a charge pump. The phase frequency detector generates and sends a clock pulse to the pulse limiter. The pulse limiter generates a first signal that indicates that the clock pulse is greater than a minimum pulse width of the phase frequency detector. The pulse limiter receives a pulse limiter buffer selection signal that selects one buffer of a plurality of buffers within the pulse limiter. The pulse limiter generates a second signal that indicates a truncated pulse width as the minimum pulse width of the phase frequency detector plus a delay period that is associated with the pulse limiter buffer selection signal. The pulse limiter truncates the clock pulse to the truncated pulse width and sends the truncated clock pulse to the charge pump.

Abstract: A structure is provided that includes a first active circuit in which at least one of areas surrounding the first active circuit includes an active circuit-containing region. A second active circuit is spaced apart from the first active circuit. The second active circuit includes a circuit mimic fill area present in at least one of the areas surrounding the second active circuit. The circuit mimic fill area substantially matches the active circuit-containing region that is adjacent to the first active circuit. The circuit mimic fill area is located on an equivalent side of the second active circuit as the active circuit-containing region that is present adjacent the first active circuit. The use of the circuit mimic fill mitigates the effects over medium range and beyond distances that cause device failure.

Abstract: A phase locked loop having a charge pump is described. The charge pump relies on close matching of FETs (Field Effect Transistor) electrical parameters to FETs in a current reference circuit. To achieve close matching of FET electrical performance, FEOL (Front End Of Line), comprising all FET shapes, of the current pump is identical in shapes and layout to the current reference circuit. BEOL (Back End Of Line) differs between the charge pump and the current reference circuit. The charge pump and the current reference circuit are arranged in a row. A shield circuit having FEOL shapes and layout identical to the current pump may be placed at each end of the row.

Abstract: A phase locked loop having a charge pump is described. The charge pump has circuitry to select a mode for each semiconductor chip from a plurality of modes to enhance yield. Nine unique modes are defined from which a selection is made for each chip. The selected mode mitigates effects of device mistracking anomalies for each chip. A method is provided to show how the modes are determined and prioritized.

Abstract: Detecting distortion in spread spectrum signals, including: identifying, based on a reference clock signal, one or more edges in a spread spectrum clock signal; incrementing one or more counters corresponding to the one or more edges, the one or more counters included in a plurality of counters; providing each bit of a respective output of the plurality of counters to a respective OR gate of a plurality of OR gates; and outputting, based on an output of an OR gate of the plurality of OR gates corresponding to a selected bit, an indication of whether distortion exists in the spread spectrum clock signal.

Abstract: The invention relates to a method, a circuit, and an apparatus for detecting distortion in spread spectrum signals. An edge in a spread spectrum clock signal is identified based on a reference clock signal. The edge data is then provided to a set of counters which are incremented corresponding to an identified edge. Each bit of a respective output of the counters are provided to a respective OR gate of a set of OR gates. An OR gate from the set of OR gates corresponding to a selected bit then outputs an indication of whether distortion exists in the spread spectrum clock signal.

Abstract: An embodiment of the invention may include a method and structure for determining a failure in a guard ring of a chip. The method may include measuring a current frequency of oscillation of a crack check circuit located within a guard ring. The method may include comparing the frequency to a baseline frequency of oscillation of the crack check circuit. The current frequency and baseline frequency may be normalized using a set of bypass lines. The method may include determining there is a failure of the guard ring based on the difference between the normalized frequency of oscillation and the baseline normalized frequency of oscillation.

Abstract: Using a burn-in operational amplifier (opamp) for a phased locked loop (PLL) regulator including activating a voltage stress mode for an integrated circuit comprising a PLL regulator for a PLL, wherein the PLL regulator comprises thin-oxide transistors, and wherein activating the voltage stress mode for the integrated circuit comprises applying an elevated voltage to an input of the PLL regulator; and enabling, during the voltage stress mode, a burn-in opamp coupled to the input of the PLL regulator, wherein enabling the burn-in opamp bias the input of the PLL regulator to a voltage lower than the elevated voltage.

Abstract: A voltage-controlled oscillator (VCO) having an operating frequency dependent on a total capacitance of selectable tuning capacitors can be fabricated within an integrated circuit (IC). The VCO can include active electronic devices fabricated within a set of lower layers of the IC and selectable tuning capacitors having electrically conductive structures separated by dielectric material fabricated within a set of upper layers of the IC. The upper layers of the IC are located above the set of lower layers of the IC. The VCO can also include a set of interconnect structures configurable to select a total capacitance of the selectable tuning capacitors by electrically interconnecting the first portion of the VCO to capacitors of the at least one selectable tuning capacitor.

Abstract: A differential charge pump circuit for use in a phase-locked loop (PLL) circuit is disclosed. The circuit includes a reference current, two sense amplifiers, a common mode control amplifier, and an h-bridge circuit. The h-bridge circuit is coupled to the reference current and the common mode control amplifier. The reference current drives a first portion of the h-bridge circuit and the common mode control amplifier controls a second portion of the h-bridge circuit. The h-bridge circuit also includes first and second nodes. The circuit controls a voltage at the first node so that it is substantially equal to a voltage at the second node for a plurality of voltages at the second node.

Abstract: A voltage-controlled oscillator (VCO) having an operating frequency dependent on a total capacitance of selectable tuning capacitors can be fabricated within an integrated circuit (IC). The VCO can include active electronic devices fabricated within a set of lower layers of the IC and selectable tuning capacitors having electrically conductive structures separated by dielectric material fabricated within a set of upper layers of the IC. The upper layers of the IC are located above the set of lower layers of the IC. The VCO can also include a set of interconnect structures configurable to select a total capacitance of the selectable tuning capacitors by electrically interconnecting the first portion of the VCO to capacitors of the at least one selectable tuning capacitor.

Abstract: Using a burn-in operational amplifier (opamp) for a phased locked loop (PLL) regulator including activating a voltage stress mode for an integrated circuit comprising a PLL regulator for a PLL, wherein the PLL regulator comprises thin-oxide transistors, and wherein activating the voltage stress mode for the integrated circuit comprises applying an elevated voltage to an input of the PLL regulator; and enabling, during the voltage stress mode, a burn-in opamp coupled to the input of the PLL regulator, wherein enabling the burn-in opamp bias the input of the PLL regulator to a voltage lower than the elevated voltage.

Abstract: An embodiment of the invention may include a method and structure for determining a failure in a guard ring of a chip. The method may include measuring a current frequency of oscillation of a crack check circuit located within a guard ring. The method may include comparing the frequency to a baseline frequency of oscillation of the crack check circuit. The current frequency and baseline frequency may be normalized using a set of bypass lines. The method may include determining there is a failure of the guard ring based on the difference between the normalized frequency of oscillation and the baseline normalized frequency of oscillation.

Abstract: A differential charge pump circuit for use in a phase-locked loop (PLL) circuit is disclosed. The circuit includes a reference current, two sense amplifiers, a common mode control amplifier, and an h-bridge circuit. The h-bridge circuit is coupled to the reference current and the common mode control amplifier. The reference current drives a first portion of the h-bridge circuit and the common mode control amplifier controls a second portion of the h-bridge circuit. The h-bridge circuit also includes first and second nodes. The circuit controls a voltage at the first node so that it is substantially equal to a voltage at the second node for a plurality of voltages at the second node.

Abstract: A system and apparatus relating to a differential charge pump circuit for use in a phase-locked loop (PLL) circuit. A differential charge pump circuit can include a reference current, two sense amplifiers, a common mode control amplifier, and an h-bridge circuit. The h-bridge circuit is coupled to the reference current and the common mode control amplifier. The reference current drives a first portion of the h-bridge circuit and the common mode control amplifier controls a second portion of the h-bridge circuit. The h-bridge circuit also includes first and second nodes. The nodes are inputs to one of the sense amplifiers. The differential charge pump circuit is configured to control a voltage at the first node so that it is substantially equal to a voltage at the second node for a plurality of voltages at the second node. The differential charge pump circuit can also include a transistor with a gate coupled to an output of a sense amplifier.

Abstract: A method and circuit for implementing a level shifter for translating logic signals to output voltage analog levels, and a design structure on which the subject circuit resides are provided. The circuit includes a level shifter resistor divider string of a plurality of series connected resistors, the level shifter resistor divider string is connected between an analog voltage rail and an analog ground. A plurality of level shifter cascaded inverters are connected between respective resistors of the level shifter resistor divider string and an analog voltage rail and an analog ground. An output of the level shifter is programmed by the level shifter resistor divider string connected to the cascaded inverters.