Patents by Inventor Gregory F. Taylor
Gregory F. Taylor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10247624Abstract: Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.Type: GrantFiled: October 4, 2016Date of Patent: April 2, 2019Assignee: Intel CorporationInventors: Mohamed A. Abdelmoneum, David E. Duarte, Gregory F. Taylor
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Patent number: 9702769Abstract: Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.Type: GrantFiled: June 11, 2013Date of Patent: July 11, 2017Assignee: Intel CorporationInventors: Mohamed A. Abdelmoneum, David E. Duarte, Gregory F. Taylor
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Publication number: 20170038265Abstract: Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.Type: ApplicationFiled: October 4, 2016Publication date: February 9, 2017Inventors: Mohamed A. Abdelmoneum, David E. Duarte, Gregory F. Taylor
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Patent number: 9470586Abstract: Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.Type: GrantFiled: June 11, 2013Date of Patent: October 18, 2016Assignee: Intel CorporationInventors: Mohamed A. Abdelmoneum, David E. Duarte, Gregory F. Taylor
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Publication number: 20140365156Abstract: Embodiments of the present disclosure provide self-calibrated thermal sensors of an integrated circuit (IC) die and associated techniques and configurations. In one embodiment, a self-calibrating thermal sensing device includes a resonator configured to oscillate at a frequency corresponding with a temperature of circuitry of an integrated circuit (IC) die, wherein the resonator is thermally coupled with the circuitry and configured to operate in a first mode and a second mode and logic operatively coupled with the resonator, and configured to calculate a first temperature corresponding with a first frequency of the resonator in the first mode using a first equation, calculate a second temperature corresponding with a second frequency of the resonator in the second mode using a second equation, and add an offset to the first equation and the second equation based on a result of a comparison of the first temperature and the second temperature. Other embodiments may be described and/or claimed.Type: ApplicationFiled: June 11, 2013Publication date: December 11, 2014Inventors: Mohamed A. Abdelmoneum, David E. Duarte, Gregory F. Taylor
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Patent number: 8827550Abstract: Methods and apparatuses for Micro-Electro-Mechanical Systems (MEMS) resonator to monitor temperature in an integrated circuit. Fabricating the resonator in an interconnect layer provides a way to implement thermal detection means which is tolerant of manufacturing process variations. Sensor readout and control circuits can be on silicon if desired, for example, a positive feedback amplifier to form an oscillator in conjunction with the resonator and a counter to count oscillator frequency.Type: GrantFiled: December 23, 2009Date of Patent: September 9, 2014Assignee: Intel CorporationInventors: Mohamed A. Abdelmoneum, Tawfik M. Rahal-Arabi, Gregory F. Taylor, Kevin J. Fischer, Andrew Yeoh
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Patent number: 8331186Abstract: A program circuit generates first and second currents to program the fuse. The second current is higher than the first current. A control circuit controls generating the first and second currents in succession.Type: GrantFiled: January 7, 2011Date of Patent: December 11, 2012Assignee: Intel CorporationInventors: Jun He, Zhanping Chen, Jeffrey Hicks, Gregory F. Taylor
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Patent number: 8314725Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.Type: GrantFiled: September 15, 2010Date of Patent: November 20, 2012Assignee: Intel CorporationInventors: Paola Zepeda, David E. Duarte, Gregory F. Taylor, Atul Maheshwari
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Publication number: 20120062401Abstract: In one embodiment, an analog-to-digital conversion in an integrated circuit is evaluated by an on-die testing circuit. For example, the on-die test circuit 370 can characterize one or both of the linearity and monotonicity of the digital-to-analog conversion. The value of a conversion output for a digital input code may be compared to the value of a prior conversion output of a prior step to provide digital difference values for each step of a sweep of digital input codes. Digital difference values may be compared to one or more predetermined limits to provide one or more pass/fail tests on-board the die. Other embodiments are described and claimed.Type: ApplicationFiled: September 15, 2010Publication date: March 15, 2012Inventors: Paola ZEPEDA, David E. DUARTE, Gregory F. TAYLOR, Atul MAHESHWARI
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Publication number: 20110150031Abstract: Methods and apparatuses for Micro-Electro-Mechanical Systems (MEMS) resonator to monitor temperature in an integrated circuit. Fabricating the resonator in an interconnect layer provides a way to implement thermal detection means which is tolerant of manufacturing process variations. Sensor readout and control circuits can be on silicon if desired, for example, a positive feedback amplifier to form an oscillator in conjunction with the resonator and a counter to count oscillator frequency.Type: ApplicationFiled: December 23, 2009Publication date: June 23, 2011Inventors: Mohamed A. Abdelmoneum, Tawfik M. Rahal-Arabi, Gregory F. Taylor, Kevin J. Fischer, Andrew Yeoh
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Publication number: 20110103170Abstract: An embodiment of the present invention is a technique to program a fuse. A program circuit generates first and second currents to program the fuse. The second current is higher than the first current. A control circuit controls generating the first and second currents in succession.Type: ApplicationFiled: January 7, 2011Publication date: May 5, 2011Applicant: INTEL CORPORATIONInventors: Jun He, Zhanping Chen, Jeffrey Hicks, Gregory F. Taylor
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Patent number: 7889587Abstract: A program circuit generates first and second currents to program the fuse. The second current is higher than the first current. A control circuit controls generating the first and second currents in succession.Type: GrantFiled: December 6, 2006Date of Patent: February 15, 2011Assignee: Intel CorporationInventors: Jun He, Zhanping Chen, Jeffrey Hicks, Gregory F. Taylor
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Patent number: 7602663Abstract: A plurality of fuse cells are arranged in an array. One or more fuse cells include a pair of fuse devices to output a pair of voltages, respectively, wherein the pair of fuse devices are redundantly programmed. A sense amplifier is coupled to the plurality of fuse cells to read the pair of voltage outputs from each of the plurality of fuse cells, respectively. A comparator circuit is coupled to the sense amplifier to compare the pair of voltage outputs for each of the plurality of fuse cells and to output the compared result.Type: GrantFiled: December 22, 2006Date of Patent: October 13, 2009Assignee: Intel CorporationInventors: Zhanping Chen, Jonathan P. Douglas, Praveen Mosalikanti, Kevin Zhang, Gregory F. Taylor
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Patent number: 7501845Abstract: Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC bias degraded oscillating signal. A compare circuit coupled to the reliability oscillators compares the oscillating signals and generates a frequency compensation signal if the comparison determines that there is frequency degradation greater than a predetermined threshold.Type: GrantFiled: April 7, 2008Date of Patent: March 10, 2009Assignee: Intel CorporationInventors: Ravisangar Muniandy, Gregory F. Taylor, Payman Aminzadeh
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Publication number: 20080252329Abstract: Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC bias degraded oscillating signal. A compare circuit coupled to the reliability oscillators compares the oscillating signals and generates a frequency compensation signal if the comparison determines that there is frequency degradation greater than a predetermined threshold.Type: ApplicationFiled: April 7, 2008Publication date: October 16, 2008Inventors: Ravisangar Muniandy, Gregory F. Taylor, Payman Aminzadeh
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Patent number: 7417459Abstract: A method and apparatus for an integrated circuit having a offset reference circuit block to receive an external voltage reference and output an offset reference voltage are described herein.Type: GrantFiled: April 6, 2005Date of Patent: August 26, 2008Assignee: Intel CorporationInventors: Timothy M. Wilson, Songmin Kim, Gregory F. Taylor
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Patent number: 7394274Abstract: Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC bias degraded oscillating signal. A compare circuit coupled to the reliability oscillators compares the oscillating signals and generates a frequency compensation signal if the comparison determines that there is frequency degradation greater than a predetermined threshold.Type: GrantFiled: July 17, 2007Date of Patent: July 1, 2008Assignee: Intel CorporationInventors: Ravisangar Muniandy, Gregory F. Taylor, Payman Aminzadeh
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Publication number: 20080151593Abstract: An apparatus, a method, and a system for a fuse cell array are disclosed herein. A plurality of fuse cells are arranged in an array. One or more fuse cells include a pair of fuse devices to output a pair of voltages, respectively, wherein the pair of fuse devices are redundantly programmed. A sense amplifier is coupled to the plurality of fuse cells to read the pair of voltage outputs from each of the plurality of fuse cells, respectively. A comparator circuit is coupled to the sense amplifier to compare the pair of voltage outputs for each of the plurality of fuse cells and to output the compared result.Type: ApplicationFiled: December 22, 2006Publication date: June 26, 2008Inventors: Zhanping Chen, Jonathan P. Douglas, Praveen Mosalikanti, Kevin Zhang, Gregory F. Taylor
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Publication number: 20080136496Abstract: An embodiment of the present invention is a technique to program a fuse. A program circuit generates first and second currents to program the fuse. The second current is higher than the first current. A control circuit controls generating the first and second currents in succession.Type: ApplicationFiled: December 6, 2006Publication date: June 12, 2008Inventors: Jun He, Zhanping Chen, Jeffrey Hicks, Gregory F. Taylor
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Patent number: 7348790Abstract: Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.Type: GrantFiled: October 19, 2005Date of Patent: March 25, 2008Assignee: Intel CorporationInventors: Tawfik R. Arabi, Gregory F. Taylor, Srirama Pedarla, Patrick Elwer, Dan Murray